المؤلفون: Brendler, Leonardo Heitich

المساهمون: Reis, Ricardo Augusto da Luz, Rivet, François

مصطلحات موضوعية: Single-event upsets, Multiple-cell upsets, SRAM, Circuitos integrados digitais, Microeletrônica, Comunicação de dados, Transistores, Microprocessadores, Memória SRAM, Cellule de Détection, Durcissement par rayonnement, Erreurs logicielles

وصف الملف: application/pdf

العلاقة: http://hdl.handle.net/10183/272054Test; 001196316

الإتاحة: http://hdl.handle.net/10183/272054Test

المؤلفون: Soares, Caroline dos Santos, Rossetto, Alan Carlos Junior, Vasileska, Dragica, Wirth, Gilson Inacio

مصطلحات موضوعية: Microeletrônica, Simulação computacional, Perturbações de carga, Ensemble Monte Carlo, Hole transport, SiGe alloys, Alloy disorder scattering, Dispersion relation

وصف الملف: application/pdf

العلاقة: Journal of integrated circuits and systems. Porto Alegre. Vol. 16, no. 1 (2021), p. 1-5; http://hdl.handle.net/10183/259719Test; 001167829

الإتاحة: http://hdl.handle.net/10183/259719Test

المؤلفون: Cagliari, Bruna Casagranda, Butzen, Paulo Francisco, Brum, Raphael Martins

مصطلحات موضوعية: Memória (Informática), Engenharia de sistemas, Microeletrônica, Nonvolatile processors, Magnetic tunnel junction, Nonvolatile flip-flops

وصف الملف: application/pdf

العلاقة: Journal of integrated circuits and systems. Porto Alegre, RS. Vol. 16, no. 1 (2021), p. 1-10; http://hdl.handle.net/10183/223177Test; 001126658

الإتاحة: http://hdl.handle.net/10183/223177Test

المؤلفون: Dias, Cesar de Souza, Butzen, Paulo Francisco

مصطلحات موضوعية: Memristors, Devices, Models, Applications, Microeletrônica, Circuitos digitais

وصف الملف: application/pdf

العلاقة: Journal of integrated circuits and systems. Porto Alegre, RS. Vol. 16, no. 1 (2021), p. 1-15; http://hdl.handle.net/10183/223268Test; 001126662

الإتاحة: http://hdl.handle.net/10183/223268Test

المؤلفون: Copetti, Thiago Santos, Medeiros, Guilherme Cardoso, Taouil, Mottaqiallah, Hamdioui, Said, Poehls, Leticia Maria Bolzani, Balen, Tiago Roberto

مصطلحات موضوعية: Microeletrônica, Memória (Informática), Detecção de falhas, SRAMs, FinFET, Resistive defects, TCAD, SEU, Reliability, Single event transient modeling

وصف الملف: application/pdf

العلاقة: Journal of electronic testing : theory and applications. Dordrecht : Kluwer. Vol. 37 (2021), p. 383-394; http://hdl.handle.net/10183/256500Test; 001164284

الإتاحة: http://hdl.handle.net/10183/256500Test

المؤلفون: Dias, Cesar de Souza, Butzen, Paulo Francisco

مصطلحات موضوعية: Memristor, SPICE model, Threshold current, Switching resistance, Stateful logic, Material implication, Circuitos digitais, Microeletrônica, Simulação computacional

وصف الملف: application/pdf

العلاقة: Analog integrated circuits and signal processing [recurso eletrônico]. Berlin. Vol. 106, no. 1 (Jan. 2021), p. 177–194; http://hdl.handle.net/10183/224552Test; 001128503

الإتاحة: http://hdl.handle.net/10183/224552Test

المؤلفون: Cota, Duarte, Cruzeiro, Tiago, Beck, Dennis, Coelho, António, Morgado, Leonel

مصطلحات موضوعية: Inven!RA, Learning analytics, Learning management systems, Arduino, Microelectronics learning, Análise da aprendizagem, Sistemas de gestão da aprendizagem, Aprendizagem de microeletrónica, ODS::04:Educação de Qualidade

العلاقة: https://journals.uab.pt/index.php/rcc/article/view/268Test; Cota, Duarte; [et. al] - InventiveTr@ining – Módulos Activity Provider da arquitetura Inven!RA para acompanhamento online de projetos de alunos de microeletrónica. "Revista de Ciências da Computação" [Em linha]. ISSN 1646-6330 (Print) 2182-1801 (Online). Vol. 16 (2021), p. 113-136; http://hdl.handle.net/10400.2/11546Test; https://doi.org/10.34627/rcc.v16i0.268Test

الإتاحة: https://doi.org/10.34627/rcc.v16i0.268Test
http://hdl.handle.net/10400.2/11546Test

المؤلفون: Mota, Thiago dos Santos

المساهمون: Araújo, Humberto Xavier de

مصطلحات موضوعية: Compatibilidade Eletromagnética, Antenas Planares, Metamateriais, Microeletrônica, CNPQ::ENGENHARIAS::ENGENHARIA ELETRICA

وصف الملف: application/pdf

العلاقة: Mota, Thiago dos Santos. Projeto de probe rf utilizando tecnologia planar. 48 f. Monografia (Graduação). Curso de Engenharia Elétrica. Universidade Federal do Tocantins. Palmas, 2019.; http://hdl.handle.net/11612/3934Test

الإتاحة: http://hdl.handle.net/11612/3934Test

المؤلفون: Costa, Marcos Da Silva

المساهمون: Araujo, Humberto Xavier de

مصطلحات موضوعية: Compatibilidade Eletromagnética, Microeletrônica, Amplificadores Operacionais, Dispositivos Eletrônicos, CNPQ::ENGENHARIAS::ENGENHARIA ELETRICA

وصف الملف: application/pdf

العلاقة: Costa, Marcos Da Silva. Projeto de amplificador operacional para análise de emissões conduzidas e pré-conformidade em dispositivos eletrônicos. 96 f. Monografia (Graduação) Curso de Engenharia Elétrica. Universidade Federal do Tocantins, 2019.; http://hdl.handle.net/11612/3936Test

الإتاحة: http://hdl.handle.net/11612/3936Test

المؤلفون: Gushiken, Natália Kazumi

مرشدي الرسالة: Salvadori, Maria Cecilia Barbosa da Silveira

مصطلحات موضوعية: Espectroscopia Raman, Filmes finos, Implantação iônica, Ion implantation, Materiais compósitos, Nanoparticles, Nanopartículas, Plasma (Microeletrônica), SERS, Thin films

وصف الملف: application/pdf

الإتاحة: http://www.teses.usp.br/teses/disponiveis/3/3140/tde-19072019-093053Test/