Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance
| العنوان: | Fast and reliable pre-approach for scanning probe microscopes based on tip-sample capacitance |
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| المؤلفون: | B. Bryant, Floris Kalff, A. M. J. den Haan, M.A. van Spronsen, J. M. de Voogd, A. F. Otte, Tjerk H. Oosterkamp, Irene M. N. Groot, O. Ostojic, M. J. Rost |
| المصدر: | Ultramicroscopy Ultramicroscopy, 181, 61-69. Elsevier Ultramicroscopy, 181, 61-69 Ultramicroscopy, 181 Ultramicroscopy, 181, pp. 61-69 |
| بيانات النشر: | Elsevier BV, 2017. |
| سنة النشر: | 2017 |
| مصطلحات موضوعية: | Coarse approach, Scanning Hall probe microscope, Microscope, Computer science, Sample (material), Nanotechnology, Correlated Electron Systems / High Field Magnet Laboratory (HFML), 02 engineering and technology, 01 natural sciences, Capacitance, law.invention, Scanning probe microscopy, Optics, Optical microscope, law, 0103 physical sciences, 010306 general physics, GeneralLiterature_REFERENCE(e.g.,dictionaries,encyclopedias,glossaries), Instrumentation, Stepping motor, business.industry, 021001 nanoscience & nanotechnology, Atomic and Molecular Physics, and Optics, Scanning probe microscope, Electronic, Optical and Magnetic Materials, Scanning tunneling microscope, Nano-positioning, 0210 nano-technology, business, Focus (optics), Capacitance measurements |
| الوصف: | Within the last three decades Scanning Probe Microscopy has been developed to a powerful tool for measuring surfaces and their properties on an atomic scale such that users can be found nowadays not only in academia but also in industry. This development is still pushed further by researchers, who continuously exploit new possibilities of this technique, as well as companies that focus mainly on the usability. However, although imaging has become significantly easier, the time required for a safe approach (without unwanted tip-sample contact) can be very time consuming, especially if the microscope is not equipped or suited for the observation of the tip-sample distance with an additional optical microscope. Here we show that the measurement of the absolute tip-sample capacitance provides an ideal solution for a fast and reliable pre-approach. The absolute tip-sample capacitance shows a generic behavior as a function of the distance, even though we measured it on several completely different setups. Insight into this behavior is gained via an analytical and computational analysis, from which two additional advantages arise: the capacitance measurement can be applied for observing, analyzing, and fine-tuning of the approach motor, as well as for the determination of the (effective) tip radius. The latter provides important information about the sharpness of the measured tip and can be used not only to characterize new (freshly etched) tips but also for the determination of the degradation after a tip-sample contact/crash. |
| وصف الملف: | application/pdf |
| تدمد: | 0304-3991 |
| الوصول الحر: | https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c158eb8541836f5fd321fcb2c206e4b9Test https://doi.org/10.1016/j.ultramic.2017.05.009Test |
| حقوق: | OPEN |
| رقم الانضمام: | edsair.doi.dedup.....c158eb8541836f5fd321fcb2c206e4b9 |
| قاعدة البيانات: | OpenAIRE |
| تدمد: | 03043991 |
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