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1مؤتمر
المؤلفون: Ryu, Seong-Wan, Min, Kyungkyu, Shin, Jungho, Kwon, Heimi, Nam, Donghoon, Oh, Taekyung, Jang, Tae-Su, Yoo, Minsoo, Kim, Yongtaik, Hong, Sungjoo
المصدر: 2017 IEEE International Electron Devices Meeting (IEDM)
الإتاحة: https://doi.org/10.1109/iedm.2017.8268437Test
http://xplorestaging.ieee.org/ielx7/8255107/8268301/08268437.pdf?arnumber=8268437Test -
2مؤتمر
المؤلفون: Oh, Dongyean, Lee, Bonghoon, Kwon, Eunmee, Kim, Sangyong, Cho, Gyuseog, Park, Sungkye, Lee, Seokkiu, Hong, Sungjoo
المصدر: 2015 IEEE International Memory Workshop (IMW)
الإتاحة: https://doi.org/10.1109/imw.2015.7150306Test
http://xplorestaging.ieee.org/ielx7/7147357/7150256/07150306.pdf?arnumber=7150306Test -
3مؤتمر
المؤلفون: Kwon, Hyoungcheol, Lee, Yoonsung, Kim, Sangyong, Seung, Manho, Lee, Changyeol, Lee, Seokkiu, Hong, Sungjoo
المصدر: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
الإتاحة: https://doi.org/10.1109/sispad.2015.7292363Test
http://xplorestaging.ieee.org/ielx7/7274904/7292241/07292363.pdf?arnumber=7292363Test -
4مؤتمر
المؤلفون: Lee, Dong Uk, Kim, Kyung Whan, Kim, Kwan Weon, Kim, Hongjung, Kim, Ju Young, Park, Young Jun, Kim, Jae Hwan, Kim, Dae Suk, Park, Heat Bit, Shin, Jin Wook, Cho, Jang Hwan, Kwon, Ki Hun, Kim, Min Jeong, Lee, Jaejin, Park, Kun Woo, Chung, Byongtae, Hong, Sungjoo
المصدر: 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC)
الإتاحة: https://doi.org/10.1109/isscc.2014.6757501Test
http://xplorestaging.ieee.org/ielx7/6747109/6757318/06757501.pdf?arnumber=6757501Test -
5مؤتمر
المؤلفون: Lee, Hyun-Woo, Song, Junyoung, Hyun, Sang-Ah, Baek, Seunggeun, Lim, Yuri, Lee, Jungwan, Park, Minsu, Choi, Haerang, Choi, Changkyu, Cha, Jinyoup, Kim, Jaeil, Choi, Hoon, Kwack, Seungwook, Kang, Yonggu, Kim, Jongsam, Park, Junghoon, Kim, Jonghwan, Cho, Jinhee, Kim, Chulwoo, Kim, Yunsaing, Lee, Jaejin, Chung, Byongtae, Hong, Sungjoo
المصدر: 2014 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC)
الإتاحة: https://doi.org/10.1109/isscc.2014.6757502Test
http://xplorestaging.ieee.org/ielx7/6747109/6757318/06757502.pdf?arnumber=6757502Test -
6مؤتمر
المؤلفون: Yoo, HyunSeung, Choi, EunSeok, Oh, JungSeok, Park, KyoungJin, Jung, SungWook, Kim, SeHoon, Shim, KeonSoo, Joo, HanSoo, Jeon, KwangSun, Seo, MoonSik, Jang, YoonSoo, Lee, SangBum, Lee, JuYeab, Oh, SangHyun, Cho, GyuSeog, Park, SungKye, Lee, SeokKiu, Hong, SungJoo
المصدر: 2013 5th IEEE International Memory Workshop
الإتاحة: https://doi.org/10.1109/imw.2013.6582120Test
http://xplorestaging.ieee.org/ielx7/6575454/6582077/06582120.pdf?arnumber=6582120Test -
7مؤتمر
المؤلفون: Noh, Yoohyun, Ahn, Youngsoo, Yoo, Hyunseung, Han, Byeongil, Chung, Sungjae, Shim, Keonsoo, Lee, Keunwoo, kwak, Sanghyon, Shin, Sungchul, Choi, Iksoo, Nam, Sanghyuk, Cho, Gyuseog, Sheen, Dongsun, Pyi, Seungho, Choi, Jongmoo, Park, Sungkye, Kim, Jinwoong, Lee, Seokkiu, Aritome, Seiichi, Hong, Sungjoo, Park, Sungwook
المصدر: 2012 Symposium on VLSI Technology (VLSIT)
الإتاحة: https://doi.org/10.1109/vlsit.2012.6242440Test
http://xplorestaging.ieee.org/ielx5/6235083/6242429/06242440.pdf?arnumber=6242440Test -
8مؤتمر
المؤلفون: Hong, SungJoo
المصدر: 2012 IEEE Asian Solid State Circuits Conference (A-SSCC)
الإتاحة: https://doi.org/10.1109/ipec.2012.6522619Test
http://xplorestaging.ieee.org/ielx7/6518069/6522605/06522619.pdf?arnumber=6522619Test -
9مؤتمر
المؤلفون: Yoo, HyunSeung, Choi, EunSeok, Joo, HanSoo, Cho, GyuSeog, Park, SungKye, Aritome, Seiichi, Lee, SeokKiu, Hong, SungJoo
المصدر: 2011 3rd IEEE International Memory Workshop (IMW)
الإتاحة: https://doi.org/10.1109/imw.2011.5873206Test
http://xplorestaging.ieee.org/ielx5/5871161/5873182/05873206.pdf?arnumber=5873206Test -
10مؤتمر
المؤلفون: Seo, Soonok, Kim, Hyungseok, Sungkye Park, Lee, Seokkiu, Aritome, Seiichi, Hong, Sungjoo
المصدر: 2011 International Reliability Physics Symposium
الإتاحة: https://doi.org/10.1109/irps.2011.5784548Test
http://xplorestaging.ieee.org/ielx5/5776767/5784429/05784548.pdf?arnumber=5784548Test