المؤلفون: Agrawal, Khushabu S., Barhate, Viral N., Patil, Vilas S., Patil, Lalit S., Mahajan, A. M.

المساهمون: Council of Scientific and Industrial Research, India, University Grants Commission

المصدر: Applied Physics A ; volume 126, issue 8 ; ISSN 0947-8396 1432-0630

مصطلحات موضوعية: General Materials Science, General Chemistry

الإتاحة: https://doi.org/10.1007/s00339-020-03684-2Test

المؤلفون: Bange, Jaspal P., Patil, Lalit S., Gautam, D. K.

المساهمون: Shum, Perry P.

المصدر: SPIE Proceedings ; Passive Components and Fiber-Based Devices VII ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.888153Test

المؤلفون: Bange, Jaspal P., Patil, Lalit S., Gautam, D. K.

المصدر: Proceedings of SPIE; Nov2011, Issue 1, p79860S-79860S-6, 6p

المؤلفون: Bange, Jaspal P., Patil, Lalit S., Gautam, D. K.

المصدر: Proceedings of SPIE; December 2010, Vol. 7986 Issue: 1 p79860S-79860S-6, 718747p

المؤلفون: Agrawal, Khushabu S., Barhate, Viral N., Patil, Vilas S., Patil, Lalit S., Mahajan, A. M.

المصدر: Applied Physics A: Materials Science & Processing; Aug2020, Vol. 126 Issue 8, pN.PAG-N.PAG, 1p, 1 Diagram, 2 Charts, 9 Graphs

مصطلحات موضوعية: METAL oxide semiconductors, ATOMIC layer deposition, X-ray photoelectron spectroscopy, ATOMIC force microscopy, TRANSMISSION electron microscopy, GOLD