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1مؤتمر
المؤلفون: Juillard, Jérôme, Jouni, Zalfa, Bourgois, Laurent, Libessart, Erwan, Morlans, Margot, Guerard, Jean, Lévy, Raphaël, Brenes, Alexis, Lefeuvre, Elie
المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, DPHY, ONERA, Université Paris Saclay Palaiseau, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), IEEE, ANR-10-LABX-0032,LaSIPS,LABORATORY FOR SYSTEMS AND ENGINEERING OF PARIS SACLAY(2010), ANR-11-IDEX-0003,IPS,Idex Paris-Saclay(2011)
المصدر: 2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022)
https://hal.science/hal-04059802Test
2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022), IEEE, Apr 2022, Paris, France. ⟨10.1109/EFTF/IFCS54560.2022.9850663⟩
https://eftf-ifcs2022.sciencesconf.orgTest/مصطلحات موضوعية: Frequency estimation, Iterative method, MEMS, Microelectromechanical device, Transient analysis, FREQUENCE, ESTIMATION, METHODE ITERATIVE, MICROELECTROMECANIQUE, ANALYSE TRANSITION, [SPI.NRJ]Engineering Sciences [physics]/Electric power
العلاقة: hal-04059802; https://hal.science/hal-04059802Test; https://hal.science/hal-04059802/documentTest; https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest
الإتاحة: https://doi.org/10.1109/EFTF/IFCS54560.2022.9850663Test
https://hal.science/hal-04059802Test
https://hal.science/hal-04059802/documentTest
https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest -
2مؤتمر
المؤلفون: Mauc, Charles, Perrier, Thomas, Levy, Raphaël, Moulin, Johan, Kayser, Patrick
المساهمون: DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
المصدر: 2022 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)
https://hal.science/hal-04100093Test
2022 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL), May 2022, Avignon, France. pp.1-4, ⟨10.1109/INERTIAL53425.2022.9787760⟩مصطلحات موضوعية: Magnetometer, IMU, MEMS, quartz, DETF, exchange bias, GRAVURE, MAGNETIQUE, MAGNETISME, MAGNETOMETRE, MECANIQUE, MICROELECTROMECANIQUE, [PHYS]Physics [physics], [SPI]Engineering Sciences [physics]
العلاقة: hal-04100093; https://hal.science/hal-04100093Test; https://hal.science/hal-04100093/documentTest; https://hal.science/hal-04100093/file/DPHY22146.1683707449.pdfTest
الإتاحة: https://doi.org/10.1109/INERTIAL53425.2022.9787760Test
https://hal.science/hal-04100093Test
https://hal.science/hal-04100093/documentTest
https://hal.science/hal-04100093/file/DPHY22146.1683707449.pdfTest -
3مؤتمر
المؤلفون: Mauc, Charles, Perrier, Thomas, Levy, Raphael, Moulin, Johan
المساهمون: DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), IEEE
المصدر: IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS 2022) ; https://hal.science/hal-04102763Test ; IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS 2022), IEEE, Jan 2022, Tokyo, Japan. pp.955-958, ⟨10.1109/MEMS51670.2022.9699574⟩
مصطلحات موضوعية: Magnetometers, Microelectromechanical devices, Resonators, Magnetometer, MEMS, quartz, DETF, exchange bias, Magnetic materials, MATERIEL, MAGNETIQUE, MAGNETOMETRE, MICROELECTROMECANIQUE, RESONATEUR, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]
العلاقة: hal-04102763; https://hal.science/hal-04102763Test; https://hal.science/hal-04102763/documentTest; https://hal.science/hal-04102763/file/DPHY22149.1683731976.pdfTest
الإتاحة: https://doi.org/10.1109/MEMS51670.2022.9699574Test
https://hal.science/hal-04102763Test
https://hal.science/hal-04102763/documentTest
https://hal.science/hal-04102763/file/DPHY22149.1683731976.pdfTest -
4مؤتمر
المؤلفون: Juillard, Jérôme, Jouni, Zalfa, Bourgois, Laurent, Libessart, Erwan, Morlans, Margot, Guerard, Jean, Lévy, Raphaël, Brenes, Alexis, Lefeuvre, Elie
المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, DPHY, ONERA, Université Paris Saclay Palaiseau, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), IEEE, ANR-10-LABX-0032,LaSIPS,LABORATORY FOR SYSTEMS AND ENGINEERING OF PARIS SACLAY(2010), ANR-11-IDEX-0003,IPS,Idex Paris-Saclay(2011)
المصدر: 2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022)
https://hal.science/hal-04059802Test
