المؤلفون: Rizzolo, Serena

مرشدي الرسالة: Lyon, Università degli studi di Palermo (Palerme, Italie), Girard, Sylvain, Cannas, Marco

مصطلحات موضوعية: Capteurs à fibre optique, Piscine de stockage de combustible, Effets des radiations, Dispersion rayleigh, Optical fiber sensors, Nuclear storage fuel pools, Radiation effects, Scattering rayleigh

الإتاحة: http://www.theses.fr/2016LYSES013Test

المؤلفون: Dinand, Ségolène, de Borniol, Eric, Baier, Nicolas, Rochette, Florent, Rizzolo, Serena, Goiffon, Vincent, Gravrand, Olivier

المساهمون: Ting, David Z., Fulop, Gabor F., Zheng, Lucy L.

المصدر: Infrared Technology and Applications XLIX

الإتاحة: https://doi.org/10.1117/12.2663763Test

المؤلفون: Dewitte, Hugo, Rizzolo, Serena, Paillet, Philippe, Magnan, Pierre, Le Roch, Alexandre, Corbière, Franck, Molina, Romain, Girard, Sylvain, Allanche, Timothé, Muller, Cyprien, Desjonquères, Hortense, Macé, Jean Reynald, Baudu, Jean-Pierre, Saravia Flores, A., Goiffon, Vincent

المساهمون: Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)

مصطلحات موضوعية: Traitement du signal et de l'image, TID, Radhard Design, CMOS Image Sensor, Dark Current

وصف الملف: application/pdf

العلاقة: https://oatao.univ-toulouse.fr/25937/1/Dewitte_25937.pdfTest; Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Saravia Flores, A. and Goiffon, Vincent. Annealing Effects on Radiation Hardened CMOS Image Sensors Exposed to Ultra High Total Ionizing Doses. (2019) In: Radiation and its Effects on Components and Systems - RADECS 2019, 16 September 2019 - 20 September 2019 (Montpellier, France).

الإتاحة: https://doi.org/10.1109/TNS.2020.3001618Test
https://oatao.univ-toulouse.fr/25937Test/
https://oatao.univ-toulouse.fr/25937/1/Dewitte_25937.pdfTest

المؤلفون: Le Roch, Alexandre, Virmontois, Cédric, Paillet, Philippe, Belloir, Jean-Marc, Rizzolo, Serena, Pace, Federico, Durnez, Clémentine, Goiffon, Vincent

المساهمون: Centre National d'Études Spatiales - CNES (FRANCE), Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)

مصطلحات موضوعية: Traitement du signal et de l'image, CMOS Image Sensor, Floating Diffusion, Sense Node

وصف الملف: application/pdf

العلاقة: https://oatao.univ-toulouse.fr/24398/1/Le-Roch_24398.pdfTest; Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Floating Diffusions. (2019) In: 2018 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

الإتاحة: https://doi.org/10.1109/TNS.2019.2892645Test
https://oatao.univ-toulouse.fr/24398Test/
https://oatao.univ-toulouse.fr/24398/1/Le-Roch_24398.pdfTest

المؤلفون: Dewitte, Hugo, Rizzolo, Serena, Paillet, Philippe, Magnan, Pierre, Le Roch, Alexandre, Corbière, Franck, Molina, Romain, Girard, Sylvain, Allanche, Timothé, Muller, Cyprien, Desjonquères, Hortense, Macé, Jean Reynald, Baudu, Jean-Pierre, Flores, A. Saravia, Goiffon, Vincent

المساهمون: Agence Nationale pour la Gestion des Déchets Radioactifs - ANDRA (FRANCE), AREVA (FRANCE), Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE), Institut de Radioprotection et de Sûreté Nucléaire - IRSN (FRANCE), Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE), OPTSYS (FRANCE)

مصطلحات موضوعية: Traitement du signal et de l'image, Annealing, CMOS image sensors (CISs), CMOS technology, Dark current, Total ionizing dose (TID)

