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1دورية أكاديمية
المؤلفون: Chan, H.W., Prodanović, V., Theulings, A.M.M.G., Tao, S., Smedley, J., Hagen, C.W., Sarro, P.M., Graaf, H.v.d.
المصدر: Journal of Instrumentation ; volume 18, issue 06, page P06028 ; ISSN 1748-0221
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2دورية أكاديمية
المؤلفون: Hari, S. (author), van Dorp, Willem F. (author), Mulders, Johannes J.L. (author), Trompenaars, Piet H.F. (author), Kruit, P. (author), Hagen, C.W. (author)
مصطلحات موضوعية: electron lithography, FEBID, FEBIE, FEBIP, side wall angle
العلاقة: http://www.scopus.com/inward/record.url?scp=85191660320&partnerID=8YFLogxKTest; Beilstein Journal of Nanotechnology (online)--2190-4286--54fc8720-5f3c-43e3-aecf-cc710ba91964; http://resolver.tudelft.nl/uuid:0210d4a2-7edb-4ab8-9d0d-397e31f8a123Test; https://doi.org/10.3762/bjnano.15.40Test
الإتاحة: https://doi.org/10.3762/bjnano.15.40Test
http://resolver.tudelft.nl/uuid:0210d4a2-7edb-4ab8-9d0d-397e31f8a123Test -
3دورية أكاديمية
المؤلفون: Hesam Mahmoudi Nezhad, N. (author), Ghaffarian Niasar, M. (author), Hagen, C.W. (author), Kruit, P. (author)
العلاقة: http://www.scopus.com/inward/record.url?scp=85186254096&partnerID=8YFLogxKTest; Scientific Reports--2045-2322--b41041f7-88a3-432e-98a2-0bb69c328595; http://resolver.tudelft.nl/uuid:4c7eaea2-61fc-479f-9532-f68d3c1e2470Test; https://doi.org/10.1038/s41598-024-55518-3Test
الإتاحة: https://doi.org/10.1038/s41598-024-55518-3Test
http://resolver.tudelft.nl/uuid:4c7eaea2-61fc-479f-9532-f68d3c1e2470Test -
4دورية أكاديمية
المؤلفون: Theulings, A.M.M.G., Tao, S.X., Hagen, C.W., van der Graaf, H.
المصدر: Theulings , A M M G , Tao , S X , Hagen , C W & van der Graaf , H 2022 , ' Monte Carlo simulation of the secondary electron yield of silicon rich silicon nitride ' , Journal of Instrumentation , vol. 17 , no. 3 , P03008 . https://doi.org/10.1088/1748-0221/17/03/P03008Test
مصطلحات موضوعية: Charge transport and multiplication in solid media, Detector modelling and simulations II (electric fields, charge transport, multiplication and induction, pulse formation, electron emission, etc), Electron multipliers (vacuum), Vacuum-based detectors
وصف الملف: application/pdf
الإتاحة: https://doi.org/10.1088/1748-0221/17/03/P03008Test
https://research.tue.nl/en/publications/3f763232-2e9b-44e7-943b-d0177f67f947Test
https://pure.tue.nl/ws/files/203983877/Theulings_2022_J._Inst._17_P03008.pdfTest
http://www.scopus.com/inward/record.url?scp=85126473902&partnerID=8YFLogxKTest -
5دورية أكاديمية
المؤلفون: Angeloni, L., Ganjian, M., Nouri-Goushki, M., Mirzaali, M.J., Hagen, C.W., Zadpoor, A.A., Fratila-Apachitei, L.E., Ghatkesar, M.K.