2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022), IEEE, Apr 2022, Paris, France. ⟨10.1109/EFTF/IFCS54560.2022.9850663⟩
https://eftf-ifcs2022.sciencesconf.orgTest/مصطلحات موضوعية: Frequency estimation, Iterative method, MEMS, Microelectromechanical device, Transient analysis, FREQUENCE, ESTIMATION, METHODE ITERATIVE, MICROELECTROMECANIQUE, ANALYSE TRANSITION, [SPI.NRJ]Engineering Sciences [physics]/Electric power
العلاقة: hal-04059802; https://hal.science/hal-04059802Test; https://hal.science/hal-04059802/documentTest; https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest
الإتاحة: https://doi.org/10.1109/EFTF/IFCS54560.2022.9850663Test
https://hal.science/hal-04059802Test
https://hal.science/hal-04059802/documentTest
https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest -
5مؤتمر
المؤلفون: Juillard, Jérôme, Jouni, Zalfa, Bourgois, Laurent, Libessart, Erwan, Morlans, Margot, Guerard, Jean, Lévy, Raphaël, Brenes, Alexis, Lefeuvre, Elie
المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, DPHY, ONERA, Université Paris Saclay Palaiseau, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), IEEE, ANR-10-LABX-0032,LaSIPS,LABORATORY FOR SYSTEMS AND ENGINEERING OF PARIS SACLAY(2010), ANR-11-IDEX-0003,IPS,Idex Paris-Saclay(2011)
المصدر: 2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022)
https://hal.science/hal-04059802Test
2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022), IEEE, Apr 2022, Paris, France. ⟨10.1109/EFTF/IFCS54560.2022.9850663⟩
https://eftf-ifcs2022.sciencesconf.orgTest/مصطلحات موضوعية: Frequency estimation, Iterative method, MEMS, Microelectromechanical device, Transient analysis, FREQUENCE, ESTIMATION, METHODE ITERATIVE, MICROELECTROMECANIQUE, ANALYSE TRANSITION, [SPI.NRJ]Engineering Sciences [physics]/Electric power
العلاقة: hal-04059802; https://hal.science/hal-04059802Test; https://hal.science/hal-04059802/documentTest; https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest
الإتاحة: https://doi.org/10.1109/EFTF/IFCS54560.2022.9850663Test
https://hal.science/hal-04059802Test
https://hal.science/hal-04059802/documentTest
https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest -
6مؤتمر
المؤلفون: Mauc, Charles, Perrier, Thomas, Levy, Raphaël, Moulin, Johan, Kayser, Patrick
المساهمون: DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS)
المصدر: 2022 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)
https://hal.science/hal-04100093Test
2022 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL), May 2022, Avignon, France. pp.1-4, ⟨10.1109/INERTIAL53425.2022.9787760⟩مصطلحات موضوعية: Magnetometer, IMU, MEMS, quartz, DETF, exchange bias, GRAVURE, MAGNETIQUE, MAGNETISME, MAGNETOMETRE, MECANIQUE, MICROELECTROMECANIQUE, [PHYS]Physics [physics], [SPI]Engineering Sciences [physics]
العلاقة: hal-04100093; https://hal.science/hal-04100093Test; https://hal.science/hal-04100093/documentTest; https://hal.science/hal-04100093/file/DPHY22146.1683707449.pdfTest
الإتاحة: https://doi.org/10.1109/INERTIAL53425.2022.9787760Test
https://hal.science/hal-04100093Test
https://hal.science/hal-04100093/documentTest
https://hal.science/hal-04100093/file/DPHY22146.1683707449.pdfTest -
7مؤتمر
المؤلفون: Mauc, Charles, Perrier, Thomas, Levy, Raphael, Moulin, Johan
المساهمون: DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), IEEE
المصدر: IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS 2022) ; https://hal.science/hal-04102763Test ; IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS 2022), IEEE, Jan 2022, Tokyo, Japan. pp.955-958, ⟨10.1109/MEMS51670.2022.9699574⟩
مصطلحات موضوعية: Magnetometers, Microelectromechanical devices, Resonators, Magnetometer, MEMS, quartz, DETF, exchange bias, Magnetic materials, MATERIEL, MAGNETIQUE, MAGNETOMETRE, MICROELECTROMECANIQUE, RESONATEUR, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]
العلاقة: hal-04102763; https://hal.science/hal-04102763Test; https://hal.science/hal-04102763/documentTest; https://hal.science/hal-04102763/file/DPHY22149.1683731976.pdfTest
الإتاحة: https://doi.org/10.1109/MEMS51670.2022.9699574Test
https://hal.science/hal-04102763Test
https://hal.science/hal-04102763/documentTest