وصف الملف: application/pdf

العلاقة: https://oatao.univ-toulouse.fr/26851/7/Dewitte_26851.pdfTest; Dewitte, Hugo and Rizzolo, Serena and Paillet, Philippe and Magnan, Pierre and Le Roch, Alexandre and Corbière, Franck and Molina, Romain and Girard, Sylvain and Allanche, Timothé and Muller, Cyprien and Desjonquères, Hortense and Macé, Jean Reynald and Baudu, Jean-Pierre and Flores, A. Saravia and Goiffon, Vincent. Annealing Effects on Radiation-Hardened CMOS Image Sensors Exposed to Ultrahigh Total Ionizing Doses. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1284-1292. ISSN 0018-9499

الإتاحة: https://doi.org/10.1109/TNS.2020.3001618Test
https://oatao.univ-toulouse.fr/26851Test/
https://oatao.univ-toulouse.fr/26851/7/Dewitte_26851.pdfTest

المؤلفون: Le Roch, Alexandre, Virmontois, Cédric, Paillet, Philippe, Belloir, Jean-Marc, Rizzolo, Serena, Marcelot, Olivier, Dewitte, Hugo, Van Uffelen, Marco, Casellas, Laura Mont, Magnan, Pierre, Goiffon, Vincent

المساهمون: Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE), Centre National d'Études Spatiales - CNES (FRANCE), Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE), Fusion for Energy - F4E (SPAIN), Direction des applications militaires Ile de France - CEA/DAM DIF (Arpajon, France)

مصطلحات موضوعية: Traitement du signal et de l'image, Annealing, Arsenic, Cluster, CMOS image sensor (CIS), Dark current, Deep photodiode, Displacement damage dose (DDD), E-center, Electric field enhancement (EFE), Neutron, Phosphorus, Proton, Random telegraph signal (RTS), Shallowphotodiode, Total ionizing dose (TID)

وصف الملف: application/pdf

العلاقة: https://oatao.univ-toulouse.fr/26850/1/LeRoch_26850.pdfTest; Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Marcelot, Olivier and Dewitte, Hugo and Van Uffelen, Marco and Casellas, Laura Mont and Magnan, Pierre and Goiffon, Vincent. Phosphorus Versus Arsenic: Role of the Photodiode Doping Element in CMOS Image Sensor Radiation-Induced Dark Current and Random Telegraph Signal. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1241-1250. ISSN 0018-9499

الإتاحة: https://doi.org/10.1109/TNS.2020.3003451Test
https://oatao.univ-toulouse.fr/26850Test/
https://oatao.univ-toulouse.fr/26850/1/LeRoch_26850.pdfTest

المؤلفون: Rizzolo, Serena, Le Roch, Alexandre, Marcelot, Olivier, Corbière, Franck, Paillet, Philippe, Gaillardin, Marc, Magnan, Pierre, Goiffon, Vincent

المساهمون: Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE), Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)

مصطلحات موضوعية: Autre, Charge-to-voltage factor, CMOS image sensors (CISs), Dark current, Displacement dose damages, Neutron irradiation, Quantum efficiency (QE), Radiation hardness, Random telegraph signal (RTS)

وصف الملف: application/pdf

العلاقة: https://oatao.univ-toulouse.fr/26853/1/Rizzolo_26853.pdfTest; Rizzolo, Serena and Le Roch, Alexandre and Marcelot, Olivier and Corbière, Franck and Paillet, Philippe and Gaillardin, Marc and Magnan, Pierre and Goiffon, Vincent. High Displacement Damage Dose Effects in Radiation Hardened CMOS Image Sensors. (2020) IEEE Transactions on Nuclear Science, 67 (7). 1256-1262. ISSN 0018-9499

الإتاحة: https://doi.org/10.1109/TNS.2020.2989662Test
https://oatao.univ-toulouse.fr/26853Test/
https://oatao.univ-toulouse.fr/26853/1/Rizzolo_26853.pdfTest

المؤلفون: Rizzolo, Serena, Boukenter, Aziz, Ouerdane, Youcef, Michalon, Jean-Yves, Marin, Emmanuel, Macé, Jean-Reynald, Girard, Sylvain

