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1دورية أكاديمية
المؤلفون: Ohata, Takashi, Nomoto, Akihiro, Watanabe, Takeshi, Hirosawa, Ichiro, Makita, Tatsuyuki, Takeya, Jun, Makiura, Rie
المصدر: Journal of Colloid and Interface Science ; volume 651, page 769-784 ; ISSN 0021-9797
مصطلحات موضوعية: Colloid and Surface Chemistry, Surfaces, Coatings and Films, Biomaterials, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1016/j.jcis.2023.05.151Test
https://api.elsevier.com/content/article/PII:S0021979723009517?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0021979723009517?httpAccept=text/plainTest -
2دورية أكاديمية
المؤلفون: Setoyama, Hiroyuki, Hirosawa, Ichiro
المصدر: Radiation Physics and Chemistry ; volume 220, page 111673 ; ISSN 0969-806X
مصطلحات موضوعية: Radiation
الإتاحة: https://doi.org/10.1016/j.radphyschem.2024.111673Test
https://api.elsevier.com/content/article/PII:S0969806X24001658?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0969806X24001658?httpAccept=text/plainTest -
3مؤتمرSAKAS: Saga light source data karte system and its application to micro and phase-contrast x-ray CT.
المؤلفون: Yoneyama, Akio, Kawamoto, Masahide, Baba, Rika, Lwin, Thet Thet, Hirano, Keiichi, Hyodo, Kazuyuki, Hirosawa, Ichiro, Seno, Yoshiki
المصدر: AIP Conference Proceedings; 9/2/2023, Vol. 2990 Issue 1, p1-4, 4p
مصطلحات موضوعية: X-rays, LIGHT sources, X-ray imaging, IMAGING systems, SYNCHROTRON radiation, IMAGE processing, NOISE control
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4دورية أكاديمية
المؤلفون: Yabuta, Hisato, Watanabe, Masatoshi, Watanabe, Takayuki, Kubota, Makoto, Shimada, Mikio, Koganezawa, Tomoyuki, Hirosawa, Ichiro, Kumada, Nobuhiro, Wada, Satoshi
المساهمون: Ministry of Education, Culture, Sports, Science and Technology
المصدر: Applied Physics Letters ; volume 116, issue 25 ; ISSN 0003-6951 1077-3118
مصطلحات موضوعية: Physics and Astronomy (miscellaneous)
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5دورية أكاديمية
المصدر: Journal of Electronic Materials; Aug2023, Vol. 52 Issue 8, p5140-5149, 10p
مصطلحات موضوعية: SILICON nanowires, NANOWIRES, CRYSTAL orientation, DOPING agents (Chemistry), X-ray diffraction, YOUNG'S modulus, LATTICE constants
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6
المؤلفون: Murata, Sumihiko, Tateyama, Yu, Sugiyama, Shumpei, Okamoto, Naoki, Kubota, Ayumi, Mino, Yasuyuki, Tetsu, Takeshi, Taniguchi, Hiroki, Nakano, Masanori, Liang, Yunfeng, Matsuoka, Toshifumi, Hirosawa, Ichiro
المصدر: SPring-8/SACLA利用研究成果集. 10(1):67-70
وصف الملف: application/pdf
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=jairo_______::45550ee82eaf106576a6c6f18bab65d1Test
http://hdl.handle.net/2433/283406Test -
7دورية أكاديمية
المؤلفون: Ohata, Takashi, Tachimoto, Kazuaki, Takeno, Kanokwan Jumtee, Nomoto, Akihiro, Watanabe, Takeshi, Hirosawa, Ichiro, Makiura, Rie
المصدر: Bulletin of the Chemical Society of Japan ; volume 96, issue 3, page 274-282 ; ISSN 0009-2673 1348-0634
الإتاحة: https://doi.org/10.1246/bcsj.20220283Test
https://academic.oup.com/bcsj/article-pdf/96/3/274/56318883/bcsj.20220283.pdfTest -
8دورية أكاديمية
المصدر: Japanese Journal of Applied Physics ; volume 63, issue 1, page 01SP11 ; ISSN 0021-4922 1347-4065
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9دورية أكاديمية
المؤلفون: Tachimoto, Kazuaki, Ohata, Takashi, Takeno, Kanokwan Jumtee, Nomoto, Akihiro, Watanabe, Takeshi, Hirosawa, Ichiro, Makiura, Rie
المساهمون: Mazda Foundation, Ministry of Education, Culture, Sports, Science and Technology, Masuya Memorial Basic Research Foundation, Japan Society for the Promotion of Science
المصدر: Langmuir ; volume 39, issue 26, page 8952-8962 ; ISSN 0743-7463 1520-5827
مصطلحات موضوعية: Electrochemistry, Spectroscopy, Surfaces and Interfaces, Condensed Matter Physics, General Materials Science
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10دورية أكاديمية
المؤلفون: Cui, Yi-Tao, Tougaard, Sven Mosbæk, Oji, Hiroshi, Son, Jin-Young, Sakamoto, Yasuhiro, Matsumoto, Takuya, Yang, Anli, Sakata, Osami, Song, Huaping, Hirosawa, Ichiro
المصدر: Cui , Y-T , Tougaard , S M , Oji , H , Son , J-Y , Sakamoto , Y , Matsumoto , T , Yang , A , Sakata , O , Song , H & Hirosawa , I 2017 , ' Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy ' , Journal of Applied Physics , vol. 121 , no. 22 , 225307 . https://doi.org/10.1063/1.4985176Test
وصف الملف: application/pdf
العلاقة: https://portal.findresearcher.sdu.dk/da/publications/655be9af-0e91-42ab-9af7-2549e2907272Test
الإتاحة: https://doi.org/10.1063/1.4985176Test
https://portal.findresearcher.sdu.dk/da/publications/655be9af-0e91-42ab-9af7-2549e2907272Test
https://findresearcher.sdu.dk/ws/files/125851341/Thickness_and_structure_of_thin_films_determined_by_background_analysis_in_hard_X_ray_photoelectron_spectroscopy.pdfTest