يعرض 1 - 10 نتائج من 87 نتيجة بحث عن '"Jalkanen, Pasi"', وقت الاستعلام: 0.84s تنقيح النتائج
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    دورية أكاديمية

    المساهمون: Materials Physics, Department of Physics

    وصف الملف: application/pdf

    العلاقة: Kaspi , O , Israelsohn-Azulay , O , Yigal , Z , Rosengarten , H , Krmpotić , M , Gouasmia , S , Bogdanović Radović , I , Jalkanen , P , Liski , A , Mizohata , K , Räisänen , J , Kasztovszky , Z , Harsányi , I , Acharya , R , Pujari , P K , Mihály , M , Braun , M , Shabi , N , Girshevitz , O & Senderowitz , H 2022 , ' Toward Developing Techniques─Agnostic Machine Learning Classification Models for Forensically Relevant Glass Fragments ' , Journal of Chemical Information and Modeling , vol. 63 , no. 1 , pp. 87–100 . https://doi.org/10.1021/acs.jcim.2c01362Test; ORCID: /0000-0003-1703-2247/work/131539466; ORCID: /0000-0002-0174-8366/work/131540712; 735c150c-d877-4c41-8317-5947caf32dc3; http://hdl.handle.net/10138/356300Test; 000928482500001

  2. 2
    دورية أكاديمية

    المساهمون: Department of Chemistry, Materials Physics, Mikko Ritala / Principal Investigator, HelsinkiALD

    وصف الملف: application/pdf

    العلاقة: SUOMEN AKATEMIA Vähäkylä Leena; 330086; Weiss , A , Goldmann , J , Kettunen , A S , Popov , G , Iivonen , T , Mattinen , M , Jalkanen , P , Hatanpää , T , Leskelä , M , Ritala , M & Kemell , M 2023 , ' Conversion of ALD CuO Thin Films into Transparent Conductive p-Type CuI Thin Films ' , Advanced Materials Interfaces , vol. 10 , no. 3 , 2201860 . https://doi.org/10.1002/admi.202201860Test; ORCID: /0000-0001-5830-2800/work/130598678; ORCID: /0000-0002-3583-2064/work/130598701; ORCID: /0000-0002-6210-2980/work/130598709; ORCID: /0000-0003-3745-8296/work/130600430; ORCID: /0000-0002-0174-8366/work/130600549; ORCID: /0000-0003-4837-1823/work/130604760; ORCID: /0000-0001-5585-2655/work/130606472; 85143587924; 8c1d3d00-db1f-4134-9db4-1ce7bbe406f0; http://hdl.handle.net/10138/356052Test; 000895814200001

  3. 3
    دورية أكاديمية

    المساهمون: Materials Physics, Department of Physics

    وصف الملف: application/pdf

    العلاقة: Vuoriheimo , T , Liski , A , Jalkanen , P , Ahlgren , T , Mizohata , K , Heinola , K , Zayachuk , Y , Tseng , K-K , Tsai , C-W , Yeh , J-W & Tuomisto , F 2023 , ' Hydrogen isotope exchange experiments in high entropy alloy WMoTaNbV ' , Nuclear Materials and Energy , vol. 34 , 101348 . https://doi.org/10.1016/j.nme.2022.101348Test; ORCID: /0000-0003-1703-2247/work/131539467; ORCID: /0000-0002-0174-8366/work/131540713; ORCID: /0000-0002-0213-7305/work/131540721; ORCID: /0000-0003-4266-9178/work/131544519; ORCID: /0000-0002-6913-5654/work/131545742; 85144553873; 3ddb6f08-87ec-4359-a9cf-56c6576944ad; http://hdl.handle.net/10138/356509Test; 000990103900001

