المؤلفون: Redaelli, A., Gandolfo, A., Samanni, G., Gomiero, E., Petroni, E., Scotti, L., Lippiello, A., Mattavelli, P., Jasse, J., Codegoni, D., Serafini, A., Ranica, R., Boccaccio, C., Sandrini, J., Berthelon, R., Grenier, J.-C., Weber, O., Turgis, D., Valery, A., Medico, S. Del, Caubet, V., Reynard, J.-P., Dutartre, D., Favennec, L., Conte, A., Disegni, F., De Tomasi, M., Ventre, A., Baldo, M., Ielmini, D., Maurelli, A., Ferreira, P., Arnaud, F., Piazza, F., Cappelletti, P., Annunziata, R., Gonella, R.

المساهمون: STMicroelectronics

المصدر: IEEE Journal of the Electron Devices Society ; volume 10, page 563-568 ; ISSN 2168-6734

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biotechnology

الإتاحة: https://doi.org/10.1109/jeds.2022.3162755Test
http://xplorestaging.ieee.org/ielx7/6245494/9714452/09743565.pdf?arnumber=9743565Test

المؤلفون: Gomiero, E., Ristoiu, D., Reynard, J. P., Clement, L., Zuliani, P., Annunziata, R., Arnaud, F., Samanni, G., Jasse, J., Jahan, C., Weber, O., Berthelon, R., Ranica, R., Favennec, L., Caubet, V.

المصدر: IEEE Journal of the Electron Devices Society ; volume 7, page 517-521 ; ISSN 2168-6734

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biotechnology

الإتاحة: https://doi.org/10.1109/jeds.2019.2913467Test
http://xplorestaging.ieee.org/ielx7/6245494/8656606/08704299.pdf?arnumber=8704299Test

المؤلفون: Redaelli, A., Gandolfo, A., Samanni, G., Gomiero, E., Petroni, E., Scotti, L., Lippiello, A., Mattavelli, P., Jasse, J., Codegoni, D., Serafini, A., Ranica, R., Boccaccio, C., Sandrini, J., Berthelon, R., Grenier, JC., Weber, O., Turgis, D., Valery, A., Del Medico, S., Caubet, V., Reynard, JP., Dutartre, D., Favennec, L., Conte, A., Disegni, F., De Tomasi, M., Ventre, A., Baldo, M., Ielmini, D., Maurelli, A., Ferreira, P., Arnaud, F., Piazza, F., Cappelletti, P., Annunziata, R., Gonella, R.

المساهمون: Redaelli, A., Gandolfo, A., Samanni, G., Gomiero, E., Petroni, E., Scotti, L., Lippiello, A., Mattavelli, P., Jasse, J., Codegoni, D., Serafini, A., Ranica, R., Boccaccio, C., Sandrini, J., Berthelon, R., Grenier, Jc., Weber, O., Turgis, D., Valery, A., Del Medico, S., Caubet, V., Reynard, Jp., Dutartre, D., Favennec, L., Conte, A., Disegni, F., De Tomasi, M., Ventre, A., Baldo, M., Ielmini, D., Maurelli, A., Ferreira, P., Arnaud, F., Piazza, F., Cappelletti, P., Annunziata, R., Gonella, R.

العلاقة: info:eu-repo/semantics/altIdentifier/isbn/978-1-6654-3748-6; info:eu-repo/semantics/altIdentifier/wos/WOS:000790809500054; ispartofbook:ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC); ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC); firstpage:231; lastpage:234; numberofpages:4; http://hdl.handle.net/11311/1194824Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85123399613

الإتاحة: https://doi.org/10.1109/ESSDERC53440.2021.9631807Test
http://hdl.handle.net/11311/1194824Test

المؤلفون: Ranica, R., Berthelon, R., Gandolfo, A., Samanni, G., Gomiero, E., Jasse, J., Mattavelli, P., Sandrini, J., Querre, M., Le-Friec, Y., Poulet, J., Caubet, V., Favennec, L., Boccaccio, C., Ghezzi, G., Gallon, C., Grenier, JC., Dumont, B., Weber, O., Villaret, A., Beneyton, R., Cherault, N., Ristoiu, D., Del Medico, S., Kermarrec, O., Reynard, JP., Boivin, P., Souhaite, A., Desvoivres, L., Chouteau, S., Sassoulas, PO., Clement, L., Valery, A., Petroni, E., Turgis, D., Lippiello, A., Scotti, L., Disegni, F., Ventre, A., Ornaghi, D., De Tomasi, M., Maurelli, A., Conte, A., Arnaud, F., Redaelli, A., Annunziata, R., Cappelletti, P., Piazza, F., Ferreira, P., Gonella, R.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM)

الإتاحة: https://doi.org/10.1109/iedm19574.2021.9720669Test
http://xplorestaging.ieee.org/ielx7/9720433/9720494/09720669.pdf?arnumber=9720669Test

المؤلفون: Arnaud, F., Ferreira, P., Piazza, F., Gandolfo, A., Zuliani, P., Mattavelli, P., Gomiero, E., Samanni, G., Jasse, J., Jahan, C., Reynard, J. P., Berthelon, R., Weber, O., Villaret, A., Dumont, B., Grenier, J. C., Ranica, R., Gallon, C., Boccaccio, C., Souhaite, A., Desvoivres, L., Ristoiu, D., Favennec, L., Caubet, V., Delmedico, S., Cherault, N., Beneyton, R., Chouteau, S., Sassoulas, P. O., Clement, L., Boivin, P., Turgis, D., Disegni, F., Ogier, J. L., Federspiel, X., Kermarrec, O., Molgg, M., Viscuso, A., Annunziata, R., Maurelli, A., Cappelletti, P., Ciantar, E.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM)

الإتاحة: https://doi.org/10.1109/iedm13553.2020.9371934Test
http://xplorestaging.ieee.org/ielx7/9371868/9371888/09371934.pdf?arnumber=9371934Test

المؤلفون: Federspiel, X., Jasse, J., Ney, D., Roy, D., Rafik, M.

المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW)

الإتاحة: https://doi.org/10.1109/iirw47491.2019.8989883Test
http://xplorestaging.ieee.org/ielx7/8976314/8989871/08989883.pdf?arnumber=8989883Test