المؤلفون: Duan H, He ZQ, Guo CC, Li JH, Wang J, Zhu Z, Sai K, Chen ZP, Jiang XB, Mou YG

المصدر: Cancer Management and Research, Vol Volume 10, Pp 2467-2474 (2018)

مصطلحات موضوعية: Brain metastasis, Colorectal cancer, Bone metastasis, Aggressive treatment, Neoplasms. Tumors. Oncology. Including cancer and carcinogens, RC254-282

وصف الملف: electronic resource

العلاقة: https://www.dovepress.com/bone-metastasis-predicts-poor-prognosis-of-patients-with-brain-metasta-peer-reviewed-article-CMARTest; https://doaj.org/toc/1179-1322Test

الوصول الحر: https://doaj.org/article/cbf45a4b0aee49f5b544b42f65c7f39dTest

المؤلفون: Wang JW, Li Y, Mao ZG, Hu B, Jiang XB, Song BB, Wang X, Zhu YH, Wang HJ

المصدر: Patient Preference and Adherence, Vol 2014, Iss default, Pp 43-51 (2014)

مصطلحات موضوعية: Medicine (General), R5-920

وصف الملف: electronic resource

العلاقة: http://www.dovepress.com/clinical-applications-of-somatostatin-analogs-for-growth-hormone-secre-a15426Test; https://doaj.org/toc/1177-889XTest

الوصول الحر: https://doaj.org/article/10d2f1a55f464e98a12851162e2cd46fTest

المؤلفون: Yu, HD, Song, XY, Yang, F, Wang, J, Sun, MJ, Liu, GX, Ahmad, N, Zhou, YS, Zhang, YA, Shi, GH, Zhang, RB, Liu, JP, Jiang, XB, Fu, P, Chen, G, Li, JM, Zhuang, J, Sun, MX

المصدر: Free radical biology & medicine. 194:1-11

مصطلحات موضوعية: Medicin och hälsovetenskap

الوصول الحر: http://kipublications.ki.se/Default.aspx?queryparsed=id:151447022Test

المؤلفون: Jiang XB （江晓波）

مصطلحات موضوعية: Digital Mountains, 环境学, geo, archi

العلاقة: http://ir.imde.ac.cn/handle/131551/2461Test

الإتاحة: http://ir.imde.ac.cn/handle/131551/2461Test

المؤلفون: Jiang, Xiaobo, Wang, Xingsheng, Wang, Runsheng, Cheng, Binjie, Asenov, Asen, Huang, Ru

المساهمون: Jiang, XB (reprint author), Peking Univ, Inst Microelect, Beijing 100871, Peoples R China., Peking Univ, Inst Microelect, Beijing 100871, Peoples R China., Univ Glasgow, Sch Engn, Glasgow G12 8LT, Lanark, Scotland., Gold Stand Simulat GSS Ltd, Glasgow G3 7JT, Lanark, Scotland.

المصدر: SCI

العلاقة: IEEE International Electron Devices Meeting (IEDM).2015.; 1485268; http://hdl.handle.net/20.500.11897/450246Test; WOS:000380472500181

الإتاحة: https://doi.org/20.500.11897/450246Test
https://hdl.handle.net/20.500.11897/450246Test

المؤلفون: Jiang, Xiaobo, Wang, Junyao, Wang, Xingsheng, Wang, Runsheng, Cheng, Binjie, Asenov, Asen, Wei, Lan, Huang, Ru

المساهمون: Jiang, XB (reprint author), Peking Univ, Minist Educ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China., Peking Univ, Minist Educ, Inst Microelect, Key Lab Microelect Devices & Circuits, Beijing 100871, Peoples R China., Univ Glasgow, Sch Engn, Device Modelling Grp, Glasgow G12 8LT, Lanark, Scotland., Gold Standard Simulat Ltd, Glasgow G12 8QQ, Lanark, Scotland., Univ Glasgow, Sch Engn, Glasgow G12 8LT, Lanark, Scotland., Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada.

المصدر: EI ; SCI

مصطلحات موضوعية: Delay, energy, optimization, reliability, variability, yield, LINEWIDTH ROUGHNESS LWR, DEVICES, REQUIREMENTS, PERFORMANCE, LER, NM

العلاقة: IEEE TRANSACTIONS ON ELECTRON DEVICES.2015,62,(6),1746-1753.; 1305329; http://hdl.handle.net/20.500.11897/419713Test; WOS:000355405800011

الإتاحة: https://doi.org/20.500.11897/419713Test
https://doi.org/10.1109/TED.2015.2396575Test
https://hdl.handle.net/20.500.11897/419713Test

المؤلفون: Jiang, Xiaobo, Li, Meng, Wang, Runsheng, Chen, Jiang, Huang, Ru

المساهمون: Jiang, XB (reprint author), Peking Univ, Inst Microelect, Beijing 100871, Peoples R China., Peking Univ, Inst Microelect, Beijing 100871, Peoples R China.

المصدر: EI ; SCI

العلاقة: 2012 IEEE 11TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT-2012).; 1054327; http://hdl.handle.net/20.500.11897/292704Test; WOS:000319824700192

الإتاحة: https://doi.org/20.500.11897/292704Test
https://doi.org/10.1109/ICSICT.2012.6466733Test
https://hdl.handle.net/20.500.11897/292704Test

المؤلفون: Jiang, Xiaobo, Wang, Runsheng, Yu, Tao, Chen, Jiang, Huang, Ru

المساهمون: Jiang, XB (reprint author), Peking Univ, Inst Microelect, Beijing 100871, Peoples R China., Peking Univ, Inst Microelect, Beijing 100871, Peoples R China., Peking Univ, Dept Elect, Beijing 100871, Peoples R China.

المصدر: SCI ; EI

مصطلحات موضوعية: Auto-correlation function, cross-correlation, line-edge-roughness (LER), line-width-roughness (LWR), modeling, variability, INTRINSIC PARAMETER FLUCTUATIONS, MOSFETS, DECANANOMETER, PERFORMANCE

العلاقة: IEEE TRANSACTIONS ON ELECTRON DEVICES.2013,60,(11),3669-3675.; 807715; http://hdl.handle.net/20.500.11897/152234Test; WOS:000326263200009

الإتاحة: https://doi.org/20.500.11897/152234Test
https://doi.org/10.1109/TED.2013.2283518Test
https://hdl.handle.net/20.500.11897/152234Test