المؤلفون: Raman, M.S.^{1, 1}, Pant, Devesh Kumar¹, Singh, Alka¹, Kumar, Rohit²

المصدر: 68(3):1379-1386

المؤلفون: Sangeetha, R.^{1, 1}, Raman, M.S.², Rohini, A.¹

المصدر: Indian Journal of Economics and Development 13(4):639-646. 2017

المؤلفون: Saxena, Raka, Kumar, Anjani, Singh, Ritambhara, Paul, Ranjit Kumar, Raman, M.S., Kumar, Rohit, Khan, Mohd Arshad, Agarwal, Priyanka

المصدر: Journal of Agribusiness in Developing and Emerging Economies, 2022, Vol. 14, Issue 2, pp. 161-192.

الوصول الحر: http://www.emeraldinsight.com/doi/10.1108/JADEE-12-2021-0310Test

المؤلفون: Saxena, Raka, Kumar, Anjani, Singh, Ritambhara, Paul, Ranjit Kumar, Raman, M.S., Kumar, Rohit, Khan, Mohd Arshad, Agarwal, Priyanka

المصدر: Journal of Agribusiness in Developing and Emerging Economies ; volume 14, issue 2, page 161-192 ; ISSN 2044-0839

الإتاحة: https://doi.org/10.1108/jadee-12-2021-0310Test

المؤلفون: Kumar, N.S, Raman, M.S, Chandrasekaran, J., Priya, R, Chavali, M, Suresh, R

مصطلحات موضوعية: AC Rearch Cluster

وصف الملف: text

العلاقة: https://ir.vignan.ac.in/id/eprint/594/1/38.pdfTest; Kumar, N.S and Raman, M.S and Chandrasekaran, J. and Priya, R and Chavali, M and Suresh, R (2016) Effect of post-growth annealing on the structural, optical and electrical properties of V2O5 nanorods and its fabrication, characterization of V2O5/p-Si junction diode. Materials Science in Semiconductor Processing, 41. pp. 497-507. ISSN 1873-4081

الإتاحة: https://doi.org/10.1016/j.mssp.2015.08.020Test
https://ir.vignan.ac.in/id/eprint/594Test/
https://ir.vignan.ac.in/id/eprint/594/1/38.pdfTest

المؤلفون: Raman, M.S., Kifle, T., Bhattacharya, E., Bhat, K.N.

المصدر: IEEE Transactions on Electron Devices ; volume 53, issue 8, page 1885-1892 ; ISSN 0018-9383

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1109/ted.2006.878020Test
http://xplorestaging.ieee.org/ielx5/16/34776/01661891.pdf?arnumber=1661891Test