المؤلفون: Favero, D., De Santi, C., Mukherjee, K., Borga, M., Geens, K., Chatterjee, U., Bakeroot, B., Decoutere, S., Rampazzo, F., Meneghesso, G., Zanoni, E., Meneghini, M.

مصطلحات موضوعية: Physics - Applied Physics

الوصول الحر: http://arxiv.org/abs/2210.10558Test

المؤلفون: Gao, Z., Rampazzo, F., Meneghini, M., De Santi, C., Chiocchetta, F., Marcon, D., Meneghesso, G., Zanoni, E.

المصدر: Microelectronics Reliability, Volume 114, 2020, 113905

مصطلحات موضوعية: Physics - Applied Physics

الوصول الحر: http://arxiv.org/abs/2107.08413Test

المؤلفون: Gao, Z., Meneghini, M., Rampazzo, F., Rzin, M., De Santi, C., Meneghesso, G., Zanoni, E.

المصدر: Microelectronics Reliability, Volumes 100-101, 2019, 113489

مصطلحات موضوعية: Physics - Applied Physics

الوصول الحر: http://arxiv.org/abs/2107.08412Test

المؤلفون: Fusco G., Motta M., Rampazzo F.

المساهمون: Fusco, G., Motta, M., Rampazzo, F.

مصطلحات موضوعية: Lyapunov function, Asymptotic stabilizability, Discontinuous feedback law, Optimal control, Lie brackets

وصف الملف: STAMPA

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:001032494800001; volume:88; issue:2; journal:APPLIED MATHEMATICS AND OPTIMIZATION; https://hdl.handle.net/11577/3494655Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85165235046; https://link.springer.com/article/10.1007/s00245-023-10041-1Test

الإتاحة: https://doi.org/10.1007/s00245-023-10041-1Test
https://hdl.handle.net/11577/3494655Test

المؤلفون: Gao, Z, De Santi, C, Rampazzo, F, Saro, M, Fornasier, M, Meneghesso, G, Meneghini, M, Chini, A, Verzellesi, G, Zanoni, E

المساهمون: Gao, Z, De Santi, C, Rampazzo, F, Saro, M, Fornasier, M, Meneghesso, G, Meneghini, M, Chini, A, Verzellesi, G, Zanoni, E

مصطلحات موضوعية: Current collapse, deep level, GaN HEMT, GaN reliability, kink effect

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:001103666200001; volume:70; issue:12; firstpage:6256; lastpage:6261; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; https://hdl.handle.net/11380/1328286Test

الإتاحة: https://doi.org/10.1109/TED.2023.3326781Test
https://hdl.handle.net/11380/1328286Test

المؤلفون: Nicoletto M., Caria A., Rampazzo F., De Santi C., Buffolo M., Mura G., Rossi F., Huang X., Fu H., Chen H., Zhao Y., Meneghesso G., Zanoni E., Meneghini M.

المساهمون: Nicoletto, M., Caria, A., Rampazzo, F., De Santi, C., Buffolo, M., Mura, G., Rossi, F., Huang, X., Fu, H., Chen, H., Zhao, Y., Meneghesso, G., Zanoni, E., Meneghini, M.

مصطلحات موضوعية: Voltage, Quantum well device, Scanning electron microscopy, Transmission electron microscopy, Silicon, Photovoltaic cell, Indium tin oxide, Experimental, GaN, InGaN, Modeling, Multiple-quantum-well, Solar cell, V-pits

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:001071998500001; volume:13; issue:6; firstpage:891; lastpage:898; numberofpages:8; journal:IEEE JOURNAL OF PHOTOVOLTAICS; https://hdl.handle.net/11584/388083Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85171773703; https://ieeexplore.ieee.org/document/10252136Test

الإتاحة: https://doi.org/10.1109/JPHOTOV.2023.3311891Test
https://hdl.handle.net/11584/388083Test
https://ieeexplore.ieee.org/document/10252136Test

المؤلفون: Leasure, DR, Kashyap, R, Rampazzo, F, Dooley, CA, Elbers, B, Bondarenko, M, Verhagen, M, Frey, A, Yan, J, Akimova, ET, Fatehkia, M, Trigwell, R, Tatem, AJ, Weber, I, Mills, MC

العلاقة: https://ora.ox.ac.uk/objects/uuid:a0a0e930-8802-41e5-acff-bbb3d7336c5fTest; https://doi.org/10.1111/padr.12558Test

الإتاحة: https://doi.org/10.1111/padr.12558Test
https://ora.ox.ac.uk/objects/uuid:a0a0e930-8802-41e5-acff-bbb3d7336c5fTest

المؤلفون: Pilati, M., Buffolo, M., Rampazzo, F., Lambert, B., Sommer, D., Grünenpütt, J., De Santi, C., Meneghesso, G., Zanoni, E., Meneghini, M.

المساهمون: Electronic Components and Systems for European Leadership, ECSEL

المصدر: Microelectronics Reliability ; volume 150, page 115131 ; ISSN 0026-2714

مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/j.microrel.2023.115131Test
https://api.elsevier.com/content/article/PII:S0026271423002317?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0026271423002317?httpAccept=text/plainTest

المؤلفون: Zanoni E., Rampazzo F., De Santi C., Gao Z., Sharma C., Modolo N., Verzellesi G., Chini A., Meneghesso G., Meneghini M.

المساهمون: Zanoni, E., Rampazzo, F., De Santi, C., Gao, Z., Sharma, C., Modolo, N., Verzellesi, G., Chini, A., Meneghesso, G., Meneghini, M.

مصطلحات موضوعية: degradation, failure mechanism, gallium nitride, HEMT, microwave, millimeter-wave, reliability

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000889904800001; volume:219; issue:24; firstpage:1; lastpage:12; journal:PHYSICA STATUS SOLIDI. A, APPLICATIONS AND MATERIALS SCIENCE; https://hdl.handle.net/11380/1295218Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85143241157

الإتاحة: https://doi.org/10.1002/pssa.202100722Test
https://hdl.handle.net/11380/1295218Test

المؤلفون: Lai, A. C., Motta, M., Rampazzo, F.

مصطلحات موضوعية: Mathematics - Optimization and Control, 49K15, 93C15, 93D30

الوصول الحر: http://arxiv.org/abs/1606.02612Test