المؤلفون: Lee, Jonghyeok, Han, Jaeseung, Lee, Sangyub, Kwon, Jihoon, Choi, Keon-Hee, Huh, Jae-Won, Cho, Jihoon, Han, Dong-Guk

المساهمون: Agency for Defense Development

المصدر: IEEE Access ; volume 11, page 142862-142873 ; ISSN 2169-3536

مصطلحات موضوعية: General Engineering, General Materials Science, General Computer Science, Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1109/access.2023.3342914Test
http://xplorestaging.ieee.org/ielx7/6287639/10005208/10359526.pdf?arnumber=10359526Test

المؤلفون: Shim, Kyung-Ah, Lee, Sangyub, Koo, Namhun

المصدر: IACR Transactions on Cryptographic Hardware and Embedded Systems; Volume 2022, Issue 1; 245-269 ; 2569-2925

مصطلحات موضوعية: Block Matrix Inversion, Digital Signature, Gaussian Elimination, Multivariate-Quadratic Problem, Post-Quantum Cryptography, Precomputation, Schur Complement

وصف الملف: application/pdf

العلاقة: https://tches.iacr.org/index.php/TCHES/article/view/9296/8862Test; https://tches.iacr.org/index.php/TCHES/article/view/9296Test

الإتاحة: https://tches.iacr.org/index.php/TCHES/article/view/9296Test

المؤلفون: Jin, Sunghyun, Lee, Sangyub, Cho, Sung Min, Kim, HeeSeok, Hong, Seokhie

المصدر: IACR Transactions on Cryptographic Hardware and Embedded Systems; Volume 2021, Issue 4; 1-26 ; 2569-2925

مصطلحات موضوعية: Public-key cryptography, Digital signature, ECDSA, Scalar multiplication, Side-channel analysis, Collision attack

وصف الملف: application/pdf

العلاقة: https://tches.iacr.org/index.php/TCHES/article/view/9058/8645Test; https://tches.iacr.org/index.php/TCHES/article/view/9058Test

الإتاحة: https://tches.iacr.org/index.php/TCHES/article/view/9058Test

المؤلفون: Lee, Jaekyu, Lee, Sangyub, Choi, Hyosub, Cho, Hyeonjoong

المصدر: Computers, Materials & Continua ; volume 67, issue 3, page 2709-2727 ; ISSN 1546-2226

الإتاحة: https://doi.org/10.32604/cmc.2021.015174Test

المؤلفون: Kim, Seongkwang, Ha, Jincheol, Son, Mincheol, Lee, Byeonghak, Moon, Dukjae, Lee, Joohee, Lee, Sangyub, Kwon, Jihoon, Cho, Jihoon, Yoon, Hyojin, Lee, Jooyoung

المساهمون: Institute of Information & Communications Technology Planning & Evaluation (IITP)

المصدر: Proceedings of the 2023 ACM SIGSAC Conference on Computer and Communications Security

الإتاحة: https://doi.org/10.1145/3576915.3616579Test

المؤلفون: Lee, Sangyub, Cho, Sung Min, Kim, Heeseok, Hong, Seokhie

المساهمون: Institute for Information and communications Technology Promotion, Development of SCR-Friendly Symmetric Key Cryptosystem and Its Application Modes

المصدر: IEEE Access ; volume 8, page 5244-5255 ; ISSN 2169-3536

مصطلحات موضوعية: General Engineering, General Materials Science, General Computer Science

الإتاحة: https://doi.org/10.1109/access.2019.2963317Test
http://xplorestaging.ieee.org/ielx7/6287639/8948470/08948409.pdf?arnumber=8948409Test

المؤلفون: Kim, Sunho, Pérez del Castillo, Ricardo, Caballero, Ismael, Lee, Jimwoo, Lee, Changsoo, Lee, Downgwoo, Lee, Sangyub, Maté, Alejandro

المساهمون: Universidad de Alicante. Departamento de Lenguajes y Sistemas Informáticos, Lucentia

مصطلحات موضوعية: IoT, Internet of Things, SCP, Smart connected product, Data quality, Data quality management, Process reference model, ISO 8000-61, DQM, PRM, Lenguajes y Sistemas Informáticos

العلاقة: https://doi.org/10.1109/ACCESS.2019.2945124Test; info:eu-repo/grantAgreement/AEI/Plan Estatal de Investigación Científica y Técnica y de Innovación 2017-2020/RTI2018-094283-B-C32; IEEE Access. 2019, 7: 144663-144678. doi:10.1109/ACCESS.2019.2945124; http://hdl.handle.net/10045/98114Test

الإتاحة: https://doi.org/10.1109/ACCESS.2019.2945124Test
http://hdl.handle.net/10045/98114Test

المؤلفون: Choi, Daewoong, Cho, Hyeonjoong, Seo, Kyeongeun, Lee, Sangyub, Lee, Jaekyu, Ko, Jaejin

المساهمون: Korea Evaluation Institute of Industrial Technology

المصدر: IEEE Access ; volume 7, page 96035-96047 ; ISSN 2169-3536

مصطلحات موضوعية: General Engineering, General Materials Science, General Computer Science, Electrical and Electronic Engineering

الإتاحة: https://doi.org/10.1109/access.2019.2929310Test
http://xplorestaging.ieee.org/ielx7/6287639/8600701/08764534.pdf?arnumber=8764534Test

المؤلفون: Lee, Sangyub, Cho, Sung Min, Kim, Heeseok, Hong, Seokhie

المساهمون: National Research Foundation of Korea

المصدر: IEEE Access ; volume 7, page 47582-47592 ; ISSN 2169-3536

مصطلحات موضوعية: General Engineering, General Materials Science, General Computer Science

الإتاحة: https://doi.org/10.1109/access.2019.2909113Test
http://xplorestaging.ieee.org/ielx7/6287639/8600701/08681035.pdf?arnumber=8681035Test

المؤلفون: Lee, Jaekyu¹ (AUTHOR), Lee, Sangyub¹ (AUTHOR) syublee@keti.re.kr

المصدر: Sensors (14248220). Jan2023, Vol. 23 Issue 2, p944. 22p.

مصطلحات موضوعية: *COMPUTER vision, *BUILDING sites, *DEEP learning, *ARTIFICIAL intelligence, *IMAGE recognition (Computer vision), *SAFETY hats