المؤلفون: Gursoy, Cemil Cem, Kraak, Daniel, Ahmed, Foisal, Taouil, Mottaqiallah, Jenihhin, Maksim, Hamdioui, Said

مصطلحات موضوعية: Computer Science - Hardware Architecture

الوصول الحر: http://arxiv.org/abs/2212.09356Test

المؤلفون: Oyeniran, Adeboye Stephen, Ubar, Raimund, Jenihhin, Maksim, Gursoy, Cemil Cem, Raik, Jaan

المصدر: 2019 IEEE Latin American Test Symposium (LATS), Santiago, Chile, 2019, pp. 1-6

مصطلحات موضوعية: Computer Science - Hardware Architecture

الوصول الحر: http://arxiv.org/abs/1907.12325Test

المؤلفون: Gursoy, Cemil Cem, Yildiz, Abdullah, Goren, Sezer

العلاقة: https://aperta.ulakbim.gov.tr/record/111812Test; oai:zenodo.org:111812

الإتاحة: https://aperta.ulakbim.gov.tr/record/111812Test

المؤلفون: Balakrishnan, Aneesh, Medeiros, Guilherme Cardoso, Gursoy, Cemil Cem, Hamdioui, Said, Jenihhin, Maksim, Alexandrescu, Dan

المصدر: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

الإتاحة: https://doi.org/10.1109/dft52944.2021.9568295Test
http://xplorestaging.ieee.org/ielx7/9568273/9568279/09568295.pdf?arnumber=9568295Test

المؤلفون: Goren, Sezer, Gursoy, Cemil Cem, Yildiz, Abdullah

المصدر: JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS 31(5-6) 525-536

العلاقة: https://aperta.ulakbim.gov.tr/record/76399Test; oai:zenodo.org:76399

الإتاحة: https://aperta.ulakbim.gov.tr/record/76399Test

المؤلفون: Oyeniran, Adeboye Stephen, Ubar, Raimund, Jenihhin, Maksim, Gursoy, Cemil Cem, Raik, Jaan

المصدر: 2019 IEEE European Test Symposium (ETS)

الإتاحة: https://doi.org/10.1109/ets.2019.8791526Test
http://xplorestaging.ieee.org/ielx7/8784130/8791505/08791526.pdf?arnumber=8791526Test

المؤلفون: Gursoy, Cemil Cem, Medeiros, Guilherme, Junchao Chen, George, Nevin, Condia, Josie Esteban Rodriguez, Lange, Thomas, Damljanovic, Aleksa, Ferreira, Raphael Segabinazzi, Balakrishnan, Aneesh, Xinhui Anna Lai, Shayesteh Masoumian, Petryk, Dmytro, Troya Cagil Koylu, Silva, Felipe Augusto Da, Bagbaba, Ahmet Cagri, Hamdioui, Said, Motaguillah Taouil, Milos Krstic, Langendoerfer, Peter, Dyka, Zoya, Huebner, Michael, Joerg Nolte, Vierhaus, Heinrich Thoodor, Reorda, Matteo Sonza, Squillero, Giovanni, Sterpone, Luca, Raik, Jaan, Alexandrescu, Dan, Glorieux, Maximilien, Georgis Selimis, Gert-Jan Schrijen, Klotz, Anton, Sauer, Christian, Jenihhin, Maksim

المصدر: University Booth-Design, Automation & Test in Europe Conference & Exhibition (Univerity Booth DATE 2019)

مصطلحات موضوعية: reliability, security, verification, test, fault tolerance, EDA tools, nanoelectronic systems design, H2020 MSCA ITN

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5b28da4ef57e81aef30627d13c807fa3Test