المؤلفون: Rabhi, Selma, Oueldna, Nouredine, Perrin-Pellegrino, Carine, Portavoce, Alain, Kalna, Karol, Benoudia, Mohamed, Cherif, Hoummada, Khalid

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Swansea University, Ecole Nationale Supérieure des Mines et de la Métallurgie, L3M

المصدر: ISSN: 2079-4991.

مصطلحات موضوعية: solid-state reaction, thickness, Ni-thin films, III-IV semi-conductors, in situ X-ray diffraction, intermetallic growth, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]

العلاقة: hal-03841787; https://hal.science/hal-03841787Test; https://hal.science/hal-03841787/documentTest; https://hal.science/hal-03841787/file/NanoMat12_02633.pdfTest

الإتاحة: https://doi.org/10.3390/nano12152633Test
https://hal.science/hal-03841787Test
https://hal.science/hal-03841787/documentTest
https://hal.science/hal-03841787/file/NanoMat12_02633.pdfTest

المؤلفون: Selma Rabhi, Nouredine Oueldna, Carine Perrin-Pellegrino, Alain Portavoce, Karol Kalna, Mohamed Cherif Benoudia, Khalid Hoummada

المصدر: Nanomaterials; Volume 12; Issue 15; Pages: 2633

مصطلحات موضوعية: solid-state reaction, thickness, Ni-thin films, III-IV semi-conductors, in situ X-ray diffraction, intermetallic growth

وصف الملف: application/pdf

العلاقة: Synthesis, Interfaces and Nanostructures; https://dx.doi.org/10.3390/nano12152633Test

الإتاحة: https://doi.org/10.3390/nano12152633Test

المؤلفون: Farnaz Maghazeii

المصدر: Journal of Nanostructures, Vol 7, Iss 4, Pp 273-283 (2017)

مصطلحات موضوعية: film thickness, kramers-kronig, ni thin films, optical properties, substrate temperature, void fractions, Chemical technology, TP1-1185

وصف الملف: electronic resource

العلاقة: http://jns.kashanu.ac.ir/article_54213_8087870e7ea953b1b9652bdcf882cd3d.pdfTest; https://doaj.org/toc/2251-7871Test; https://doaj.org/toc/2251-788XTest

الوصول الحر: https://doaj.org/article/6ee41c5d57e6499ca2625fdf837fd8b5Test

المؤلفون: Haruo Iwano, Hidehiko Shimizu, Koutaro Nagata, Takahiro Kawakami, Yasuo Fukushima, 岩野 春男, 川上 貴浩, 永田 向太郎, 清水 英彦, 福嶋 康夫

المصدر: JSAP Annual Meetings Extended Abstracts. 2015, :1402

المؤلفون: Kacel, T., Guittoum, A., Hemmous, M., Dirican, E., Öksüzoğlu, Ramis Mustafa, Azizi, A., Zergoug, M.

المساهمون: Anadolu Üniversitesi, Mühendislik Fakültesi, Malzeme Bilimi ve Mühendisliği Bölümü, Öksüzoğlu, Ramis Mustafa

مصطلحات موضوعية: Ni Thin Films, Pulsed Electrodeposition, Structural Properties, Microstructure, Magnetization Curves, Magnetic Anisotropy

وصف الملف: application/pdf

العلاقة: Surface Review and Letters; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://dx.doi.org/10.1142/S0218625X18500580Test; https://hdl.handle.net/11421/21485Test; 25

الإتاحة: https://doi.org/10.1142/S0218625X18500580Test
https://hdl.handle.net/11421/21485Test

المؤلفون: E. Dirican, T. Kacel, Amor Azizi, M. Zergoug, M. Hemmous, R. M. Öksüzoglu, A. Laggoun, A. Guittoum

المساهمون: Anadolu Üniversitesi, Mühendislik Fakültesi, Malzeme Bilimi ve Mühendisliği Bölümü, Öksüzoğlu, Ramis Mustafa

المصدر: Surface Review and Letters. 25:1850058

مصطلحات موضوعية: Diffraction, Materials science, Analytical chemistry, 02 engineering and technology, 01 natural sciences, Lattice constant, 0103 physical sciences, Ni Thin Films, Materials Chemistry, Texture (crystalline), Thin film, Microstructure, 010302 applied physics, Surfaces and Interfaces, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Rutherford backscattering spectrometry, Structural Properties, Magnetic Anisotropy, Surfaces, Coatings and Films, Crystallography, Magnetic anisotropy, Pulsed Electrodeposition, Magnetization Curves, Crystallite, 0210 nano-technology

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d79ac6096c703d3caf26095da81c042eTest
https://doi.org/10.1142/s0218625x18500580Test

المؤلفون: Tseng A.A., Shirakashi J.-I., Jou S., Huang J.-C., Chen T.P.

