-
1دورية أكاديمية
المؤلفون: Lin, Yan-Hui, Ding, Ze-Qi, Li, Yan-Fu
المصدر: Reliability Engineering & System Safety ; volume 238, page 109461 ; ISSN 0951-8320
الإتاحة: https://doi.org/10.1016/j.ress.2023.109461Test
https://api.elsevier.com/content/article/PII:S0951832023003757?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0951832023003757?httpAccept=text/plainTest -
2دورية أكاديمية
المؤلفون: Men, Tianli, Liu, Bin, Li, Yan-Fu, Lin, Yan-Hui, Zhang, Ying
المساهمون: National Natural Science Foundation of China, Beijing Municipal Natural Science Foundation-Rail Transit Joint Research Program
المصدر: IEEE Transactions on Reliability ; volume 73, issue 2, page 1325-1340 ; ISSN 0018-9529 1558-1721
الإتاحة: https://doi.org/10.1109/tr.2023.3315294Test
http://xplorestaging.ieee.org/ielx7/24/10547161/10287198.pdf?arnumber=10287198Test -
3رسالة جامعية
-
4دورية أكاديمية
المؤلفون: Lin, Yan-Hui, Li, Yan-Fu, Zio, Enrico
المساهمون: Lin, Yan-Hui, Li, Yan-Fu, Zio, Enrico
مصطلحات موضوعية: Degradation dependence, epistemic uncertainty, maintenance optimization, multi-objective optimization, piecewise-deterministic Markov process (PDMP), Control and Systems Engineering, Information System, Computer Science Applications1707 Computer Vision and Pattern Recognition, Electrical and Electronic Engineering
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000422661900021; volume:14; issue:1; firstpage:210; lastpage:220; numberofpages:11; journal:IEEE TRANSACTIONS ON INDUSTRIAL INFORMATICS; http://hdl.handle.net/11311/1077954Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85028701928; http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9424Test
الإتاحة: https://doi.org/10.1109/TII.2017.2743820Test
http://hdl.handle.net/11311/1077954Test
http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=9424Test -
5دورية أكاديمية
المؤلفون: Lin, Yan-Hui, Guan, Lu-Xin, Chang, Liang, Zio, Enrico
المساهمون: Centre de recherche sur les Risques et les Crises (CRC), Mines Paris - PSL (École nationale supérieure des mines de Paris), Université Paris Sciences et Lettres (PSL)-Université Paris Sciences et Lettres (PSL), Politecnico di Milano Milan (POLIMI)
المصدر: ISSN: 0018-9456 ; IEEE Transactions on Instrumentation and Measurement ; https://minesparis-psl.hal.science/hal-04409150Test ; IEEE Transactions on Instrumentation and Measurement, 2023, 72, pp.1-11. ⟨10.1109/TIM.2023.3291801⟩.
مصطلحات موضوعية: [SPI]Engineering Sciences [physics]
العلاقة: hal-04409150; https://minesparis-psl.hal.science/hal-04409150Test
الإتاحة: https://doi.org/10.1109/TIM.2023.3291801Test
https://minesparis-psl.hal.science/hal-04409150Test -
6دورية أكاديمية
المؤلفون: Lin, Yan-Hui, Tian, Ling-Ling, Ding, Ze-Qi
المساهمون: National Natural Science Foundation of China, Stable Supporting Fund of Science & Technology on Reliability & Environmental Engineering Laboratory
المصدر: IEEE Transactions on Vehicular Technology ; volume 72, issue 5, page 5934-5947 ; ISSN 0018-9545 1939-9359
مصطلحات موضوعية: Electrical and Electronic Engineering, Computer Networks and Communications, Aerospace Engineering, Automotive Engineering
الإتاحة: https://doi.org/10.1109/tvt.2023.3234159Test
http://xplorestaging.ieee.org/ielx7/25/10124808/10013767.pdf?arnumber=10013767Test -
7دورية أكاديمية
المؤلفون: Lin, Yan-Hui, Ruan, Sheng-Jia, Chen, Yun-Xia, Li, Yan-Fu
المصدر: Renewable and Sustainable Energy Reviews ; volume 188, page 113807 ; ISSN 1364-0321
مصطلحات موضوعية: Renewable Energy, Sustainability and the Environment
الإتاحة: https://doi.org/10.1016/j.rser.2023.113807Test
https://api.elsevier.com/content/article/PII:S1364032123006640?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S1364032123006640?httpAccept=text/plainTest -
8دورية أكاديمية
المؤلفون: Chung, Wu-Chun1 (AUTHOR) phil890310@cycu.org.tw, Lin, Yan-Hui1 (AUTHOR), Fang, Sih-Han1 (AUTHOR)
المصدر: Mathematics (2227-7390). May2023, Vol. 11 Issue 10, p2385. 22p.
مصطلحات موضوعية: *MEDICAL personnel, *COVID-19, *MACHINE learning, *DATA distribution
-
9دورية أكاديمية
المؤلفون: Lin, Yan-Hui, Li, Yan-Fu, Zio, Enrico
المساهمون: Beihang University (BUAA), Chaire Sciences des Systèmes et Défis Energétiques EDF/ECP/Supélec (SSEC), Ecole Centrale Paris-Ecole Supérieure d'Electricité - SUPELEC (FRANCE)-CentraleSupélec-EDF R&D (EDF R&D), EDF (EDF)-EDF (EDF), Tsinghua University Beijing (THU), Laboratoire Génie Industriel - EA 2606 (LGI), CentraleSupélec
المصدر: ISSN: 0951-8320.
مصطلحات موضوعية: Multi-state model, Physics-based model, Dependent degradation processes, Piecewise-deterministic Markov process Monte, Carlo simulation method, Finite-volume scheme, [SPI]Engineering Sciences [physics]
العلاقة: hal-01786573; https://centralesupelec.hal.science/hal-01786573Test; https://centralesupelec.hal.science/hal-01786573/documentTest; https://centralesupelec.hal.science/hal-01786573/file/2018_A-comparison-between-Monte-Carlo-simulation-and-finite-volume-scheme-for-reliability-assessment-of-multi-state-physics-systems%281%29.pdfTest
الإتاحة: https://doi.org/10.1016/j.ress.2018.01.008Test
https://centralesupelec.hal.science/hal-01786573Test
https://centralesupelec.hal.science/hal-01786573/documentTest
https://centralesupelec.hal.science/hal-01786573/file/2018_A-comparison-between-Monte-Carlo-simulation-and-finite-volume-scheme-for-reliability-assessment-of-multi-state-physics-systems%281%29.pdfTest -
10دورية أكاديمية
المؤلفون: Lin, Yan Hui, Li, Yan Fu, ZIO, ENRICO
المساهمون: Lin, Yan Hui, Li, Yan Fu, Zio, Enrico
مصطلحات موضوعية: Binary decision diagrams (BDDs), degradation dependency, Monte Carlo simulation (MCS), piecewise-deterministic Markov process (PDMP), system reliability analysi, Control and Systems Engineering, Software, Human-Computer Interaction, Computer Science Applications1707 Computer Vision and Pattern Recognition, Electrical and Electronic Engineering
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000386225800007; volume:46; issue:11; firstpage:1556; lastpage:1564; numberofpages:9; journal:IEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A-SYSTEMS AND HUMANS; http://hdl.handle.net/11311/1020666Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-84992740771; http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6221021Test
الإتاحة: https://doi.org/10.1109/TSMC.2015.2500020Test
http://hdl.handle.net/11311/1020666Test
http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6221021Test