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1دورية أكاديمية
المؤلفون: Cooper, DM, HEALTHY Study Group, Hirst, K, Baranowski, T, DeBar, L, Foster, GD, Kaufman, F, Kennel, P, Linder, B, Schneider, M, Venditti, EM, Yin, Z
المصدر: Int J Obes (Lond), iss 33 Suppl 4
وصف الملف: application/pdf
الوصول الحر: https://escholarship.org/uc/item/3b5748mhTest
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2دورية أكاديمية
المؤلفون: Selle, J, Strozza, D, Branda, M, Gebhart, J, Trabuco, E, Occhino, J, Linder, B, El Nashar, S, Madsen, A
المصدر: American Journal of Obstetrics & Gynecology; 2024 Supplement, Vol. 230 Issue 4, pS1165-S1166, 2p
مصطلحات موضوعية: PLASTIC surgery, DRUG prescribing, OPIOIDS
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3مؤتمر
المؤلفون: Bao, R., Southwick, R. G., Zhou, H., Lee, C. H., Linder, B. P., Ando, T., Guo, D., Jagannathan, H., Narayanan, V.
المصدر: 2018 IEEE Symposium on VLSI Technology
الإتاحة: https://doi.org/10.1109/vlsit.2018.8510650Test
http://xplorestaging.ieee.org/ielx7/8481640/8510617/08510650.pdf?arnumber=8510650Test -
4مؤتمر
المؤلفون: Ando, T., Kannan, B., Kwon, U., Lai, W. L., Linder, B. P., Cartier, E. A., Haight, R., Copel, M., Bruley, J., Krishnan, S. A., Narayanan, V.
المصدر: 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers
الإتاحة: https://doi.org/10.1109/vlsit.2014.6894358Test
http://xplorestaging.ieee.org/ielx7/6886509/6894335/06894358.pdf?arnumber=6894358Test -
5مؤتمر
المؤلفون: Linder, B. P., Cartier, E., Krishnan, S., Wu, E.
المصدر: 2013 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
الإتاحة: https://doi.org/10.1109/vlsi-tsa.2013.6545622Test
http://xplorestaging.ieee.org/ielx7/6530992/6545273/06545622.pdf?arnumber=6545622Test -
6مؤتمر
المؤلفون: McMahon, W., Tian, C., Uppal, S., Kothari, H., Jin, M., LaRosa, G., Nigam, T., Kerber, A., Linder, B. P., Cartier, E., Lai, W. L., Liu, Y., Ramachandran, R., Kwon, U., Parameshwaran, B., Krishnan, S., Narayanan, V.
المصدر: 2013 IEEE International Reliability Physics Symposium (IRPS)
الإتاحة: https://doi.org/10.1109/irps.2013.6532016Test
http://xplorestaging.ieee.org/ielx7/6523362/6531927/06532016.pdf?arnumber=6532016Test -
7مؤتمر
المؤلفون: Zhao, K., Stathis, J. H., Linder, B. P., Cartier, E., Kerber, A.
المصدر: 2011 International Reliability Physics Symposium
الإتاحة: https://doi.org/10.1109/irps.2011.5784502Test
http://xplorestaging.ieee.org/ielx5/5776767/5784429/05784502.pdf?arnumber=5784502Test -
8مؤتمر
المؤلفون: Paruchuri, V. K., Narayanan, V., Linder, B. P., Brown, S.L., Kim, Y. H., Wang, Y., Ronsheim, P., Jammy, R., Chen, T. C.
المصدر: 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
الإتاحة: https://doi.org/10.1109/vtsa.2007.378907Test
http://xplorestaging.ieee.org/ielx5/4239457/4239458/04239475.pdf?arnumber=4239475Test -
9مؤتمر
المؤلفون: Cartier, E., Linder, B. P., Narayanan, V., Paruchuri, V. K.
المصدر: 2006 International Electron Devices Meeting
الإتاحة: https://doi.org/10.1109/iedm.2006.346773Test
http://xplorestaging.ieee.org/ielx5/4154162/4139311/04154192.pdf?arnumber=4154192Test -
10دورية
المؤلفون: Höfler, T., Danninger, H., Linder, B.
المصدر: Praktische Metallographie.Practical Metallography; July 2019, Vol. 56 Issue: 7 p449-456, 8p