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1دورية أكاديمية
المؤلفون: Uedono, A.1, Inumiya, S.2, Matsuki, T.2, Aoyama, T.2, Nara, Y.2, Ishibashi, S.3, Ohdaira, T.4, Suzuki, R.4, Miyazaki, S.5, Yamada, K.6
المصدر: Journal of Applied Physics. 9/1/2007, Vol. 102 Issue 5, p054511. 7p. 1 Chart, 6 Graphs.
مصطلحات موضوعية: *FLUORINE, *METAL oxide semiconductors, *DIELECTRICS, *POSITRON annihilation, *ANNIHILATION reactions, *TRANSISTORS, *POSITRON beams
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2دورية أكاديمية
المؤلفون: Uedono, A., Ikeuchi, K., Otsuka, T., Shiraishi, K., Yamabe, K., Miyazaki, S., Umezawa, N., Hamid, A., Chikyow, T., Muramatsu, T. Ohdaira M., Suzuki, R., Inumiya, S., Kamiyama, S., Akasaka, Y., Nara, Y., Yamada, K.
المصدر: Journal of Applied Physics; 3/1/2006, Vol. 99 Issue 5, p054507, 6p, 1 Diagram, 1 Chart, 4 Graphs
مصطلحات موضوعية: POSITRON beams, MOLECULAR spectroscopy, PHOTOELECTRON spectroscopy, SPECTRUM analysis, EXCITON theory, PHYSICS
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3مؤتمر
المؤلفون: Krishnan, S., Kwon, U., Moumen, N., Stoker, M.W., Harley, E.C.T., Bedell, S., Nair, D., Greene, B., Henson, W., Chowdhury, M., Prakash, D.P., Wu, E., Ioannou, D., Cartier, E., Na, M.-H., Inumiya, S., Mcstay, K., Edge, L., Iijima, R., Cai, J., Frank, M., Hargrove, M., Guo, D., Kerber, A., Jagannathan, H., Ando, T., Shepard, J., Siddiqui, S., Dai, M., Bu, H., Schaeffer, J., Jaeger, D., Barla, K., Wallner, T., Uchimura, S., Lee, Y., Karve, G., Zafar, S., Schepis, D., Wang, Y., Donaton, R., Saroop, S., Montanini, P., Liang, Y., Stathis, J., Carter, R., Pal, R., Paruchuri, V., Yamasaki, H., Lee, J-H.
المصدر: 2011 International Electron Devices Meeting
الإتاحة: https://doi.org/10.1109/iedm.2011.6131628Test
http://xplorestaging.ieee.org/ielx5/6123666/6131464/06131628.pdf?arnumber=6131628Test -
4مؤتمر
المؤلفون: Goto, M., Tatsumura, K., Kawanaka, S., Nakajima, K., Ichihara, R., Yoshimizu, Y., Onoda, H., Nagatomo, K., Sasaki, T., Fukushima, T., Nomachi, A., Inumiya, S., Oguma, H., Miyashita, K., Harakawa, H., Inaba, S., Ishida, T., Azuma, A., Aoyama, T., Koyama, M., Eguchi, K., Toyoshima, Y.
المصدر: 2008 Symposium on VLSI Technology
الإتاحة: https://doi.org/10.1109/vlsit.2008.4588591Test
http://xplorestaging.ieee.org/ielx5/4573020/4588540/04588591.pdf?arnumber=4588591Test -
5مؤتمر
المؤلفون: Inumiya, S., Akasaka, Y., Matsuki, T., Ootsuka, F., Torii, K., Nara, Y.
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest.
الإتاحة: https://doi.org/10.1109/iedm.2005.1609256Test
http://xplorestaging.ieee.org/ielx5/10701/33791/01609256.pdf?arnumber=1609256Test -
6مؤتمر
المؤلفون: Koyama, M., Kamimuta, Y., Ino, T., Kaneko, A., Inumiya, S., Eguchi, K., Takayanagi, M., Nishiyama, A.
المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004.
الإتاحة: https://doi.org/10.1109/iedm.2004.1419200Test
http://xplorestaging.ieee.org/ielx5/9719/30682/01419200.pdf?arnumber=1419200Test -
7مؤتمر
المؤلفون: Yamamura, M., Matsuki, T., Robata, T., Watanabe, T., Inumiya, S., Torii, K., Saitou, T., Amai, H., Nara, Y., Kitazoe, M., Yuba, Y., Akasaka, Y.
المصدر: Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005.
الإتاحة: https://doi.org/10.1109/.2005.1469223Test
http://xplorestaging.ieee.org/ielx5/9911/31516/01469223.pdf?arnumber=1469223Test -
8مؤتمر
المؤلفون: Inumiya, S., Sekine, K., Niwa, S., Kaneko, A., Sato, M., Watanabe, T., Fukui, H., Kamata, Y., Koyama, M., Nishiyama, A., Takayanagi, M., Eguchi, K., Tsunashima, Y.
المصدر: 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407)
الإتاحة: https://doi.org/10.1109/vlsit.2003.1221064Test
http://xplorestaging.ieee.org/ielx5/8657/27436/01221064.pdf?arnumber=1221064Test -
9مؤتمر
المؤلفون: Matsushita, D., Muraoka, K., Nakasaki, Y., Kato, K., Inumiya, S., Eguchi, K., Takayanagi, M.
المصدر: Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004.
الإتاحة: https://doi.org/10.1109/vlsit.2004.1345462Test
http://xplorestaging.ieee.org/ielx5/9327/29638/01345462.pdf?arnumber=1345462Test -
10مؤتمر
المؤلفون: Sekine, K., Inumiya, S., Sato, M., Kaneko, A., Eguchi, K., Tsunashima, Y.
المصدر: IEEE International Electron Devices Meeting 2003
الإتاحة: https://doi.org/10.1109/iedm.2003.1269176Test
http://xplorestaging.ieee.org/ielx5/8960/28396/01269176.pdf?arnumber=1269176Test