نتائج البحث - "Howell, Robert S."

1

دورية أكاديمية

Advanced metallization and applications to large area active matrix arrays and polysilicon thin film transistors

مصطلحات موضوعية: Computer terminals. Thin film transistors. Metallizing. Light emitting diodes.

الإتاحة: http://gateway.proquest.com/openurl?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&res_dat=xri:pqdiss&rft_dat=xri:pqdiss:9995527Test

2

دورية أكاديمية

AlGaN/GaN superlattice-based multichannel RF transistors for high linearity and reliability: a simplified simulation approach

المؤلفون: Shaji, Akhil Kumar, Uren, Michael J, Parke, Justin A., Henry, H George, Howell, Robert S., Kuball, Martin

المصدر: Shaji , A K , Uren , M J , Parke , J A , Henry , H G , Howell , R S & Kuball , M 2023 , ' AlGaN/GaN superlattice-based multichannel RF transistors for high linearity and reliability: a simplified simulation approach ' , Semiconductor Science and Technology , vol. 38 , no. 7 , 075009 . https://doi.org/10.1088/1361-6641/acd271Test

مصطلحات موضوعية: /dk/atira/pure/core/keywords/cdtr, CDTR

الإتاحة: https://doi.org/10.1088/1361-6641/acd271Test
https://hdl.handle.net/1983/862f783b-5172-4fe1-9103-9e7698a38395Test
https://research-information.bris.ac.uk/en/publications/862f783b-5172-4fe1-9103-9e7698a38395Test

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3

دورية أكاديمية

Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs

المؤلفون: Kumar, Akhil S., Uren, Michael J, Smith, Matthew D, Kuball, Martin, Parke, Justin, Henry, H George, Howell, Robert S.

المساهمون: Connor, Chris

المصدر: Kumar , A S , Uren , M J , Smith , M D , Kuball , M , Parke , J , Henry , H G & Howell , R S 2023 , Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs . in C Connor (ed.) , 2023 IEEE International Reliability Physics Symposium (IRPS) . IEEE Explore , 2023 IEEE International Reliability Physics Symposium (IRPS) , Monterey, California , United States , 26/03/23 . https://doi.org/10.1109/IRPS48203.2023.10118346Test

مصطلحات موضوعية: /dk/atira/pure/core/keywords/cdtr, CDTR, gallium nitride, SLCFET, TDDB, lifetime, reliability, degradation, step-stressing, noise-analysis, 3D-TCAD, percolation theory, traps