المؤلفون: Y.L. Sun, A. Obertelli, P. Doornenbal, C. Barbieri, Y. Chazono, T. Duguet, H.N. Liu, P. Navrátil, F. Nowacki, K. Ogata, T. Otsuka, F. Raimondi, V. Somà, Y. Utsuno, K. Yoshida, N. Achouri, H. Baba, F. Browne, D. Calvet, F. Château, S. Chen, N. Chiga, A. Corsi, M.L. Cortés, A. Delbart, J.-M. Gheller, A. Giganon, A. Gillibert, C. Hilaire, T. Isobe, T. Kobayashi, Y. Kubota, V. Lapoux, T. Motobayashi, I. Murray, H. Otsu, V. Panin, N. Paul, W. Rodriguez, H. Sakurai, M. Sasano, D. Steppenbeck, L. Stuhl, Y. Togano, T. Uesaka, K. Wimmer, K. Yoneda, O. Aktas, T. Aumann, L.X. Chung, F. Flavigny, S. Franchoo, I. Gašparić, R.-B. Gerst, J. Gibelin, K.I. Hahn, D. Kim, T. Koiwai, Y. Kondo, P. Koseoglou, J. Lee, C. Lehr, B.D. Linh, T. Lokotko, M. MacCormick, K. Moschner, T. Nakamura, S.Y. Park, D. Rossi, E. Sahin, D. Sohler, P.-A. Söderström, S. Takeuchi, H. Törnqvist, V. Vaquero, V. Wagner, S. Wang, V. Werner, X. Xu, H. Yamada, D. Yan, Z. Yang, M. Yasuda, L. Zanetti

المصدر: Physics Letters B, Vol 802, Iss , Pp - (2020)

مصطلحات موضوعية: Physics, QC1-999

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S0370269320300198Test; https://doaj.org/toc/0370-2693Test

الوصول الحر: https://doaj.org/article/5a556a4f80404c2985d195ad98f8c69bTest

المؤلفون: M. Nicolaidis, N. Achouri, S. Boutobza

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2003/iccad03/pdffiles/08a_1.pdfTest.

وصف الملف: application/pdf

العلاقة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.377.6258Test; http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2003/iccad03/pdffiles/08a_1.pdfTest

الإتاحة: http://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/2003/iccad03/pdffiles/08a_1.pdfTest

المؤلفون: P. Wohl, J. E. Colburn, N. Achouri, G. A. Maston, F. Neuveux, J.A. Waicukauski

المصدر: ITC

مصطلحات موضوعية: Exploit, business.industry, Computer science, Compression (functional analysis), Code coverage, Test compression, Codec, Data_CODINGANDINFORMATIONTHEORY, Automatic test pattern generation, business, Computer hardware, Image compression, Data compression

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::488e70bbd128073b7d1e9de365ddf5beTest
https://doi.org/10.1109/test.2013.6651896Test

المؤلفون: N. Achouri, Lorena Anghel, Michael Nicolaidis

المساهمون: iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

المصدر: 22nd IEEE VLSI Test Symposium
22nd IEEE VLSI Test Symposium, 2004, Napa Valley, United States. pp.313, ⟨10.1109/VTEST.2004.1299258⟩
VTS

مصطلحات موضوعية: 010302 applied physics, Engineering, high defect densities, business.industry, word repair, Fault tolerance, 02 engineering and technology, Fault injection, 01 natural sciences, 020202 computer hardware & architecture, Orders of magnitude (bit rate), memory repair, CMOS, Built-in self-test, ECC codes, 0103 physical sciences, PACS 85, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Built in self repair, nanotechnologies, Network synthesis filters, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Scaling

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0531548aae4d844b3ec91fd713a650fcTest
https://hal.archives-ouvertes.fr/hal-00005750Test

المؤلفون: N. Achouri, Michael Nicolaidis, Lorena Anghel

المساهمون: Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)

المصدر: PRDC

مصطلحات موضوعية: Engineering, business.industry, Logic simulation, Fault tolerance, 02 engineering and technology, Orders of magnitude (voltage), Fault injection, 020202 computer hardware & architecture, CMOS, 13. Climate action, Embedded system, PACS 85, 0202 electrical engineering, electronic engineering, information engineering, 020201 artificial intelligence & image processing, System on a chip, Built in self repair, Network synthesis filters, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::40633bc5fd4d5738db80146305d74bd5Test
https://hal.archives-ouvertes.fr/hal-00005749Test

المؤلفون: Michael Nicolaidis, N. Achouri, Lorena Anghel

المساهمون: iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA), Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS)

المصدر: 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03)
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'03), 2003, Boston, Cambridge, Ma, United States. pp.459, ⟨10.1109/DFTVS.2003.1250144⟩
DFT

مصطلحات موضوعية: Engineering, Polarity (physics), business.industry, 020208 electrical & electronic engineering, Logic testing, Fault tolerance, 02 engineering and technology, Integrated circuit design, Orders of magnitude (volume), 020202 computer hardware & architecture, Logic synthesis, built-in-sef-repair, Nanoelectronics, 13. Climate action, PACS 85, 0202 electrical engineering, electronic engineering, information engineering, Built in self repair, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Algorithm

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::039e48c14770a13b8fd342a83dd2258dTest
https://hal.archives-ouvertes.fr/hal-00005830Test

المؤلفون: Michael Nicolaidis, Lorena Anghel, N. Achouri

المساهمون: iROc Technologies (IROC TECHNOLOGIES), Cadence Connection-EDA Consortium-FSA-Cubic Micro, Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés (TIMA), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Centre National de la Recherche Scientifique (CNRS), Techniques of Informatics and Microelectronics for integrated systems Architecture (TIMA), Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP)-Centre National de la Recherche Scientifique (CNRS)-Université Grenoble Alpes (UGA)

