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1دورية أكاديمية
المؤلفون: Luis Entrena, Antonio J. Sanchez-Clemente, Luis A. Garcia-Astudillo, Marta Portela-Garcia, Mario Garcia-Valderas, Almudena Lindoso, Roberto Sarmiento
المصدر: IEEE Access, Vol 11, Pp 116127-116140 (2023)
مصطلحات موضوعية: Equivalence checking, fault tolerance, formal verification, error mitigation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
العلاقة: https://ieeexplore.ieee.org/document/10287308Test/; https://doaj.org/toc/2169-3536Test; https://doaj.org/article/d669d315b98c4ebcaa0a8687e60dc387Test
الإتاحة: https://doi.org/10.1109/ACCESS.2023.3325616Test
https://doaj.org/article/d669d315b98c4ebcaa0a8687e60dc387Test -
2دورية أكاديمية
المصدر: Sensors; Volume 22; Issue 10; Pages: 3950
مصطلحات موضوعية: energy harvesting, internet of things, physiological sensors, solar energy, wearables, wireless communication, wireless sensor network
وصف الملف: application/pdf
العلاقة: Physical Sensors; https://dx.doi.org/10.3390/s22103950Test
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المؤلفون: Luis Ángel García Astudillo, ALMUDENA LINDOSO, Luis Entrena, HONORIO MARTIN, PEDRO MARTÍN-HOLGADO, Mario García Valderas
المساهمون: Ministerio de Ciencia, Innovación y Universidades (España), Agencia Estatal de Investigación (España), Comunidad de Madrid, Ministerio de Ciencia e Innovación (España)
المصدر: IEEE Transactions on Nuclear Science. 69:1485-1491
مصطلحات موضوعية: Nuclear and High Energy Physics, Reduced precision redundancy, Nuclear Energy and Engineering, Fast Fourier transform, TMR, Triple modular redundancy, Field programmable gate array, Electrónica, Electrical and Electronic Engineering, FPGA, FFT, RPR
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::416268fdff999e14b61109adef3e8b97Test
https://doi.org/10.1109/tns.2022.3147599Test -
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المؤلفون: Luis Ángel García Astudillo, ALMUDENA LINDOSO, Luis Entrena, HONORIO MARTIN, PEDRO MARTÍN-HOLGADO, Mario García Valderas
المساهمون: Comunidad de Madrid, Ministerio de Ciencia e Innovación (España)
المصدر: Digital.CSIC. Repositorio Institucional del CSIC
instnameمصطلحات موضوعية: Nuclear and High Energy Physics, Reduced precision redundancy, Triple modular redundancy (TMR), SRAM, Common-mode failures (CMFs), Programmable gate array (FPGA), Common-mode failures, FFT, RPR, Static random access memory-based field-programmable gate array, CMFs, Fast Fourier transform (FFT), Nuclear Energy and Engineering, Fast Fourier transform, Energía Nuclear, Electrónica, Electrical and Electronic Engineering, Reduced precision redundancy (RPR), Static random access memory (SRAM) based field, FPGA
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c83b3d995e72150f1b05ce204d908248Test
http://hdl.handle.net/10261/278073Test -
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المؤلفون: Luis A. García-Astudillo, Almudena Lindoso, Luis Entrena, Honorio Martín, Mario García-Valderas, Pedro Martín-Holgado, Yolanda Morilla
المصدر: IEEE Transactions on Nuclear Science. :1-1
مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Electrical and Electronic Engineering
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f56c9efbed59a8423e5a96e24f9c2371Test
https://doi.org/10.1109/tns.2023.3268825Test -
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المؤلفون: ALMUDENA LINDOSO, JOSE A. BELLOCH, José Badía, Luis Entrena, Yolanda Morilla, Germán León, Mario García Valderas
المساهمون: Generalitat Valenciana, Universidad Jaime I, Ministerio de Ciencia, Innovación y Universidades (España), Agencia Estatal de Investigación (España), Comunidad de Madrid
المصدر: Repositori Universitat Jaume I
Universitat Jaume Iمصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, graphic processing unit (GPU), lower–upper (LU) decomposition, proton irradiation, fault tolerance, Electrical and Electronic Engineering, system-onchip (SoC)
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::376b182a6a282951377cb033d68f264dTest
http://hdl.handle.net/10261/287723Test -
7
المؤلفون: CELIA LOPEZ-ONGIL, Mario García Valderas, Luis Entrena
المصدر: 2007 IEEE International Symposium on Industrial Electronics.
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bb908758189121544bb5e68b8e789f4dTest
https://doi.org/10.1109/isie.2007.4374557Test -
8دورية أكاديمية
المؤلفون: Mario García Valderas1, Luis Entrena1, Raúl Fernández Cardenal1, Celia López Ongil1, Marta Portela García1
المصدر: Journal of Electronic Testing. Feb2009, Vol. 25 Issue 1, p107-116. 10p.
مصطلحات موضوعية: *SET theory, *MATHEMATICS, *TOPOLOGY, *BOOLEAN algebra