المصدر: Journal of Physics: Photonics ; volume 2, issue 1, page 014009 ; ISSN 2515-7647

الإتاحة: https://doi.org/10.1088/2515-7647/ab6a73Test

المؤلفون: Rizzolo, Serena, Goiffon, Vincent, Corbière, Franck, Molina, Romain, Chabane, Aziouz, Girard, Sylvain, Paillet, Philippe, Magnan, Pierre, Boukenter, Aziz, Allanche, Timothé, Muller, Cyprien, Monsanglant-Louvet, Celine, Osmond, Melanie, Desjonquères, Hortense, Macé, Jean Reynald, Burnichon, Pierre, Baudu, Jean-Pierre, Plumeri, Stéphane

المساهمون: Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE)

مصطلحات موضوعية: Optique / photonique, CMOS image sensors (CISs), Dark current, Drain, Gate overlap, Partially pinned PHD, Radiation effects, Radiation hardening by design (RHBD), Threshold shift, Total ionizing dose (TID)

وصف الملف: application/pdf

العلاقة: https://oatao.univ-toulouse.fr/23035/1/Rizzolo_23035.pdfTest; HAL : hal-02092416; Rizzolo, Serena and Goiffon, Vincent and Corbière, Franck and Molina, Romain and Chabane, Aziouz and Girard, Sylvain and Paillet, Philippe and Magnan, Pierre and Boukenter, Aziz and Allanche, Timothé and Muller, Cyprien and Monsanglant-Louvet, Celine and Osmond, Melanie and Desjonquères, Hortense and Macé, Jean Reynald and Burnichon, Pierre and Baudu, Jean-Pierre and Plumeri, Stéphane. Radiation Hardness Comparison of CMOS Image Sensor Technologies at High Total Ionizing Dose Levels. (2018) In: Radiation Effects on Optoelectronic Detectors (CNES Workshop), 27 November 2018 (Toulouse, France). (Unpublished)

الإتاحة: https://oatao.univ-toulouse.fr/23035Test/
https://oatao.univ-toulouse.fr/23035/1/Rizzolo_23035.pdfTest

المؤلفون: Le Roch, Alexandre, Virmontois, Cédric, Paillet, Philippe, Belloir, Jean-Marc, Rizzolo, Serena, Pace, Federico, Durnez, Clémentine, Magnan, Pierre, Goiffon, Vincent

المساهمون: Commissariat à l'Energie Atomique et aux énergies alternatives - CEA (FRANCE), Centre National d'Études Spatiales - CNES (FRANCE), Institut Supérieur de l'Aéronautique et de l'Espace - ISAE-SUPAERO (FRANCE), Direction des applications militaires Ile de France - CEA/DAM DIF (Arpajon, France)

مصطلحات موضوعية: Traitement du signal et de l'image, CMOS Image Sensor, Charge Storage, Floating Diffusion, Sense Node, Leakage Current, DarkCurrent, Electric Field Enhancement Random Telegraph Signal Pinned PhotoDiode Global Shutter Total Ionizing Dose Displacement Damage Dose

وصف الملف: application/pdf

العلاقة: https://oatao.univ-toulouse.fr/22963/1/LeRoch_22963.pdfTest; HAL : hal-02116037; Le Roch, Alexandre and Virmontois, Cédric and Paillet, Philippe and Belloir, Jean-Marc and Rizzolo, Serena and Pace, Federico and Durnez, Clémentine and Magnan, Pierre and Goiffon, Vincent. Radiation-Induced Leakage Current and Electric Field Enhancement in CMOS Image Sensor Sense Node Floating Diffusions. (2018) In: IEEE Nuclear and Space Radiation Effects Conference (NSREC 2018), 16 July 2018 - 20 July 2018 (Kona, United States).

الإتاحة: https://doi.org/10.1109/TNS.2019.2892645Test
https://oatao.univ-toulouse.fr/22963Test/
https://oatao.univ-toulouse.fr/22963/1/LeRoch_22963.pdfTest