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    دورية أكاديمية

    المساهمون: Materials Physics, Department of Physics

    وصف الملف: application/pdf

    العلاقة: Vuoriheimo , T , Liski , A , Heinola , K , Jalkanen , P , Mizohata , K , Ahlgren , T & Räisänen , J 2023 , ' Deuterium retention in tungsten studied by sequential implantations at ELM-relevant energies ' , Nuclear Materials and Energy , vol. 34 , 101392 . https://doi.org/10.1016/j.nme.2023.101392Test; ORCID: /0000-0003-1703-2247/work/131539468; ORCID: /0000-0002-0601-8274/work/131539526; ORCID: /0000-0002-0174-8366/work/131540714; ORCID: /0000-0002-0213-7305/work/131540722; ORCID: /0000-0003-4266-9178/work/131544520; 85148542002; 1a18364c-579c-40ce-bc29-73a4b5dbf3fa; http://hdl.handle.net/10138/356510Test; 000990101800001

  5. 5
    دورية أكاديمية
  6. 6
    دورية أكاديمية

    المساهمون: Department of Chemistry, Materials Physics, Mikko Ritala / Principal Investigator, HelsinkiALD

    وصف الملف: application/pdf

    العلاقة: SUOMEN AKATEMIA Vähäkylä Leena; 330086; Weiss , A , Popov , G , Atosuo , E K , Vihervaara , A , Jalkanen , P , Vehkamäki , M , Leskelä , M , Ritala , M & Kemell , M 2022 , ' Atomic Layer Deposition of CsI and CsPbI 3 ' , Chemistry of Materials , vol. 34 , no. 13 , pp. 6087-6097 . https://doi.org/10.1021/acs.chemmater.2c01202Test; ORCID: /0000-0001-5830-2800/work/119999831; ORCID: /0000-0002-3583-2064/work/119999918; ORCID: /0000-0002-6210-2980/work/119999940; ORCID: /0000-0002-0174-8366/work/120002543; ORCID: /0000-0002-2662-7202/work/120006155; ORCID: /0000-0001-5585-2655/work/120007357; 85134845286; 5d0b0e1e-3aae-4ad4-a811-e1df8e24d653; http://hdl.handle.net/10138/349477Test; 000821902900001

  7. 7
    دورية أكاديمية

    المساهمون: Department of Chemistry, Materials Physics, Department of Physics, Mikko Ritala / Principal Investigator, HelsinkiALD

    وصف الملف: application/pdf

    العلاقة: SUOMEN AKATEMIA Vähäkylä Leena; We thank Dr Marko Vehkamaki for the Pt deposition on a very short notice. We thank the Finnish Center of Excellence in Atomic Layer Deposition (ALDCoE 2012-2017, decision number 284623) and additional support from the Academy of Finland (decision number 330086). ALD center Finland is thanked for providing access to tools and instruments. G. P. acknowledges the doctoral program in Materials Research and Nanosciences (MATRENA) of the University of Helsinki as well as Emil Aaltonen and Walter Ahlstrom foundations for funding and support. G. B. thanks the Digital Research Alliance of Canada for computer time on the Cedar cluster.; 330086; Popov , G , Bacic , G , Van Dijck , C , Junkers , L S , Weiss , A , Mattinen , M , Vihervaara , A , Chundak , M , Jalkanen , P , Mizohata , K , Leskela , M , Masuda , J D , Barry , S T , Ritala , M & Kemell , M 2022 , ' Atomic layer deposition of PbCl2, PbBr2 and mixed lead halide (Cl, Br, I) PbXnY2-n thin films ' , Dalton Transactions , vol. 51 , no. 39 , pp. 15142-15157 . https://doi.org/10.1039/d2dt02216hTest; ORCID: /0000-0001-5830-2800/work/123552641; ORCID: /0000-0002-3583-2064/work/123552688; ORCID: /0000-0002-6210-2980/work/123552694; ORCID: /0000-0003-1703-2247/work/123553619; ORCID: /0000-0002-0174-8366/work/123554281; ORCID: /0000-0003-4837-1823/work/123556011; ORCID: /0000-0003-4417-1832/work/123559255; ORCID: /0000-0001-5585-2655/work/123559337; 85139739549; 59861042-c774-4416-964c-ed6a4639e232; http://hdl.handle.net/10138/350955Test; 000857553000001

  8. 8
    دورية أكاديمية
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    دورية أكاديمية
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    دورية أكاديمية