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1دورية أكاديمية
المؤلفون: Cheng Gu, George Belev, Haonan Tian, Shuting Shi, Issam Nofal, Shijie Wen, Li Chen
المصدر: Applied Sciences, Vol 10, Iss 9, p 3018 (2020)
مصطلحات موضوعية: sensitivity mapping, mirror–mirror system, SEEs, pulsed laser, two photon absorption, TFIT simulation, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Cheng Gu, Rui Chen, George Belev, Shuting Shi, Haonan Tian, Issam Nofal, Li Chen
المصدر: Materials, Vol 12, Iss 20, p 3411 (2019)
مصطلحات موضوعية: pulsed laser, single event effect, sram, two photon absorption, sensitive mapping, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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المؤلفون: Li Cai, Sun Hongwen, Li Chen, Zicai Shen, Xixi Dai, Haibin Wang, Younis Ibrahim, Gang Guo, Issam Nofal
المصدر: Journal of Electronic Testing. 35:111-117
مصطلحات موضوعية: Page layout, Computer science, business.industry, 020208 electrical & electronic engineering, Transistor, Dice, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, computer.software_genre, 020202 computer hardware & architecture, Charge sharing, law.invention, Zigzag, law, Single event upset, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electrical and Electronic Engineering, business, computer, Flip-flop, Computer hardware, Hardware_LOGICDESIGN
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::9bc9a11804b530c7778cd55e122abb4bTest
https://doi.org/10.1007/s10836-019-05773-4Test -
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المؤلفون: Li Cai, Xixi Dai, Zicai Shen, L. Chen, Bo Li, Issam Nofal, Gang Guo, Wanxiu Sun, Yangsheng Wang, Haibin Wang, Jinshun Bi, Sang H. Baeg
المصدر: Microelectronics Reliability. :909-913
مصطلحات موضوعية: 010308 nuclear & particles physics, Computer science, Reference design, 020208 electrical & electronic engineering, Transistor, Dice, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Condensed Matter Physics, Topology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Upset, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Charge sharing, law.invention, Cross section (physics), law, Single event upset, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Transient (oscillation), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::b21b1124b123fc54f024e84151dafe70Test
https://doi.org/10.1016/j.microrel.2018.07.019Test -
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المؤلفون: R. Gonella, F. Monsieur, Issam Nofal, Dan Alexandrescu, J. Cerba, V. Correas, Philippe Roche, Gilles Gasiot
المصدر: IEEE Transactions on Nuclear Science. 65:1894-1899
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, 010308 nuclear & particles physics, business.industry, Transistor, Silicon on insulator, Charge (physics), 01 natural sciences, law.invention, Nuclear Energy and Engineering, law, Electric field, Logic gate, 0103 physical sciences, Electrode, Optoelectronics, Electrical and Electronic Engineering, Current (fluid), business, Polarization (electrochemistry)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::2604b57ddc2ea507718844b8336880baTest
https://doi.org/10.1109/tns.2018.2828162Test -
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المؤلفون: Haonan Tian, George Belev, Shi-Jie Wen, Cheng Gu, Shuting Shi, Li Chen, Issam Nofal
المصدر: Applied Sciences
Volume 10
Issue 9
Applied Sciences, Vol 10, Iss 3018, p 3018 (2020)مصطلحات موضوعية: Computer science, 02 engineering and technology, lcsh:Technology, 01 natural sciences, law.invention, lcsh:Chemistry, SEEs, two photon absorption, Optics, TFIT simulation, law, pulsed laser, 0103 physical sciences, General Materials Science, Sensitivity (control systems), Electronics, Static random-access memory, lcsh:QH301-705.5, Instrumentation, Fluid Flow and Transfer Processes, Attenuator (electronics), lcsh:T, 010308 nuclear & particles physics, business.industry, Process Chemistry and Technology, General Engineering, 021001 nanoscience & nanotechnology, Chip, Laser, mirror–mirror system, lcsh:QC1-999, Pockels effect, Computer Science Applications, lcsh:Biology (General), lcsh:QD1-999, lcsh:TA1-2040, Operational amplifier, lcsh:Engineering (General). Civil engineering (General), 0210 nano-technology, business, sensitivity mapping, lcsh:Physics