المصدر: 9th IEEE International
Testing Symposium
Testing Symposium, 2003, Kos International Convention Center, Kos Island, Greece. pp.94-8, ⟨10.1109/OLT.2003.1214373⟩
IOLTS

مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, Fault tolerance, 02 engineering and technology, Orders of magnitude (voltage), 01 natural sciences, 020202 computer hardware & architecture, Nanoelectronics, Built-in self-test, 0103 physical sciences, built-in-self-repair, PACS 85, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Built in self repair, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Automatic testing

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a48e65b264bdf6c4c48463b226e294a0Test
https://hal.archives-ouvertes.fr/hal-00005831Test

المؤلفون: M H, Daghfous, N, Achouri, A, Cherif, S, Boubaker, M, Sellami, R, Mkaouar, H, Hadj Salah, M, Ben Jaafar

المصدر: Journal de radiologie. 71(2)

مصطلحات موضوعية: Adult, Male, Echinococcosis, Hepatic, Rupture, Spontaneous, Intestine, Small, Humans, Peritoneum, Peritonitis, Intestinal Obstruction, Ultrasonography

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=pmid________::369e728c30f47896138af86206c04948Test
https://pubmed.ncbi.nlm.nih.gov/2182838Test

المؤلفون: M. Nicolaidis, N. Achouri, S. Boutobza

المصدر: 2003 Design, Automation and Test in Europe Conference and Exhibition.

مصطلحات موضوعية: 010302 applied physics, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, 02 engineering and technology, 01 natural sciences, 020202 computer hardware & architecture

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::ce5bed74cb01004c4c920bbd4722e46eTest

المؤلفون: Sun, Y. L., Obertelli, A., Doornenbal, P., Barbieri, C., Chazono, Y., Duguet, T., Liu, H. N., Navrátil, P., Nowacki, F., Ogata, K., Otsuka, T., Raimondi, F., Somà, V., Utsuno, Y., Yoshida, K., Achouri, N., Baba, H., Browne, F., Calvet, D., Château, F., Chen, S., Chiga, N., Corsi, A., Cortés, M. L., Delbart, A., Gheller, J. -M., Giganon, A., Gillibert, A., Hilaire, C., Isobe, T., Kobayashi, T., Kubota, Y., Lapoux, V., Motobayashi, T., Murray, I., Otsu, H., Panin, V., Paul, N., Rodriguez, W., Sakurai, H., Sasano, M., Steppenbeck, D., Stuhl, L., Togano, Y., Uesaka, T., Wimmer, K., Yoneda, K., Aktas, O., Aumann, T., Chung, L. X., Flavigny, F., Franchoo, S., Gašparić, I., Gerst, R. -B., Gibelin, J., Hahn, K. I., Kim, D., Koiwai, T., Kondo, Y., Koseoglou, P., Lee, J., Lehr, C., Linh, B. D., Lokotko, T., MacCormick, M., Moschner, K., Nakamura, T., Park, S. Y., Rossi, D., Sahin, E., Sohler, D., Söderström, P. -A., Takeuchi, S., Törnqvist, H., Vaquero, V., Wagner, V., Wang, S., Werner, V., Xu, X., Yamada, H., Yan, D., Yang, Z., Yasuda, M., Zanetti, L.

المساهمون: Y.L. Sun, A. Obertelli, P. Doornenbal, C. Barbieri, Y. Chazono, T. Duguet, H.N. Liu, P. Navrátil, F. Nowacki, K. Ogata, T. Otsuka, F. Raimondi, V. Somà, Y. Utsuno, K. Yoshida, N. Achouri, H. Baba, F. Browne, D. Calvet, F. Château, S. Chen, N. Chiga, A. Corsi, M.L. Corté, A. Delbart, J.-. Gheller, A. Giganon, A. Gillibert, C. Hilaire, T. Isobe, T. Kobayashi, Y. Kubota, V. Lapoux, T. Motobayashi, I. Murray, H. Otsu, V. Panin, N. Paul, W. Rodriguez, H. Sakurai, M. Sasano, D. Steppenbeck, L. Stuhl, Y. Togano, T. Uesaka, K. Wimmer, K. Yoneda, O. Akta, T. Aumann, L.X. Chung, F. Flavigny, S. Franchoo, I. Gašparić, R.-. Gerst, J. Gibelin, K.I. Hahn, D. Kim, T. Koiwai, Y. Kondo, P. Koseoglou, J. Lee, C. Lehr, B.D. Linh, T. Lokotko, M. MacCormick, K. Moschner, T. Nakamura, S.Y. Park, D. Rossi, E. Sahin, D. Sohler, P.-. Söderström, S. Takeuchi, H. Törnqvist, V. Vaquero, V. Wagner, S. Wang, V. Werner, X. Xu, H. Yamada, D. Yan, Z. Yang, M. Yasuda, L. Zanetti

مصطلحات موضوعية: Spectroscopy, Shell evolution, 51K, 53K, Settore FIS/04 - Fisica Nucleare e Subnucleare

العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000515091400059; volume:802; firstpage:1; lastpage:7; numberofpages:7; journal:PHYSICS LETTERS. SECTION B; http://hdl.handle.net/2434/705521Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85078626753

الإتاحة: https://doi.org/10.1016/j.physletb.2020.135215Test
http://hdl.handle.net/2434/705521Test