المؤلفون: Liu, Maomao, Jaiswal, Hemendra Nath, Shahi, Simran, Wei, Sichen, Fu, Yu, Chang, Chaoran, Chakravarty, Anindita, Liu, Xiaochi, Yang, Cheng, Liu, Yanpeng, Lee, Young Hee, Yao, Fei, Li, Huamin

مصطلحات موضوعية: Condensed Matter - Mesoscale and Nanoscale Physics, Condensed Matter - Materials Science

الوصول الحر: http://arxiv.org/abs/2012.13970Test

المؤلفون: Jaiswal, Hemendra Nath, Liu, Maomao, Shahi, Simran, Wei, Sichen, Lee, Jihea, Chakravarty, Anindita, Guo, Yutong, Wang, Ruiqiang, Lee, Jung Mu, Chang, Chaoran, Fu, Yu, Dixit, Ripudaman, Liu, Xiaochi, Yang, Cheng, Yao, Fei, Li, Huamin

مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Mesoscale and Nanoscale Physics

الوصول الحر: http://arxiv.org/abs/2003.12879Test

المؤلفون: Liu, Maomao, Wei, Sichen, Shahi, Simran, Jaiswal, Hemendra Nath, Paletti, Paolo, Fathipour, Sara, Remskar, Maja, Jiao, Jun, Hwang, Wansik, Yao, Fei, Li, Huamin

مصطلحات موضوعية: Condensed Matter - Materials Science

الوصول الحر: http://arxiv.org/abs/2001.05105Test

المؤلفون: Jaiswal, Hemendra Nath, Liu, Maomao, Shahi, Simran, Yao, Fei, Zhao, Qiyi, Xu, Xinlong, Li, Huamin

مصطلحات موضوعية: Condensed Matter - Materials Science

الوصول الحر: http://arxiv.org/abs/1810.04829Test

المؤلفون: Jaiswal, Hemendra Nath, Liu, Maomao, Shahi, Simran, Cabanillas, Anthony, Wei, Sichen, Fu, Yu, Chakravarty, Anindita, Ahmed, Asma, Muhigirwa, Joel, Yao, Fei, Li, Huamin

المساهمون: National Science Foundation

المصدر: Nano Express ; volume 4, issue 3, page 035002 ; ISSN 2632-959X

الإتاحة: https://doi.org/10.1088/2632-959x/acd5edTest

المؤلفون: Shahi, Simran, Ahmed, Asma, Yang, Ruizhe, Cabanillas, Anthony, Chakravarty, Anindita, Liu, Maomao, Jaiswal, Hemendra Nath, Fu, Yu, Guo, Yutong, Jadeja, Satyajeetsinh Shaileshsin, Murugesan, Hariharan, Butler, Anthony, Chen, Chu Te, Muhigirwa, Joel, Enaitalla, Mohamed, Liu, Jun, Yao, Fei, Li, Huamin

المصدر: Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; Sep2023, Vol. 41 Issue 5, p1-10, 10p

مصطلحات موضوعية: ENERGY bands, SEMICONDUCTOR technology, ELECTRIC fields, NANOELECTRONICS, ENGINEERING

المؤلفون: Shahi, Simran, Liu, Maomao, Jaiswal, Hemendra Nath, Chakravarty, Anindita, Wei, Sichen, Fu, Yu, Ahmed, Asma, Cabanillas, Anthony, Yao, Fei, Li, Huamin

المساهمون: National Science Foundation, Research and Development

المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

الإتاحة: https://doi.org/10.1109/edtm53872.2022.9798125Test
http://xplorestaging.ieee.org/ielx7/9797886/9797892/09798125.pdf?arnumber=9798125Test

المؤلفون: Wei, Sichen, Fu, Yu, Roy, Pinku, Tong, Xiao, Yue, Hongyan, Liu, Maomao, Jaiswal, Hemendra Nath, Shahi, Simran, Gata, Yannick Iniatius, Butler, Tony, Li, Huamin, Jia, Quanxi, Yao, Fei

المساهمون: University at Buffalo, Division of Electrical, Communications and Cyber Systems, New York State Energy Research and Development Authority, New York State Center of Excellence in Materials Informatics

المصدر: ACS Applied Materials & Interfaces ; volume 14, issue 31, page 35673-35681 ; ISSN 1944-8244 1944-8252

مصطلحات موضوعية: General Materials Science

الإتاحة: https://doi.org/10.1021/acsami.2c07984Test

المؤلفون: Liu, Maomao, Jaiswal, Hemendra Nath, Shahi, Simran, Wei, Sichen, Fu, Yu, Chang, Chaoran, Chakravarty, Anindita, Yao, Fei, Li, Huamin

المساهمون: National Science Foundation, Research and Development

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM)

الإتاحة: https://doi.org/10.1109/iedm13553.2020.9371961Test
http://xplorestaging.ieee.org/ielx7/9371868/9371888/09371961.pdf?arnumber=9371961Test

المؤلفون: Liu, Maomao, Jaiswal, Hemendra Nath, Shahi, Simran, Wei, Sichen, Fu, Yu, Chang, Chaoran, Chakravarty, Anindita, Liu, Xiaochi, Yang, Cheng, Liu, Yanpeng, Lee, Young Hee, Perebeinos, Vasili, Yao, Fei, Li, Huamin

المساهمون: New York State Energy Research and Development Authority, National Science Foundation, New York State Center of Excellence in Materials Informatics, Vice President for Research and Economic Development (VPRED) at the University at Buffalo

المصدر: ACS Nano ; volume 15, issue 3, page 5762-5772 ; ISSN 1936-0851 1936-086X

الإتاحة: https://doi.org/10.1021/acsnano.1c01503Test