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1دورية أكاديمية
المؤلفون: S. S. Teja Nibhanupudi, Anupam Roy, Dmitry Veksler, Matthew Coupin, Kevin C. Matthews, Matthew Disiena, Ansh, Jatin V. Singh, Ioana R. Gearba-Dolocan, Jamie Warner, Jaydeep P. Kulkarni, Gennadi Bersuker, Sanjay K. Banerjee
المصدر: Nature Communications, Vol 15, Iss 1, Pp 1-10 (2024)
مصطلحات موضوعية: Science
وصف الملف: electronic resource
العلاقة: https://doaj.org/toc/2041-1723Test
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2دورية أكاديمية
المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Vol 8, Iss 1, Pp 35-43 (2022)
مصطلحات موضوعية: Compute-in-memory (CIM), embedded DRAM (eDRAM), indium–gallium–zinc–oxide (IGZO), leakage, multilevel cell, read, Computer engineering. Computer hardware, TK7885-7895
وصف الملف: electronic resource
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3دورية أكاديمية
المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Vol 7, Iss 1, Pp 70-78 (2021)
مصطلحات موضوعية: 3-D integration, energy efficient, systolic accelerators, thermal, Computer engineering. Computer hardware, TK7885-7895
وصف الملف: electronic resource
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4دورية أكاديمية
المؤلفون: S. S. Teja Nibhanupudi, Siddhartha Raman Sundara Raman, Mikael Casse, Louis Hutin, Jaydeep P. Kulkarni
المصدر: IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, Vol 7, Iss 2, Pp 201-208 (2021)
مصطلحات موضوعية: Cryo-CMOS, embedded dynamic random access memory (eDRAM), flip-flop, pseudo-static, retention time, ultra-thin body and buried oxide silicon-on-insulator (UTBB-SOI), Computer engineering. Computer hardware, TK7885-7895
وصف الملف: electronic resource
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5
المؤلفون: Mingtao Zhan, Yongpan Liu, Xiyuan Tang, David Z. Pan, Keren Zhu, Jaydeep P. Kulkarni, Nan Sun, Meizhi Wang, Xiangxing Yang, Nanshu Lu
المصدر: CICC
مصطلحات موضوعية: Reduction (complexity), Artificial neural network, Edge device, Computer science, In-Memory Processing, Enhanced Data Rates for GSM Evolution, Electrical and Electronic Engineering, Convolutional neural network, Algorithm, MNIST database, Efficient energy use
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::787c64a648b8098237df501f9c1ef935Test
https://doi.org/10.1109/jssc.2023.3238725Test -
6
المؤلفون: Rishabh Sehgal, Tanmay Thareja, Shanshan Xie, Can Ni, Jaydeep P. Kulkarni
المصدر: IEEE Journal of Solid-State Circuits. :1-16
مصطلحات موضوعية: Electrical and Electronic Engineering
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::db47d875667ca2d5c1a1aba349006502Test
https://doi.org/10.1109/jssc.2023.3235210Test -
7
المؤلفون: Stafford Hutchins, Atresh Sanne, Zhanping Chen, Mohammad M. Hasan, Uddalak Bhattacharya, Eric Karl, Jaydeep P. Kulkarni
المصدر: IEEE Solid-State Circuits Letters. 6:9-12
مصطلحات موضوعية: Electrical and Electronic Engineering
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::8e069ffe2c7e5e793023d765bf01fdb6Test
https://doi.org/10.1109/lssc.2022.3232525Test -
8
المؤلفون: Rahul Mathur, Mudit Bhargava, Heath Perry, Alberto Cestero, Frank Frederick, Daniel Smith, Daniel Fisher, Norman Robson, Brian Cline, Jaydeep. P. Kulkarni
المصدر: IEEE Transactions on Electron Devices. 69:6731-6737
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::2ec596c4193b5b108258d00d7e8a58b7Test
https://doi.org/10.1109/ted.2022.3217208Test -
9
المؤلفون: Shanshan Xie, Siddhartha Raman Sundara Raman, Can Ni, Meizhi Wang, Mengtian Yang, Jaydeep P. Kulkarni
المصدر: IEEE Journal of Solid-State Circuits. 57:3453-3465
مصطلحات موضوعية: Electrical and Electronic Engineering
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::5afb4193bb96887a17443327b95c9f1eTest
https://doi.org/10.1109/jssc.2022.3176610Test -
10
المؤلفون: S. S. Teja Nibhanupudi, Divya Prasad, Shidhartha Das, Odysseas Zografos, Alex Robinson, Anshul Gupta, Alessio Spessot, Peter Debacker, Diederik Verkest, Julien Ryckaert, Geert Hellings, James Myers, Brian Cline, Jaydeep P. Kulkarni
المصدر: IEEE Transactions on Electron Devices. 69:4453-4459
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3ce4f049a68c97db20fe30a94e14c916Test
https://doi.org/10.1109/ted.2022.3186657Test