المؤلفون: Netsu, Seiko, Hellenbrand, Markus, Zota, Cezar B., Miyamoto, Yasuyuki, Lind, Erik

المصدر: IEEE Journal of the Electron Devices Society NanoLund: Centre for Nanoscience. 6:408-412

مصطلحات موضوعية: Electron traps, FinFETs., high-κ, Hysteresis, hysteresis, III-V, InGaAs, inter face trap, Logic gates, Mathematical model, MOSFET, MOSFETs, Multi-gate, Surface fitting, Surface treatment, trap density, Teknik, Elektroteknik och elektronik, Annan elektroteknik och elektronik, Engineering and Technology, Electrical Engineering, Electronic Engineering, Information Engineering, Other Electrical Engineering

الوصول الحر: https://lup.lub.lu.se/record/5f2f837d-3a8c-406f-a1e4-8e37b75d5c28Test
http://dx.doi.org/10.1109/JEDS.2018.2806487Test

المؤلفون: Kanazawa, Toru, Amemiya, Tomohiro, Ishikawa, Atsushi, Upadhyaya, Vikrant, Tsuruta, Kenji, Tanaka, Takuo, Miyamoto, Yasuyuki

المصدر: Scientific Reports, 6, 22277 (2016)

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Materials Science

الوصول الحر: http://arxiv.org/abs/1505.07970Test

المؤلفون: Miyamoto, Yasuyuki, Honjyo, Makoto, Fukuda, Koichi

المصدر: Japanese Journal of Applied Physics ; volume 63, issue 3, page 03SP63 ; ISSN 0021-4922 1347-4065

الإتاحة: https://doi.org/10.35848/1347-4065/ad2919Test

المؤلفون: Fan, Jiawei, Xu, Ruifeng, Arai, Masakazu, Miyamoto, Yasuyuki

المصدر: Japanese Journal of Applied Physics ; volume 63, issue 3, page 03SP75 ; ISSN 0021-4922 1347-4065

الإتاحة: https://doi.org/10.35848/1347-4065/ad27beTest

المؤلفون: Yamaguchi, Yutaro, Nakatani, Keigo, Shinjo, Shintaro, Oishi, Toshiyuki, Miyamoto, Yasuyuki

المصدر: IEEE Transactions on Microwave Theory and Techniques ; volume 72, issue 7, page 4006-4016 ; ISSN 0018-9480 1557-9670

الإتاحة: https://doi.org/10.1109/tmtt.2023.3332890Test
http://xplorestaging.ieee.org/ielx7/22/10581889/10328451.pdf?arnumber=10328451Test

المؤلفون: MIYAMOTO, YASUYUKI, Nishiyama, Nobuhiko, Suzuki, Safumi

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=jairo_______::86b78945e171d6456734bffbc8eea342Test
http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100887486Test

المؤلفون: Yamaguchi, Yutaro, Kudara, Ken, Shinjo, Shintaro, Yamanaka, Koji, Miyamoto, Yasuyuki

المساهمون: National Institute of Information and Communications Technology

المصدر: 2023 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

الإتاحة: https://doi.org/10.1109/rfit58767.2023.10243224Test
http://xplorestaging.ieee.org/ielx7/10243164/10243121/10243224.pdf?arnumber=10243224Test

المؤلفون: MIYAMOTO, YASUYUKI, Gotow, Takahiro

المصدر: 電気学会論文誌C. 142(No. 3):348-353

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=jairo_______::0a26d9b5a0a82d683aeebc22814bbedcTest
http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100875016Test

المؤلفون: Ito, Yoshikaze, Tamai, Seita, Hoshi, Takuya, Gotow, Takahiro, Miyamoto, Yasuyuki

المصدر: Japanese Journal of Applied Physics ; volume 62, issue SC, page SC1048 ; ISSN 0021-4922 1347-4065

الإتاحة: https://doi.org/10.35848/1347-4065/acb2d5Test

المؤلفون: Miyamoto, Yasuyuki, Makiyama, Kozo

المساهمون: New Energy and Industrial Technology Development Organization

المصدر: IEEE Transactions on Electron Devices ; volume 70, issue 5, page 2210-2215 ; ISSN 0018-9383 1557-9646

الإتاحة: https://doi.org/10.1109/ted.2023.3253823Test
http://xplorestaging.ieee.org/ielx7/16/10106527/10070742.pdf?arnumber=10070742Test