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1دورية أكاديمية
المؤلفون: Polignano, M. L., Galbiati, A., Mica, I., Magni, D., Cseh, D., Jay, F., Basa, P., Laurent, N., Lajtos, I., Molnar, G., Dudas, L., Roszol, L., Jastrzebski, L.
مصطلحات موضوعية: Electronic, Optical and Magnetic Materials
العلاقة: url:https://www.openaccessrepository.it/communities/itmirrorTest; https://www.openaccessrepository.it/record/168806Test
الإتاحة: https://doi.org/10.1149/2.0071803jssTest
https://www.openaccessrepository.it/record/168806Test -
2مؤتمر
المؤلفون: Nutsch, A., Beckhoff, B., Bedana, G., Borionetti, G., Codegoni, D., Grasso, S., Guerinoni, G., Leibold, A., Müller, M., Otto, M., Pfitzner, L., Polignano, M.-L., De Simone, D., Frey, L., Secula, Erik M., Seiler, David G., Khosla, Rajinder P., Herr, Dan, Michael Garner, C., McDonald, Robert, Diebold, Alain C.
المصدر: AIP Conference Proceedings
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3مؤتمر
المؤلفون: Pavageau, S., Tessier, G., Filloy, C., Jerosolimski, G., Fournier, D., Polignano, M.-L., Mica, I., Cassette, S., Aubry, R., Durand, O.
المساهمون: Laboratoire d'optique des solides (LOS), Université Pierre et Marie Curie - Paris 6 (UPMC)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics Agrate Brianza (ST-AGRATE), Thales Research and Technology Palaiseau, THALES France
المصدر: International Worshop on THERMal INvestigations of ICs and Systems ; THERMINIC 2005 ; https://hal.science/hal-00189477Test ; THERMINIC 2005, Sep 2005, Belgirate, Lago Maggiore, Italy. pp.224-228
مصطلحات موضوعية: Thermal mapping, thermal imaging, thermoreflectance, [INFO.INFO-AR]Computer Science [cs]/Hardware Architecture [cs.AR]
جغرافية الموضوع: Belgirate, Lago Maggiore, Italy
العلاقة: hal-00189477; https://hal.science/hal-00189477Test; https://hal.science/hal-00189477/documentTest; https://hal.science/hal-00189477/file/therm05224.pdfTest
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4مؤتمر
المؤلفون: Jastrzebski, L., Roffarello, Nadudvari, G., Kiss, Z., Lajtos, I., Pongracz, A., Molnar, G., Nagy, M., Dudas, L., Basa, P., Greenwood, B., Duru, R., Gambino, J., Le-Cunff, D., Cannac, M., Joblot, S., Mica, I., Polignano, M. L., Galbiati, A., Monge, P.
المصدر: 2019 19th International Workshop on Junction Technology (IWJT)
الإتاحة: https://doi.org/10.23919/iwjt.2019.8802893Test
http://xplorestaging.ieee.org/ielx7/8787338/8802613/08802893.pdf?arnumber=8802893Test -
5دورية أكاديمية
المؤلفون: Polignano, M L, Russo, F, Moccia, G, Nardone, G
المصدر: Semiconductor Science and Technology ; volume 35, issue 12, page 124003 ; ISSN 0268-1242 1361-6641
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6دورية أكاديمية
المؤلفون: Polignano, M. L., Galbiati, A., Grasso, S., Mica, I., Barbarossa, F., Magni, D.
المصدر: physica status solidi c ; volume 13, issue 10-12, page 729-734 ; ISSN 1862-6351 1610-1642
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7مؤتمر
المؤلفون: Mica, I., Polignano, M. L., Mauri, A. G., Codegoni, D., Grasso, S., Pozzi, C., Soncini, V., Targa, P., Vad, K.
المصدر: AIP Conference Proceedings ; ISSN 0094-243X
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8دورية أكاديمية
المؤلفون: Polignano, M. L., Codegoni, D., Grasso, S., Mica, I., Borionetti, G., Nutsch, A.
المصدر: physica status solidi (a) ; volume 212, issue 3, page 495-505 ; ISSN 1862-6300
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9مؤتمر
المؤلفون: Nutsch, A., Beckhoff, B., Borionetti, G., Codegoni, D., Grasso, S., Hoenicke, P., Leibold, A., Müller, M., Otto, M., Pfitzner, L., Polignano, M.-L.
الوقت: 670
العلاقة: International Symposium on Ultra Clean Processing of Semiconductor Surfaces (UCPSS) 2010; Ultra clean processing of semiconductor surfaces X; https://publica.fraunhofer.de/handle/publica/376169Test
الإتاحة: https://doi.org/10.4028/www.scientific.net/SSP.187.295Test
https://publica.fraunhofer.de/handle/publica/376169Test -
10دورية أكاديمية
المؤلفون: Mica, I., Frascaroli, J., Vangelista, S., Caniatti, M., Piagge, R., Toia, F. F. R., Juhel, M., Polignano, M. L.
المصدر: ECS Journal of Solid State Science & Technology; 2018, Vol. 7 Issue 10, pP583-P587, 5p