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fff663cfac35d6d1e5741547b0e93201Test
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المؤلفون: Haonan Tian, Li Chen, Issam Nofal, Rui Chen, Shuting Shi, George Belev, Cheng Gu
المصدر: Materials
Materials, Vol 12, Iss 20, p 3411 (2019)
Volume 12
Issue 20مصطلحات موضوعية: Materials science, ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION, 02 engineering and technology, Integrated circuit, 01 natural sciences, Two-photon absorption, lcsh:Technology, Article, law.invention, two photon absorption, Optics, law, pulsed laser, 0103 physical sciences, General Materials Science, Static random-access memory, Sensitivity (control systems), lcsh:Microscopy, lcsh:QC120-168.85, lcsh:QH201-278.5, 010308 nuclear & particles physics, business.industry, lcsh:T, 021001 nanoscience & nanotechnology, Threshold energy, Laser, SRAM, Pockels effect, Lens (optics), single event effect, sensitive mapping, lcsh:TA1-2040, lcsh:Descriptive and experimental mechanics, lcsh:Electrical engineering. Electronics. Nuclear engineering, 0210 nano-technology, business, lcsh:Engineering (General). Civil engineering (General), lcsh:TK1-9971
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::58cd3ebc5a76f36de63acc031b1efa9eTest
http://europepmc.org/articles/PMC6829216Test -
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المؤلفون: Rick Wong, Haibin Wang, Rui Liu, S. T. Shi, Yuanqing Li, Sanghyeon Baeg, L. Chen, Issam Nofal, A.-L. He, Mo Chen, Qiong Wu, Gang Guo, S.-J. Wen
المصدر: IEEE Transactions on Nuclear Science. 64:1554-1561
مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, Engineering, 010308 nuclear & particles physics, business.industry, Transistor, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, law.invention, Soft error, Nuclear Energy and Engineering, CMOS, law, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Redundancy (engineering), Electrical and Electronic Engineering, business, Flip-flop, Hardware_LOGICDESIGN, Electronic circuit
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3239bb54292a10297c1eb5202f59d040Test
https://doi.org/10.1109/tns.2017.2704062Test -
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المؤلفون: Sang H. Baeg, Qiong Wu, Rui Liu, An-Lin He, Qingyu Chen, Issam Nofal, Shi-Jie Wen, Haibin Wang, Li Chen, Mo Chen, Richard Wong, Gang Guo, Yuanqing Li
المصدر: IEEE Transactions on Nuclear Science. 63:2934-2940
مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, Engineering, 010308 nuclear & particles physics, business.industry, Radiation, 01 natural sciences, Upset, Power (physics), law.invention, Set (abstract data type), Nuclear Energy and Engineering, CMOS, law, 0103 physical sciences, Electronic engineering, Sensitivity (control systems), Transient (oscillation), Electrical and Electronic Engineering, business, Flip-flop
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::db464b08218bf556ed3fd7939536c2f9Test
https://doi.org/10.1109/tns.2016.2608911Test -
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المؤلفون: Hafnaoui Belhaddad, Steve Kwon, Dan Alexandrescu, Jinhyun Noh, Young-Keun Lee, Jacques Cerba, Issam Nofal, Vincent Correas, Jeon Jong-Sung, Soonyoung Lee
المصدر: IEEE Transactions on Nuclear Science. 62:1642-1649
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Transistor, Hardware_PERFORMANCEANDRELIABILITY, Semiconductor device, Upset, law.invention, Reduction (complexity), Planar, Soft error, Nuclear Energy and Engineering, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Sensitivity (control systems), Electrical and Electronic Engineering
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f7643e17d465a67cb1b358cc10e0caedTest
https://doi.org/10.1109/tns.2015.2450997Test