المساهمون: Horizon 2020
المصدر: Additive Manufacturing ; volume 39, page 101858 ; ISSN 2214-8604
مصطلحات موضوعية: Industrial and Manufacturing Engineering, Engineering (miscellaneous), General Materials Science, Biomedical Engineering
الإتاحة: https://doi.org/10.1016/j.addma.2021.101858Test
https://api.elsevier.com/content/article/PII:S2214860421000233?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S2214860421000233?httpAccept=text/plainTest -
6مؤتمر
المؤلفون: Hesam Mahmoudi Nezhad, N. (author), Ghaffarian Niasar, M. (author), Hagen, C.W. (author), Kruit, P. (author)
المساهمون: Hachimi, Hanaa (editor), Abdo, Ahmed Abu (editor), Benmamoun, Zoubida (editor)
مصطلحات موضوعية: Electron Electrostatic Lens Design, Global Optimization, Local Optimization, Meta-heuristic based Optimization Algorithms, Genetic Algorithms, Particle Swarm Optimization, Simulated Annealing, SOEM (Second Order Electrode Method)
العلاقة: http://www.scopus.com/inward/record.url?scp=85179132538&partnerID=8YFLogxKTest; 2023 9th International Conference on Optimization and Applications, ICOA 2023 - Proceedings--979-8-3503-1255-3; 2023 9th International Conference on Optimization and Applications (ICOA)--1630c18f-c130-4ee1-99f4-0dee126e87b4; http://resolver.tudelft.nl/uuid:07f14faa-7933-4841-bb9a-443be74c9df3Test; https://doi.org/10.1109/ICOA58279.2023.10308847Test
الإتاحة: https://doi.org/10.1109/ICOA58279.2023.10308847Test
http://resolver.tudelft.nl/uuid:07f14faa-7933-4841-bb9a-443be74c9df3Test -
7مؤتمر
المؤلفون: Hesam Mahmoudi Nezhad, N. (author), Ghaffarian Niasar, M. (author), Hagen, C.W. (author), Kruit, P. (author)
مصطلحات موضوعية: Genetic Algorithms, Tuning Parameters, Electrostatic Lens, Lens Design Optimization
العلاقة: http://www.scopus.com/inward/record.url?scp=85169045164&partnerID=8YFLogxKTest; Proceedings of the 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)--979-8-3503-4741-8; 2023 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)--f4171a24-a38c-489b-8606-5e776fa53855; http://resolver.tudelft.nl/uuid:b505941f-f8c8-474a-b1d1-32af13fe4906Test; https://doi.org/10.1109/NEMO56117.2023.10202293Test
الإتاحة: https://doi.org/10.1109/NEMO56117.2023.10202293Test
http://resolver.tudelft.nl/uuid:b505941f-f8c8-474a-b1d1-32af13fe4906Test -
8دورية أكاديمية
المؤلفون: van Kessel, L., Hagen, C.W.
المصدر: SoftwareX ; volume 12, page 100605 ; ISSN 2352-7110
مصطلحات موضوعية: Computer Science Applications, Software
الإتاحة: https://doi.org/10.1016/j.softx.2020.100605Test
https://api.elsevier.com/content/article/PII:S2352711020303186?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S2352711020303186?httpAccept=text/plainTest -
9دورية أكاديمية
المؤلفون: Vos, Y., Hagen, C.W., Hoogenboom, J.P.
المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 494-495 ; ISSN 1431-9276 1435-8115
مصطلحات موضوعية: Instrumentation
الإتاحة: https://doi.org/10.1017/s1431927619003209Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619003209Test -
10دورية أكاديمية
المؤلفون: Chan, H.W. (author), Prodanovic, V. (author), Theulings, A.M.M.G. (author), ten Bruggencate, T. (author), Hagen, C.W. (author), Sarro, Pasqualina M (author), van der Graaf, H. (author)
مصطلحات موضوعية: Avalanche-induced secondary effects, Electron multipliers (vacuum), Secondary electron emitters and dynodes and their production
العلاقة: http://www.scopus.com/inward/record.url?scp=85139387888&partnerID=8YFLogxKTest; Journal of Instrumentation--1748-0221--b3a66938-79cd-4264-a275-6f2d3f51dc27; http://resolver.tudelft.nl/uuid:7906185b-e4c8-4d38-8ef0-3f93ea1ca514Test; https://doi.org/10.1088/1748-0221/17/09/P09027Test
الإتاحة: https://doi.org/10.1088/1748-0221/17/09/P09027Test
http://resolver.tudelft.nl/uuid:7906185b-e4c8-4d38-8ef0-3f93ea1ca514Test