المؤلفون: Kim, Yeon Ho, Jiang, Wei, Lee, Donghun, Moon, Donghoon, Choi, Hyun‐Young, Shin, June‐Chul, Jeong, Yeonsu, Kim, Jong Chan, Lee, Jaeho, Huh, Woong, Han, Chang Yong, So, Jae‐Pil, Kim, Tae Soo, Kim, Seong Been, Koo, Hyun Cheol, Wang, Gunuk, Kang, Kibum, Park, Hong‐Gyu, Jeong, Hu Young, Im, Seongil, Lee, Gwan‐Hyoung, Low, Tony, Lee, Chul‐Ho

المساهمون: National Research Foundation of Korea, Seoul National University

المصدر: Advanced Materials ; ISSN 0935-9648 1521-4095

الإتاحة: https://doi.org/10.1002/adma.202314274Test

المؤلفون: Kim, Jiwoo, Moon, Donghoon, Kim, Hyunchul, van der Zande, Arend M., Lee, Gwan-Hyoung

المساهمون: National Research Foundation of Korea, Institute of Engineering Research, Seoul National University, Ministry of Trade, Industry and Energy, Inter-University Semiconductor Research Center, Seoul National University, Institute of Applied Physics, Seoul National University, Research Institute of Advanced Materials, Seoul National University

المصدر: ACS Nano ; ISSN 1936-0851 1936-086X

الإتاحة: https://doi.org/10.1021/acsnano.4c01279Test

المؤلفون: Jung, Yeonjoon, Ryu, Huije, Kim, Hangyel, Moon, Donghoon, Joo, Jaewoong, Hong, Seong Chul, Kim, Jinwoo, Lee, Gwan-Hyoung

المساهمون: National Research Foundation of Korea, SK Hynix, Seoul National University, Inter-University Semiconductor Research Center, Seoul National University, Institute of Applied Physics, Seoul National University, Institute of Engineering Research, Seoul National University, Research Institute of Advanced Materials, Seoul National University

المصدر: ACS Nano ; volume 17, issue 8, page 7865-7871 ; ISSN 1936-0851 1936-086X

الإتاحة: https://doi.org/10.1021/acsnano.3c01150Test

المؤلفون: Jung, Yeonjoon, Ryu, Huije, Kim, Hangyel, Moon, Donghoon, Joo, Jaewoong, Hong, Seong Chul, Kim, Jinwoo, Lee, Gwan-Hyoung

المصدر: ACS Nano; 4/25/2023, Vol. 17 Issue 8, p7865-7871, 7p

المؤلفون: Jung, Yeonjoon, Ryu, Huije, Kim, Hangyel, Moon, Donghoon, Joo, Jaewoong, Hong, Seong Chul, Kim, Jinwoo, Lee, Gwan-Hyoung

المصدر: ACS Nano; April 2023, Vol. 17 Issue: 8 p7865-7871, 7p