المؤلفون: Baldo, M., Laurin, L., Petroni, E., Pavesi, C., Motta, A., Ielmini, D., Annunziata, R., Redaelli, A.

المساهمون: Baldo, M., Laurin, L., Petroni, E., Pavesi, C., Motta, A., Ielmini, D., Annunziata, R., Redaelli, A.

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-4-86348-803-8; ispartofbook:2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD); 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD); firstpage:321; lastpage:324; numberofpages:4; https://hdl.handle.net/11311/1258239Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85179125109

الإتاحة: https://doi.org/10.23919/SISPAD57422.2023.10319603Test
https://hdl.handle.net/11311/1258239Test

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A130966?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A130977?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A131007?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A131084?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C. - Peyrusson

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A131143?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A119429?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A115604?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A117577?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest

المؤلفون: Pavesi C.

الوصول الحر: https://www.europeana.eu/item/496/EVA_131_A118577?utm_source=api&utm_medium=api&utm_campaign=YuvuWBeCaTest