المؤلفون: Strandberg, Per Erik, Ostrand, Thomas J, Weyuker, Elaine J, Afzal, Wasif, Sundmark, Daniel

مصطلحات موضوعية: Computer Science - Software Engineering

الوصول الحر: http://arxiv.org/abs/2005.06826Test

المؤلفون: Strandberg, Per Erik, Ostrand, Thomas J., Weyuker, Elaine, Sundmark, Daniel, Afzal, Wasif

المصدر: ISSTA 2018 - Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis. :73-83

مصطلحات موضوعية: Network topology, Subgraph isomorphism, Test coverage, Testing, Embedded systems, Mapping, Test facilities, Topology, Communication device, Computational elements, Industrial environments, Physical network topologies, Prototype algorithms, Software testing

وصف الملف: print

الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-40528Test
https://doi.org/10.1145/3213846.3213859Test

المؤلفون: Enoiu, Eduard Paul, Causevic, Adnan, Ostrand, Thomas, Weyuker, Elaine, Sundmark, Daniel, Pettersson, Paul

المصدر: ATAC - Advanced Test Automation for Complex Software-Intensive System (ITEA2/Vinnova) ITS-EASY Post Graduate School for Embedded Software and Systems International Journal on Software Tools for Technology Transfer. 18(3):335-353

مصطلحات موضوعية: test generation, model checking, automated software testing, function block diagram, safety-critical software, industrial study

وصف الملف: electronic

الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-28100Test
https://mdh.diva-portal.org/smash/get/diva2:818214/FULLTEXT01.pdfTest

المؤلفون: Weyuker, Elaine, Ostrand, Thomas, Bell, Robert

المصدر: Empirical Software Engineering; 20240101, Issue: Preprints p1-21, 21p

المؤلفون: Ostrand, Thomas

المصدر: Empirical Software Engineering Issues. Critical Assessment and Future Directions ; Lecture Notes in Computer Science ; page 102-102 ; ISBN 9783540713005 9783540713012

الإتاحة: https://doi.org/10.1007/978-3-540-71301-2_28Test

المؤلفون: Weyuker, Elaine, Ostrand, Thomas J.

المصدر: 2017 IEEE 28TH INTERNATIONAL SYMPOSIUM ON SOFTWARE RELIABILITY ENGINEERING WORKSHOPS (ISSREW 2017). :164-168

مصطلحات موضوعية: Computer software, Industrial research, Technical presentations, Collaboration, Data deficiency, Data quality, Empirical studies, Proprietary data, Software reliability

وصف الملف: print

الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-38580Test

المؤلفون: Strandberg, Per, Afzal, Wasif, Ostrand, Thomas J., Weyuker, Elaine, Sundmark, Daniel

المصدر: ITS ESS-H Industrial Graduate School in Reliable Embedded Sensor Systems TESTMINE - Mining Test Evolution for Improved Software Regression Test Selection (KKS) IEEE Software. 34(4):30-37

وصف الملف: print

الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-35494Test

المؤلفون: Derehag, Jesper, Weyuker, Elaine, Ostrand, Thomas, Sundmark, Daniel

المصدر: Proceedings - 2016 12th European Dependable Computing Conference, EDCC 2016. :241-248

مصطلحات موضوعية: faults, defects, fault prediction, agile, case study

وصف الملف: print

الوصول الحر: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-34665Test