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1دورية أكاديمية
المؤلفون: Holger Stiel, Julia Braenzel, Adrian Jonas, Richard Gnewkow, Lisa Theresa Glöggler, Denny Sommer, Thomas Krist, Alexei Erko, Johannes Tümmler, Ioanna Mantouvalou
المصدر: International Journal of Molecular Sciences, Vol 22, Iss 24, p 13463 (2021)
مصطلحات موضوعية: NEXAFS, pump-probe, porphyrin, ultrafast X-ray absorption, pseudoisocyanine, TD-DFT, Biology (General), QH301-705.5, Chemistry, QD1-999
وصف الملف: electronic resource
العلاقة: https://www.mdpi.com/1422-0067/22/24/13463Test; https://doaj.org/toc/1661-6596Test; https://doaj.org/toc/1422-0067Test
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2دورية أكاديمية
المؤلفون: Martin Borchert, Julia Braenzel, Richard Gnewkow, Leonid Lunin, Themistoklis Sidiropoulos, Johannes Tummler, Ingo Will, Tino Noll, Oliver Reichel, Dirk Rohloff, Alexei Erko, Thomas Krist, Clemens v. Korff Schmising, Bastian Pfau, Stefan Eisebitt, Holger Stiel, Daniel Schick
العلاقة: https://zenodo.org/record/7757734Test; https://doi.org/10.5281/zenodo.7757734Test; oai:zenodo.org:7757734
الإتاحة: https://doi.org/10.5281/zenodo.7757734Test
https://doi.org/10.5281/zenodo.7757733Test
https://zenodo.org/record/7757734Test -
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المؤلفون: Bernd Meyer, Jens Eden, Heike Blume, Frank Scholz, Hartmut Scherr, Gerhard Ulm, Johannes Tummler, G. Brandt, Frank Scholze
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, Wavelength, Optics, Beamline, Scattering, business.industry, Extreme ultraviolet, Extreme ultraviolet lithography, Optoelectronics, business, Reflectometry, Lithography, Metrology
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7ef90b0d008ebb45d463da516ddd0585Test
https://doi.org/10.1117/12.482668Test -
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المؤلفون: Frank Scholze, Johannes Tummler, Albrecht Ehrmann, Frank-Michael Kamm, Andreas Wolter, Gerhard Ulm, Jenspeter Rau, Josef Mathuni
المصدر: 19th European Conference on Mask Technology for Integrated Circuits and Microcomponents.
مصطلحات موضوعية: Wavelength, Optics, business.industry, Chemistry, Extreme ultraviolet lithography, Extreme ultraviolet, Specular reflection, Photomask, business, Reflectometry, Storage ring, Metrology
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::c4d34fc8d00c5b364c7c79475eadac07Test
https://doi.org/10.1117/12.514961Test -
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المؤلفون: Th. Westerwalbesloh, Gerhard Ulm, Ulf Kleineberg, Johannes Tummler, Wiebke Hachmann, Stephan Müllender, Ulrich Heinzmann, Frank Scholze
مصطلحات موضوعية: Materials science, Silicon, business.industry, Extreme ultraviolet lithography, At-wavelength, Metals and Alloys, chemistry.chemical_element, Polishing, Zerodur, Surfaces and Interfaces, engineering.material, extreme ultraviolet coatings, Electron beam physical vapor deposition, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Optics, chemistry, Coating, Materials Chemistry, Electron beam processing, engineering, UHV e-beam evaporation, business, Surface finishing
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1843a6ea5f0b6152e0cc61db2b7259b7Test
https://pub.uni-bielefeld.de/record/1611059Test -
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المؤلفون: Rik Jansen, Bas Mertens, Reiner Thornagel, A. van de Runstraat, Marco Dr. Wedowski, Gerhard Ulm, Frank Scholze, Johannes Tummler, Roman Klein
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Optics, business.industry, Extreme ultraviolet, Extreme ultraviolet lithography, High-energy X-rays, Synchrotron radiation, Optoelectronics, Radiometry, Electron, Irradiation, Radiation, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::6970980c14023c3687abec48c435d3ceTest
https://doi.org/10.1117/12.451352Test -
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المؤلفون: Remko Stuik, Frank Scholze, Fred Bijkerk, Johannes Tummler
المصدر: Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 492, 305-316
مصطلحات موضوعية: Physics, Nuclear and High Energy Physics, business.industry, Bandwidth (signal processing), Repeatability, Laser, law.invention, Wavelength, Narrowband, Optics, law, Extreme ultraviolet, Emissivity, business, Instrumentation, Storage ring
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e2531ee927092038826e73f287a162ecTest
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المؤلفون: Andrew Aquila, Eric M. Gullikson, Frank Scholze, Johannes Tummler
المصدر: Journal of Micro/Nanolithography, MEMS, and MOEMS. 2:233
مصطلحات موضوعية: Materials science, business.industry, Mechanical Engineering, Extreme ultraviolet lithography, X-ray optics, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, Wavelength, Optics, law, Extreme ultraviolet, Calibration, Optoelectronics, Radiometry, Electrical and Electronic Engineering, Spectral resolution, Photolithography, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f925dfffef8e7452c817885eb54dae66Test
https://doi.org/10.1117/1.1583735Test -
9دورية أكاديمية
المؤلفون: Marko Hübner, Ingo Will, Jörg Körner, Jürgen Reiter, Mathias Lenski, Johannes Tümmler, Joachim Hein, Bernd Eppich, Arnim Ginolas, Paul Crump
المصدر: Instruments, Vol 3, Iss 3, p 34 (2019)
مصطلحات موضوعية: diode laser, diode stacks, 100 Hz pumping, high duty cycle, fibre coupled, EuPRAXIA, Physics, QC1-999, Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798
وصف الملف: electronic resource