المؤلفون: Lee, Yong‐Seok, Kim, Sanghoon, Kim, Geun‐Ju, Lee, Jeong‐Hun, Kim, Insoo S., Kim, Jung‐Il, Shin, Ki Young, Seol, Yunji, Oh, Taegeon, An, Na‐Young, Lee, Jaehyeon, Hwang, Jinho, Oh, Youngah, Kang, Young‐Nam

المساهمون: Korea Electrotechnology Research Institute, National Research Council of Science and Technology

المصدر: Medical Physics ; volume 48, issue 9, page 5327-5342 ; ISSN 0094-2405 2473-4209

الإتاحة: https://doi.org/10.1002/mp.15077Test

المؤلفون: Lee, Jeong-Hun, Kim, Geun-Ju, Kim, Sanghoon, Lee, Yong-Seok, Kim, Insoo S., Jang, Kwang-Ho, Kim, Jung-Il

المساهمون: Ministry of Science and Information and Communication Technologies

المصدر: IEEE Transactions on Electron Devices ; volume 70, issue 3, page 1262-1269 ; ISSN 0018-9383 1557-9646

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1109/ted.2023.3236349Test
http://xplorestaging.ieee.org/ielx7/16/10053598/10035920.pdf?arnumber=10035920Test

المؤلفون: Kim, Sanghoon, Lee, Yong-Seok, Kim, Geun-Ju, Lee, Jeong-Hun, Kim, Insoo S., Shin, Ki Young, Seol, Yunji, Oh, Youngah, Kang, Young-Nam, Hwang, Jinho, Shin, Jin-Sol, Kim, Aeran, Kim, Jina, Kim, Jung-Il

المساهمون: National Research Council of Science and Technology

المصدر: Review of Scientific Instruments ; volume 92, issue 2 ; ISSN 0034-6748 1089-7623

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1063/5.0030271Test

المؤلفون: Lee, Jeong-Hun, Kim, Geun-Ju, Kim, Sanghoon, Lee, Yong-Seok, Kim, Insoo S., Kim, Jung-Il

المصدر: 2019 International Vacuum Electronics Conference (IVEC)

الإتاحة: https://doi.org/10.1109/ivec.2019.8744923Test
http://xplorestaging.ieee.org/ielx7/8736107/8744686/08744923.pdf?arnumber=8744923Test

المؤلفون: Kiml, Sanghoon, Kim, Geun-Ju, Lee, Yong-Seok, Lee, Jeong-Hun, Kim, Insoo S., Choi, Young-Wook, Kim, Jung-Il, Hwang, Jinho, Kim, Aeran, Seol, Yunji, Oh, Taegeon, An, Nayoung, Oh, Youngah, Kang, Young-Nam

المصدر: 2019 International Vacuum Electronics Conference (IVEC)

الإتاحة: https://doi.org/10.1109/ivec.2019.8745182Test
http://xplorestaging.ieee.org/ielx7/8736107/8744686/08745182.pdf?arnumber=8745182Test

المؤلفون: Lee, Jeong Seok, Shin, Ki-Young, Kang, Dong-Goo, Lee, Soo Yeol, Jin, Seung Oh, Kim, Insoo S., Mohamed, A., Hegazy, A., Kim, Kisoo

المصدر: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD)

الإتاحة: https://doi.org/10.1109/nssmic.2016.8069828Test
http://xplorestaging.ieee.org/ielx7/8062961/8069358/08069828.pdf?arnumber=8069828Test

المؤلفون: Liu, Honglin, Zhang, Zaixuan, Li, Chenxia, Xu, Haifeng, Wang, Jianfeng, Kim, Insoo S.

المساهمون: Kulchin, Yuri N., Ou, Jinping, Vitrik, Oleg B., Zhou, Zhi

المصدر: SPIE Proceedings ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.726523Test

المؤلفون: Zhang, Zaixuan, Dai, Bizhi, Li, Laixiao, Xu, Haifeng, Geng, Dan, Liu, Honglina, Wang, Jianafeng, Li, Chenxia, Liu, Tiao, Kim, Insoo S.

المساهمون: Sheng, Yunlong, Zhuang, Songlin, Zhang, Yimo

المصدر: SPIE Proceedings ; ICO20: Optical Information Processing ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.668393Test

المؤلفون: Dai, Bizhi, Zhang, Zaixuan, Li, Laixiao, Xu, Haifeng, Geng, Dan, Liu, Honglina, Wang, Jianfeng, Li, Chenxia, Liu, Tiao, Kim, Insoo S.

المساهمون: Sheng, Yunlong, Zhuang, Songlin, Zhang, Yimo

المصدر: SPIE Proceedings ; ICO20: Optical Information Processing ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.667755Test

المؤلفون: Zhang, Zaixuan, Liu, Honglin, Wang, Jianfeng, Yu, Xiangdong, Jin, Yongxing, Kim, Insoo S., Wu, Xiaobiao

المساهمون: Rao, Yun-Jiang, Kwon, Osuk Y., Peng, Gang-Ding

المصدر: SPIE Proceedings ; Advanced Sensor Systems and Applications II ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.577597Test