المؤلفون: Kwon, Hyunah, Barad, Hannah-Noa, Olaya, Alex Ricardo Silva, Alarcon-Correa, Mariana, Hahn, Kersten, Richter, Gunther, Wittstock, Gunther, Fischer, Peer

مصطلحات موضوعية: Physics - Applied Physics

الوصول الحر: http://arxiv.org/abs/2111.05608Test

المؤلفون: Kwon, Hyunah, Barad, Hannah-Noa, Silva Olaya, Alex Ricardo, Alarcón-Correa, Mariana, Hahn, Kersten, Richter, Gunther, Wittstock, Gunther, Fischer, Peer

المصدر: ACS Applied Materials & Interfaces ; volume 15, issue 4, page 5620-5627 ; ISSN 1944-8244 1944-8252

الإتاحة: https://doi.org/10.1021/acsami.2c19584Test

المؤلفون: Kwon, Hyunah, Barad, Hannah-Noa, Silva Olaya, Alex Ricardo, Alarcón-Correa, Mariana, Hahn, Kersten, Richter, Gunther, Wittstock, Gunther, Fischer, Peer

المصدر: ACS Catalysis; 9/1/2023, Vol. 13 Issue 17, p11656-11665, 10p

المؤلفون: Wang, Xu, Srdihar, Varum, Guo, Surong, Talebi, Nahid, Miguel López, Albert, Hahn, Kersten, van Aken, Peter A., Sánchez Ordóñez, Samuel

المصدر: Articles publicats en revistes (Institut de Bioenginyeria de Catalunya (IBEC))

مصطلحات موضوعية: Nanotecnologia, Espectroscòpia d'electrons, Nanotechnology, Electron spectroscopy

وصف الملف: 17 p.; application/pdf

العلاقة: Versió postprint del document publicat a: http://dx.doi.org/10.1002/adfm.201705862Test; Advanced Functional Materials, 2018, vol. 28, num. 25, p. 1705862; http://dx.doi.org/10.1002/adfm.201705862Test; info:eu-repo/grantAgreement/EC/FP7/311529/EU//LT-NRBS; info:eu-repo/grantAgreement/EC/FP7/222639/EU//ETHERPATHS; http://hdl.handle.net/2445/123486Test

الإتاحة: https://doi.org/10.1002/adfm.201705862Test
http://hdl.handle.net/2445/123486Test

المؤلفون: Sanli, Umut Tunca, Jiao, Chengge, Baluktsian, Margarita, Grévent, Corinne, Hahn, Kersten, Wang, Yi, Srot, Vesna, Richter, Gunther, Bykova, Iuliia, Weigand, Markus, Schütz, Gisela, Keskinbora, Kahraman

المصدر: Advanced Science ; volume 5, issue 9 ; ISSN 2198-3844 2198-3844

الإتاحة: https://doi.org/10.1002/advs.201870052Test

المؤلفون: Wang, Yi, Suyolcu, Y Eren, Salzberger, Ute, Hahn, Kersten, Srot, Vesna, Sigle, Wilfried, van Aken, Peter A

المصدر: Microscopy ; volume 67, issue suppl_1, page i114-i122 ; ISSN 2050-5698 2050-5701

مصطلحات موضوعية: Radiology, Nuclear Medicine and imaging, Instrumentation, Structural Biology

الإتاحة: https://doi.org/10.1093/jmicro/dfy002Test
http://academic.oup.com/jmicro/article-pdf/67/suppl_1/i114/26055210/dfy002.pdfTest

المؤلفون: Wang, Yi, Huang, Michael R. S., Salzberger, Ute, Hahn, Kersten, Sigle, Wilfried, van Aken, Peter A.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 448-449 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927618002738Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618002738Test

المؤلفون: Wang, Yi, Suyolcu, Y. Eren, Salzberger, Ute, Hahn, Kersten, Srot, Vesna, Sigle, Wilfried, van Aken, Peter A.

المصدر: Microscopy and Microanalysis ; volume 24, issue S1, page 132-133 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927618001150Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618001150Test

المؤلفون: Sanli, Umut Tunca, Ceylan, Hakan, Jiao, Chengge, Baluktsian, Margarita, Grevent, Corinne, Hahn, Kersten, Wang, Yi, Srot, Vesna, Richter, Gunther, Bykova, Iuliia, Weigand, Markus, Sitti, Metin, Schütz, Gisela, Keskinbora, Kahraman

المصدر: Microscopy and Microanalysis ; volume 24, issue S2, page 288-289 ; ISSN 1431-9276 1435-8115

مصطلحات موضوعية: Instrumentation

الإتاحة: https://doi.org/10.1017/s1431927618013788Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927618013788Test

المؤلفون: Wang, Yi, Huang, Michael R. S., Salzberger, Ute, Hahn, Kersten, Sigle, Wilfried, van Aken, Peter A.

المصدر: Ultramicroscopy ; volume 184, page 98-105 ; ISSN 0304-3991

مصطلحات موضوعية: Instrumentation, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/j.ultramic.2017.10.014Test
https://api.elsevier.com/content/article/PII:S0304399117301444?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0304399117301444?httpAccept=text/plainTest