https://hal.science/hal-04102763/file/DPHY22149.1683731976.pdfTest -
8مؤتمر
المؤلفون: Mauc, Charles, Perrier, Thomas, Levy, Raphaël, Moulin, Johan, Kayser, Patrick
المساهمون: DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay
المصدر: 2022 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL)
https://hal.science/hal-04100093Test
2022 IEEE International Symposium on Inertial Sensors and Systems (INERTIAL), May 2022, Avignon, France. pp.1-4, ⟨10.1109/INERTIAL53425.2022.9787760⟩مصطلحات موضوعية: Magnetometer, IMU, MEMS, quartz, DETF, exchange bias, GRAVURE, MAGNETIQUE, MAGNETISME, MAGNETOMETRE, MECANIQUE, MICROELECTROMECANIQUE, [PHYS]Physics [physics], [SPI]Engineering Sciences [physics]
العلاقة: hal-04100093; https://hal.science/hal-04100093Test; https://hal.science/hal-04100093/documentTest; https://hal.science/hal-04100093/file/DPHY22146.1683707449.pdfTest
الإتاحة: https://doi.org/10.1109/INERTIAL53425.2022.9787760Test
https://hal.science/hal-04100093Test
https://hal.science/hal-04100093/documentTest
https://hal.science/hal-04100093/file/DPHY22146.1683707449.pdfTest -
9مؤتمر
المؤلفون: Mauc, Charles, Perrier, Thomas, Levy, Raphael, Moulin, Johan
المساهمون: DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, DAAA, ONERA, Université Paris-Saclay Châtillon, IEEE
المصدر: IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS 2022) ; https://hal.science/hal-04102763Test ; IEEE 35th International Conference on Micro Electro Mechanical Systems Conference (MEMS 2022), IEEE, Jan 2022, Tokyo, Japan. pp.955-958, ⟨10.1109/MEMS51670.2022.9699574⟩
مصطلحات موضوعية: Magnetometers, Microelectromechanical devices, Resonators, Magnetometer, MEMS, quartz, DETF, exchange bias, Magnetic materials, MATERIEL, MAGNETIQUE, MAGNETOMETRE, MICROELECTROMECANIQUE, RESONATEUR, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [PHYS.PHYS.PHYS-INS-DET]Physics [physics]/Physics [physics]/Instrumentation and Detectors [physics.ins-det]
العلاقة: hal-04102763; https://hal.science/hal-04102763Test; https://hal.science/hal-04102763/documentTest; https://hal.science/hal-04102763/file/DPHY22149.1683731976.pdfTest
الإتاحة: https://doi.org/10.1109/MEMS51670.2022.9699574Test
https://hal.science/hal-04102763Test
https://hal.science/hal-04102763/documentTest
https://hal.science/hal-04102763/file/DPHY22149.1683731976.pdfTest -
10مؤتمر
المؤلفون: Juillard, Jérôme, Jouni, Zalfa, Bourgois, Laurent, Libessart, Erwan, Morlans, Margot, Guerard, Jean, Lévy, Raphaël, Brenes, Alexis, Lefeuvre, Elie
المساهمون: Laboratoire Génie électrique et électronique de Paris (GeePs), CentraleSupélec-Sorbonne Université (SU)-Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), DPHY, ONERA, Université Paris Saclay Châtillon, ONERA-Université Paris-Saclay, DPHY, ONERA, Université Paris Saclay Palaiseau, Centre de Nanosciences et de Nanotechnologies (C2N), Université Paris-Saclay-Centre National de la Recherche Scientifique (CNRS), IEEE, ANR-10-LABX-0032,LaSIPS,LABORATORY FOR SYSTEMS AND ENGINEERING OF PARIS SACLAY(2010), ANR-11-IDEX-0003,IPS,Idex Paris-Saclay(2011)
المصدر: 2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022)
https://hal.science/hal-04059802Test
2022 Joint Conference of the European Frequency and Time Forum and IEEE International Frequency Control Symposium (EFTF/IFCS 2022), IEEE, Apr 2022, Paris, France. ⟨10.1109/EFTF/IFCS54560.2022.9850663⟩
https://eftf-ifcs2022.sciencesconf.orgTest/مصطلحات موضوعية: Frequency estimation, Iterative method, MEMS, Microelectromechanical device, Transient analysis, FREQUENCE, ESTIMATION, METHODE ITERATIVE, MICROELECTROMECANIQUE, ANALYSE TRANSITION, [SPI.NRJ]Engineering Sciences [physics]/Electric power
العلاقة: hal-04059802; https://hal.science/hal-04059802Test; https://hal.science/hal-04059802/documentTest; https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest
الإتاحة: https://doi.org/10.1109/EFTF/IFCS54560.2022.9850663Test
https://hal.science/hal-04059802Test
https://hal.science/hal-04059802/documentTest
https://hal.science/hal-04059802/file/MEMS_Resonator_Parameter_Estimation_from_Fast_Frequency_Sweeps.pdfTest