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1دورية أكاديمية
المصدر: Materials, Vol 16, Iss 20, p 6812 (2023)
مصطلحات موضوعية: glancing angle deposition (GLAD), thin film solar cell, GLAD CdTe interlayer, interface tailoring, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Felix V. E. Hensling, Diana Dahliah, Prabin Dulal, Patrick Singleton, Jiaxin Sun, Jürgen Schubert, Hanjong Paik, Indra Subedi, Biwas Subedi, Gian-Marco Rignanese, Nikolas J. Podraza, Geoffroy Hautier, Darrell G. Schlom
المصدر: APL Materials, Vol 9, Iss 5, Pp 051113-051113-13 (2021)
مصطلحات موضوعية: Biotechnology, TP248.13-248.65, Physics, QC1-999
وصف الملف: electronic resource
العلاقة: https://doaj.org/toc/2166-532XTest
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3دورية أكاديمية
المؤلفون: Mohammed A. Razooqi Alaani, Prakash Koirala, Adam B. Phillips, Geethika K. Liyanage, Rasha A. Awni, Dhurba R. Sapkota, Balaji Ramanujam, Michael J. Heben, Stephen K. O’Leary, Nikolas J. Podraza, Robert W. Collins
المصدر: Materials, Vol 14, Iss 19, p 5649 (2021)
مصطلحات موضوعية: (Mg,Zn)O, optical properties, spectroscopic ellipsometry, CdTe photovoltaics, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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4دورية أكاديمية
المؤلفون: Marie Solange Tumusange, Biwas Subedi, Cong Chen, Maxwell M. Junda, Zhaoning Song, Yanfa Yan, Nikolas J. Podraza
المصدر: Materials, Vol 14, Iss 14, p 4054 (2021)
مصطلحات موضوعية: real time spectroscopic ellipsometry, perovskite thin films, optical properties, stability, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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5دورية أكاديمية
المصدر: Materials, Vol 13, Iss 19, p 4259 (2020)
مصطلحات موضوعية: AR coating, ellipsometry, solar cell, CIGS, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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6دورية أكاديمية
المؤلفون: Kiran Ghimire, Dewei Zhao, Yanfa Yan, Nikolas J. Podraza
المصدر: AIP Advances, Vol 7, Iss 7, Pp 075108-075108-7 (2017)
وصف الملف: electronic resource
العلاقة: https://doaj.org/toc/2158-3226Test
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7دورية أكاديمية
المؤلفون: Dipendra Adhikari, Maxwell M. Junda, Corey R. Grice, Sylvain X. Marsillac, Robert W. Collins, Nikolas J. Podraza
المصدر: Materials, Vol 12, Iss 10, p 1699 (2019)
مصطلحات موضوعية: Hydrogenated nanocrystalline silicon, Real time spectroscopic ellipsometry, Dielectric function, RF-sputtering, PECVD, nc-Si:H n-i-p solar cell, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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8دورية أكاديمية
المؤلفون: Puja Pradhan, Puruswottam Aryal, Dinesh Attygalle, Abdel-Rahman Ibdah, Prakash Koirala, Jian Li, Khagendra P. Bhandari, Geethika K. Liyanage, Randy J. Ellingson, Michael J. Heben, Sylvain Marsillac, Robert W. Collins, Nikolas J. Podraza
المصدر: Materials, Vol 11, Iss 1, p 145 (2018)
مصطلحات موضوعية: spectroscopic ellipsometry, III2-VI3 semiconductor materials, real time analysis, complex dielectric function, photovoltaic cells, thickness measurement, compositional analysis, CuIn1−xGaxSe2, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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9دورية أكاديمية
المؤلفون: Laxmi Karki Gautam, Maxwell M. Junda, Hamna F. Haneef, Robert W. Collins, Nikolas J. Podraza
المصدر: Materials, Vol 9, Iss 3, p 128 (2016)
مصطلحات موضوعية: spectroscopic ellipsometry, hydrogenated silicon, infrared spectra, photovoltaic devices, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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10دورية أكاديمية
المؤلفون: Samantha T. Jaszewski, Sebastian Calderon, Bishal Shrestha, Shelby S. Fields, Atanu Samanta, Fernando J. Vega, Jacob D. Minyard, Joseph A. Casamento, Jon-Paul Maria, Nikolas J. Podraza, Elizabeth C. Dickey, Andrew M. Rappe, Thomas E. Beechem, Jon F. Ihlefeld
مصطلحات موضوعية: Medicine, Microbiology, Neuroscience, Biotechnology, Cancer, Space Science, Environmental Sciences not elsewhere classified, Chemical Sciences not elsewhere classified, Physical Sciences not elsewhere classified, may exist due, hold great promise, generation nonvolatile memory, electrical property measurements, antiferroelectric polarization response, vibrational signatures acquired, infrared optical responses, ferroelectric polar orthorhombic, infrared signatures provide, cited tetragonal phase, unambiguously distinguish phases, difficulty unambiguously differentiating, accomplished via substituents, ferroelectric phase stability, infrared signatures, ferroelectric phase, phase rather, phase identification, phase control, phase changes, work establishes
الإتاحة: https://doi.org/10.1021/acsnano.3c08371.s001Test
https://figshare.com/articles/journal_contribution/Infrared_Signatures_for_Phase_Identification_in_Hafnium_Oxide_Thin_Films/24650325Test