المؤلفون: Chan, H. W., Prodanović, V., Theulings, A. M. M. G., Tao, S., Smedley, J., Hagen, C. W., Sarro, P. M., Graaf, H. v. d.

مصطلحات موضوعية: Physics - Instrumentation and Detectors

الوصول الحر: http://arxiv.org/abs/2304.09615Test

المؤلفون: Theulings, A. M. M. G., Tao, S. X., Hagen, C. W., Van der Graaf, H.

مصطلحات موضوعية: High Energy Physics - Experiment

الوصول الحر: http://arxiv.org/abs/2110.12965Test

المؤلفون: van der Reep, T. H. A., Looman, B., Chan, H. W., Hagen, C. W., van der Graaf, H.

المصدر: J. Instrum. 15, P10022 (2020)

مصطلحات موضوعية: Physics - Instrumentation and Detectors, High Energy Physics - Experiment

الوصول الحر: http://arxiv.org/abs/2010.12462Test

المؤلفون: Chan, H. W., Prodanović, V., Theulings, A. M. M. G., Bruggencate, T. ten, Hagen, C. W., Sarro, P. M., van der Graaf, H.

مصطلحات موضوعية: Physics - Instrumentation and Detectors, High Energy Physics - Experiment

الوصول الحر: http://arxiv.org/abs/2008.09054Test

المؤلفون: Chan, H. W., Prodanović, V., Theulings, A. M. M. G., Hagen, C. W., Sarro, P. M., Graaf, H. v. d

مصطلحات موضوعية: Physics - Instrumentation and Detectors, High Energy Physics - Experiment

الوصول الحر: http://arxiv.org/abs/2008.08997Test

المؤلفون: Hari, Sangeetha, Slotman, Johan A., Vos, Yoram, Floris, Christian, van Cappellen, Wiggert A., Hagen, C. W., Stallinga, Sjoerd, Houtsmuller, Adriaan B., Hoogenboom, Jacob P.

المصدر: Hari , S , Slotman , J A , Vos , Y , Floris , C , van Cappellen , W A , Hagen , C W , Stallinga , S , Houtsmuller , A B & Hoogenboom , J P 2022 , ' Electron-beam patterned calibration structures for structured illumination microscopy ' , Scientific Reports , vol. 12 , no. 1 , 20185 . https://doi.org/10.1038/s41598-022-24502-0Test

وصف الملف: application/pdf

العلاقة: https://pure.eur.nl/en/publications/f786f016-51c6-4919-85cf-a55ad301aa2bTest

الإتاحة: https://doi.org/10.1038/s41598-022-24502-0Test
https://pure.eur.nl/en/publications/f786f016-51c6-4919-85cf-a55ad301aa2bTest
https://pure.eur.nl/ws/files/73194696/Electron_beam_patterned_calibration_structures_for_structured_illumination_microscopy.pdfTest
http://www.scopus.com/inward/record.url?scp=85142456378&partnerID=8YFLogxKTest

المؤلفون: Durrani, Zahid A. K., Jones, Mervyn E., Wang, Chen, Scotuzzi, M., Hagen, C. W.

وصف الملف: application/pdf

العلاقة: https://eprints.lancs.ac.uk/id/eprint/89204/1/Electron_transport_RT_SE_effects_PtC_final_Durrani_et_al.pdfTest; Durrani, Zahid A. K. and Jones, Mervyn E. and Wang, Chen and Scotuzzi, M. and Hagen, C. W. (2017) Electron transport and room temperature single-electron charging in 10 nm scale PtC nanostructures formed by electron beam induced deposition. Nanotechnology, 28 (47): 474002. ISSN 0957-4484

الإتاحة: https://eprints.lancs.ac.uk/id/eprint/89204Test/
https://eprints.lancs.ac.uk/id/eprint/89204/1/Electron_transport_RT_SE_effects_PtC_final_Durrani_et_al.pdfTest

المؤلفون: Chan, H. W., Prodanović, V., Theulings, A. M. M. G., Bruggencate, T. ten, Hagen, C. W., Sarro, P. M., van der Graaf, H.

المصدر: Journal of Instrumentation, 17(9)

مصطلحات موضوعية: High Energy Physics - Experiment (hep-ex), Physics - Instrumentation and Detectors, FOS: Physical sciences, Instrumentation and Detectors (physics.ins-det), Avalanche-induced secondary effects, Instrumentation, Secondary electron emitters and dynodes and their production, Mathematical Physics, Electron multipliers (vacuum), High Energy Physics - Experiment

وصف الملف: application/pdf

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a8441bd075d6c5a5ebcac1d59824c29aTest
https://doi.org/10.1088/1748-0221/17/09/p09027Test

المؤلفون: Loffler, J., Thomet, J., Belhaj, M., Kessel, L. van, Hagen, C. W., Ballif, C., Wyrsch, Nicolas

المصدر: http://infoscience.epfl.ch/record/283183Test.

العلاقة: http://infoscience.epfl.ch/record/283183Test; https://infoscience.epfl.ch/record/283183/files/Loeffler_IEEE_NSS_2019.pdfTest; https://infoscience.epfl.ch/record/283183/files/Janina_IEEE_final.pdfTest

الإتاحة: https://doi.org/10.1109/NSS/MIC42101.2019.9059971Test
http://infoscience.epfl.ch/record/283183Test
https://infoscience.epfl.ch/record/283183/files/Loeffler_IEEE_NSS_2019.pdfTest
https://infoscience.epfl.ch/record/283183/files/Janina_IEEE_final.pdfTest

المؤلفون: Loffler, J., Thomet, J., Belhaj, M., Kessel, L. van, Hagen, C. W., Ballif, C., Wyrsch, N.

المصدر: 2019 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

الإتاحة: https://doi.org/10.1109/nss/mic42101.2019.9059971Test
http://xplorestaging.ieee.org/ielx7/9039702/9059608/09059971.pdf?arnumber=9059971Test