-
1تقرير
المؤلفون: Emori, Satoru, Matyushov, Alexei, Jeon, Hyung-Min, Babroski, Christopher J., Nan, Tianxiang, Belkessam, Amine M., Jones, John G., McConney, Michael E., Brown, Gail J., Howe, Brandon M., Sun, Nian X.
المصدر: Appl. Phys. Lett. 112, 182406 (2018)
مصطلحات موضوعية: Condensed Matter - Materials Science
الوصول الحر: http://arxiv.org/abs/1802.03865Test
-
2دورية أكاديمية
المؤلفون: Gu, Sohyun, Jeon, Hyung-Min, Nam, Seung Woo, Hong, Ka Young, Rahman, Md Shafiqur, Lee, Jong-Bong, Kim, Youngjin, Jang, Sung Key
المساهمون: National Research Foundation, Pohang University of Science and Technology
المصدر: Nucleic Acids Research ; volume 50, issue 1, page 306-321 ; ISSN 0305-1048 1362-4962
مصطلحات موضوعية: Genetics
الإتاحة: https://doi.org/10.1093/nar/gkab1205Test
https://academic.oup.com/nar/article-pdf/50/1/306/42149014/gkab1205.pdfTest -
3دورية أكاديمية
المؤلفون: Jeon, Hyung Min, Leedy, Kevin D., Look, David C., Chang, Celesta S., Muller, David A., Badescu, Stefan C., Vasilyev, Vladimir, Brown, Jeff L., Green, Andrew J., Chabak, Kelson D.
المساهمون: Air Force Research Laboratory, National Science Foundation
المصدر: APL Materials ; volume 9, issue 10 ; ISSN 2166-532X
-
4مؤتمر
المؤلفون: Pham, Long Hoang, Tran, Duong Nguyen-Ngoc, Nguyen, Huy-Hung, Jeon, Hyung-Joon, Tran, Tai Huu-Phuong, Jeon, Hyung-Min, Jeon, Jae Wook
المصدر: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
الإتاحة: https://doi.org/10.1109/cvprw59228.2023.00562Test
http://xplorestaging.ieee.org/ielx7/10208270/10208119/10208503.pdf?arnumber=10208503Test -
5مؤتمر
المؤلفون: Tran, Duong Nguyen-Ngoc, Hoang Pham, Long, Jeon, Hyung-Joon, Nguyen, Huy-Hung, Jeon, Hyung-Min, Tran, Tai Huu-Phuong, Jeon, Jae Wook
المصدر: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
الإتاحة: https://doi.org/10.1109/cvprw59228.2023.00563Test
http://xplorestaging.ieee.org/ielx7/10208270/10208119/10208752.pdf?arnumber=10208752Test -
6دورية أكاديمية
المؤلفون: Favela, Elizabeth V., Jeon, Hyung Min, Leedy, Kevin D., Zhang, Kun, Tung, Szu-Wei, Escobar, Francelia Sanchez, Ramana, C. V., Porter, Lisa M.
المصدر: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; May2023, Vol. 41 Issue 3, p1-9, 9p
مصطلحات موضوعية: OHMIC contacts, PULSED laser deposition, CARRIER density, TRANSMISSION electron microscopy
-
7دورية أكاديمية
المؤلفون: Gu, Sohyun, Jeon, Hyung-Min, Nam, Seung Woo, Hong, Ka Young, Rahman, Md Shafiqur, Lee, Jong-Bong, Kim, Youngjin, Jang, Sung Key
المساهمون: Gu, Sohyun, Jeon, Hyung-Min, Nam, Seung Woo, Rahman, Md Shafiqur, Lee, Jong-Bong, Kim, Youngjin, Jang, Sung Key
مصطلحات موضوعية: POLY(A) BINDING-PROTEIN, MESSENGER-RNA CAP, POLY(A)-BINDING PROTEIN, INITIATION-FACTOR, POLY(A)-TAIL-PROMOTED TRANSLATION, INDEPENDENT TRANSLATION, INTERNAL INITIATION, EIF4E, PAIP2, IDENTIFICATION
العلاقة: Nucleic Acids Research; Biochemistry & Molecular Biology; https://oasis.postech.ac.kr/handle/2014.oak/109311Test; 48661; Nucleic Acids Research, v.50, no.1, pp.306 - 321; 000749588900026; 2-s2.0-85123651379
الإتاحة: https://doi.org/10.1093/nar/gkab1205Test
https://oasis.postech.ac.kr/handle/2014.oak/109311Test -
8مؤتمر
المؤلفون: Tran, Duong Nguyen-Ngoc, Pham, Long Hoang, Jeon, Hyung-Joon, Nguyen, Huy-Hung, Jeon, Hyung-Min, Tran, Tai Huu-Phuong, Wook Jeon, Jae
المساهمون: National Research Foundation
المصدر: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
الإتاحة: https://doi.org/10.1109/cvprw56347.2022.00355Test
http://xplorestaging.ieee.org/ielx7/9856930/9856648/09857139.pdf?arnumber=9857139Test -
9مؤتمر
المؤلفون: Pham, Long Hoang, Nguyen-Ngoc Tran, Duong, Nguyen, Huy-Hung, Tran, Tai Huu-Phuong, Jeon, Hyung-Joon, Jeon, Hyung-Min, Jeon, Jae Wook
المصدر: 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
الإتاحة: https://doi.org/10.1109/cvprw56347.2022.00350Test
http://xplorestaging.ieee.org/ielx7/9856930/9856648/09857462.pdf?arnumber=9857462Test -
10مؤتمر
المؤلفون: Jeon, Hyung-Min, Pham, Long Hoang, Tran, Duong Nguyen-Ngoc, Nguyen, Huy-Hung, Jeon, Jae Wook
المصدر: 2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)
الإتاحة: https://doi.org/10.1109/icce-asia57006.2022.9954858Test
http://xplorestaging.ieee.org/ielx7/9954607/9954630/09954858.pdf?arnumber=9954858Test