يعرض 1 - 7 نتائج من 7 نتيجة بحث عن '"Plotnik, Irving"', وقت الاستعلام: 1.14s تنقيح النتائج
  1. 1
    مؤتمر
  2. 2
    مؤتمر

    المساهمون: Peckerar, Martin C.

    المصدر: SPIE Proceedings ; Electron-Beam, X-Ray, and Ion-Beam Submicrometer Lithographies for Manufacturing ; ISSN 0277-786X

  3. 3
    دورية أكاديمية

    المصدر: Journal of Vacuum Science & Technology: Part B-Microelectronics Processing & Phenomena; 1988, Vol. 6 Issue 6, p2174-2177, 4p

  4. 4
    تقرير

    وصف الملف: application/pdf

    العلاقة: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1988; Solid State Physics, Electronics And Optics; Materials and Fabrication; Submicron Structures Technology and Research; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 131; RLE_PR_131_01_01s_01; http://hdl.handle.net/1721.1/57073Test

  5. 5
    تقرير

    وصف الملف: application/pdf

    العلاقة: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1986; Submicron Structures Technology and Research; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 128; RLE_PR_128_01; http://hdl.handle.net/1721.1/56948Test

  6. 6
    تقرير

    وصف الملف: application/pdf

    العلاقة: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1987; Submicron Structures Technology and Research; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130; RLE_PR_130_01; http://hdl.handle.net/1721.1/57036Test

  7. 7
    تقرير

    وصف الملف: application/pdf

    العلاقة: Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1985; Submicron Structures Technology and Research; Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 127; RLE_PR_127_01; http://hdl.handle.net/1721.1/56933Test