المساهمون: 國立臺灣科技大學機械工程系

مصطلحات موضوعية: Accuracy and precision, AFM tip, Correlation formulae, Machining tool, Nano scale, Ni thin films, Nickel thin film, Order of magnitude, Primary factors, Tip forces, Machining, Nanostructured materials, Nickel alloys, Thin films, Atomic force microscopy

العلاقة: Vol.28, No.1, pp.202-210; http://ir.lib.ntust.edu.tw/handle/987654321/26968Test; http://ir.lib.ntust.edu.tw/bitstream/987654321/26968/-1/index.htmlTest

الإتاحة: https://doi.org/10.1116/1.3292944Test
http://ir.lib.ntust.edu.tw/handle/987654321/26968Test
http://ir.lib.ntust.edu.tw/bitstream/987654321/26968/-1/index.htmlTest

المؤلفون: Tekgül, Atakan

المساهمون: Uludağ Üniversitesi/Fen-Edebiyat Fakültesi/Fizik Bölümü., Ahmetoğlu, Muhitdin, Alper, Mürsel, Kucur, Banu, AAG-8795-2021, 16021109400, 7005719283, 36903670200

مصطلحات موضوعية: Materials science, Optics, Schottky diode, Ni thin films, Surfaces, Hf, Antimony compounds, Capacitance, Current voltage characteristics, Electrodeposition, Electrodes, Electrolytes, Gold compounds, Leakage currents, Nickel, Nickel compounds, Semiconductor diodes, Silicon, Silicon compounds, Thin films, Capacitance voltage measurements, Electrical characteristic, Electrical characterization, Electrodeposition technique, Metal semiconductor interface, Schottky diodes, Reverse bias leakage current, Schottky barrier diodes, multidisciplinary, Thermionic Emission

العلاقة: Makale - Uluslararası Hakemli Dergi; Optoelectronics and Advanced Materials-Rapid Communications; Yurt içi; Ahmetoğlu, M. vd. (2012). "The electrical characterization of electrodeposited Ni thin film on silicon: Schottky barrier diodes". Optoelectronics and Advanced Materials-Rapid Communications, 6(1-2), 304-306.; http://hdl.handle.net/11452/26565Test; 000302580300069; 2-s2.0-84860188952; 304; 306; 1-2

الإتاحة: http://hdl.handle.net/11452/26565Test

المؤلفون: Παππάς, Σπυρίδων

مرشدي الرسالة: Πολίτης, Κωνσταντίνος, Pappas, Spiridon, Σπύρου, Νικόλαος

مصطلحات موضوعية: Λεπτά υμένια, Μαγνητικά λεπτά υμένια, Χαρακτηρισμός μαγνητικών λεπτών υμενίων, Μαγνητοοπτικό φαινόμενο Kerr, Δομικός και μαγνητικός χαρακτηρισμός λεπτών υμενίων νικελίου, Μαγνητικός χαρακτηρισμός λεπτών υμενίων κοβαλτίου, Μαγνητόμετρο μαγνητoοπτικού φαινομένου Kerr, 530.41, Thin films, Magnetron sputtering, Magnetic thin films, Magnetic thin films characterization, Magneto-optic Kerr effect, Structural and magnetic characterization of Ni thin films, Structural and magnetic characterization of Co thin films, Magneto-optic Kerr effect magnetometer

الإتاحة: http://nemertes.lis.upatras.gr/jspui/handle/10889/1289Test

المساهمون: Πολίτης, Κωνσταντίνος, Pappas, Spiridon, Σπύρου, Νικόλαος

مصطلحات موضوعية: Magneto-optic Kerr effect magnetometer, Thin films, Δομικός και μαγνητικός χαρακτηρισμός λεπτών υμενίων νικελίου, Λεπτά υμένια, Μαγνητόμετρο μαγνητoοπτικού φαινομένου Kerr, Structural and magnetic characterization of Ni thin films, Μαγνητοοπτικό φαινόμενο Kerr, 530.41, Magneto-optic Kerr effect, Magnetic thin films, Μαγνητικός χαρακτηρισμός λεπτών υμενίων κοβαλτίου, Structural and magnetic characterization of Co thin films, Χαρακτηρισμός μαγνητικών λεπτών υμενίων, Magnetic thin films characterization, Μαγνητικά λεπτά υμένια, Magnetron sputtering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=od______1047::2635923cc5a9027f7c77e89e2525516cTest
http://nemertes.lis.upatras.gr/jspui/handle/10889/1289Test