المؤلفون: Patrice Bras, Christian Morawe, Sylvain Labouré, François Perrin, Amparo Vivo, Raymond Barrett

المصدر: Journal of Synchrotron Radiation, Vol 30, Iss 4, Pp 708-716 (2023)

مصطلحات موضوعية: x-ray optics, figure correction, differential deposition, surface roughness, film stress, off-line metrology, fizeau stitching, long trace profiler, magnetron sputtering, Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798, Crystallography, QD901-999

وصف الملف: electronic resource

العلاقة: http://scripts.iucr.org/cgi-bin/paper?S1600577523003697Test; https://doaj.org/toc/1600-5775Test

الوصول الحر: https://doaj.org/article/141f85541779422d937a254d94e9a396Test

المؤلفون: Takacs, Peter Z, Lacey, Ian, Yashchuk, Valeriy V

مصطلحات موضوعية: Communications Engineering, Engineering, Long Trace Profiler, synchrotron radiation, calibration, metrology of x-ray optics, surface metrology, slope profilometry, optical design, raytrace, Communications engineering, Electronics, sensors and digital hardware, Atomic, molecular and optical physics

وصف الملف: application/pdf

الوصول الحر: https://escholarship.org/uc/item/61z9s0z7Test

المؤلفون: Lacey, Ian, Yashchuk, Valeriy V

مصطلحات موضوعية: Atomic, Molecular and Optical Physics, Physical Sciences, Rare Diseases, x-rays, slope metrology, long trace profiler, LTP, diffraction measurements, x-ray grating, variable-line-spacing, VLS grating, Communications engineering, Electronics, sensors and digital hardware, Atomic, molecular and optical physics

وصف الملف: application/pdf

الوصول الحر: https://escholarship.org/uc/item/6ch5367cTest

المؤلفون: Yashchuk, Valeriy V, Lacey, Ian, McKinney, Wayne R

مصطلحات موضوعية: Manufacturing Engineering, Engineering, Rare Diseases, X-ray mirrors, bendable mirrors, adaptive optics, ex situ metrology, surface slope profilometry, long trace profiler, synchrotron radiation, X-rays, Communications engineering, Electronics, sensors and digital hardware, Atomic, molecular and optical physics

وصف الملف: application/pdf

الوصول الحر: https://escholarship.org/uc/item/52m3c44hTest
https://escholarship.org/content/qt52m3c44h/qt52m3c44h.pdfTest

المساهمون: Yashchuk, Valeriy

المصدر: Conference: SPIE Optics and Photonics, San Diego, CA, August 1, 2010 to August 2, 2010

وصف الملف: Medium: ED; Size: 12

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/986878Test

المساهمون: Assoufid, Lahsen

المصدر: Conference: The 16th Pan-American Synchrotron Radiation Instrumentation Conference, Argonne National Laboratory, Chicago, September 21-24, 2010

وصف الملف: Medium: ED; Size: 1

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/985915Test

المساهمون: Warwick, T

المصدر: Conference: EuroFEL Workshop on Photon Beamlines& Diagnostics, Hamburg, Germany, 28-30 June 2010

وصف الملف: Medium: ED; Size: 1

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/984308Test

المساهمون: Just, Andreas

المصدر: Conference: INTERNATIONAL WORKSHOP ON X-RAY MIRROR DESIGN, FABRICATION, AND METROLOGY, Osaka, Japan, September 22-24, 2009

وصف الملف: Medium: ED; Size: 23

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/973384Test

المساهمون: Yashchuk, Valeriy

المصدر: Conference: Optical Engineering and Applications 2008, part of SPIE Optics and Photonics 2008;Conference #7707: Advances in X-Ray/EUV Optics and Components III, San Diego, CA, August 10-14, 2008

وصف الملف: Medium: ED; Size: 12

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/935333Test

المساهمون: Yashchuk, Valeriy

المصدر: Conference: SPIE Optics and Photonics 2007: Advances inMetrology for X-Ray and EUV Optics II, San Diego, CA, USA, 26-30 August2007

وصف الملف: Medium: ED

الوصول الحر: http://www.osti.gov/scitech/servlets/purl/928381Test