المؤلفون: Singh, C. R., Honold, T., Gujar, T. P., Retsch, M., Fery, A., Karg, M., Thelakkat, M.

المساهمون: Bayerisches Staatsministerium fur Bildung und Kultus, Wissenschaft und Kunst, Deutsche Forschungsgemeinschaft

المصدر: Physical Chemistry Chemical Physics ; volume 18, issue 33, page 23155-23163 ; ISSN 1463-9076 1463-9084

الإتاحة: https://doi.org/10.1039/c6cp04451dTest
http://pubs.rsc.org/en/content/articlepdf/2016/CP/C6CP04451DTest

المؤلفون: Seo, J., Gujar, T., Barber, J., Zhang, H., Zhang, C., Kirzhner, T., Koren, G., Wei, J.Y.T., Cerne, J.

المصدر: 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)

الإتاحة: https://doi.org/10.1109/irmmw-thz46771.2020.9370641Test
http://xplorestaging.ieee.org/ielx7/9370343/9370359/09370641.pdf?arnumber=9370641Test

المؤلفون: Shinde, V. R., Shim, H.‐S., Gujar, T. P., Kim, H. J., Kim, W. B.

المصدر: Advanced Materials ; volume 20, issue 5, page 1008-1012 ; ISSN 0935-9648 1521-4095

الإتاحة: https://doi.org/10.1002/adma.200701828Test

المؤلفون: Patil, R. S., Pathan, H. M., Gujar, T. P., Lokhande, C. D.

المصدر: Journal of Materials Science ; volume 41, issue 17, page 5723-5725 ; ISSN 0022-2461 1573-4803

مصطلحات موضوعية: Mechanical Engineering, Mechanics of Materials, General Materials Science

الإتاحة: https://doi.org/10.1007/s10853-006-0098-4Test

المؤلفون: Gujar, T. P., Shinde, V. R., Jong-Won Park, Hyun Kyung Lee, Kwang-Deog Jung, Oh-Shim Joo

المصدر: Journal of The Electrochemical Society; 2009, Vol. 156 Issue 1, pE8-E12, 5p, 3 Charts, 3 Graphs

مصطلحات موضوعية: THIN films, SOLID state electronics, SELENIDES, SELENIDE minerals, MORPHOLOGY, ELECTROCHEMICAL analysis, ABSORPTION, SPECTRUM analysis

المؤلفون: Gujar, T. P., Shinde, V. R., Jong-Won Park, Hyun Kyung Lee, Kwang-Deog Jung, Oh-Shim Joo

المصدر: Journal of The Electrochemical Society; 2008, Vol. 155 Issue 10, pE131-E135, 5p, 3 Black and White Photographs, 6 Graphs

مصطلحات موضوعية: ELECTROCHEMICAL analysis, METALLIC films, SUBSTRATES (Materials science), COPPER alloys, INDIUM alloys, SELENIUM ores, SCANNING electron microscopy, X-ray diffraction, ARGON

المؤلفون: Gujar, T. P., Woo-Young Kim, Kwang-Deog Jung, Oh-Shim Joo

المصدر: Journal of The Electrochemical Society; 2008, Vol. 155 Issue 6, pE57-E62, 6p, 6 Black and White Photographs, 7 Graphs

مصطلحات موضوعية: ELECTROFORMING, INDIUM, X-ray diffraction, PHOTOELECTRONS, ELECTRON spectroscopy, ELECTROCHEMISTRY

المؤلفون: Shinde, V. R., Shim, H.-S., Gujar, T. P., Kim, H. J., Kim, W. B.

المصدر: Advanced Materials; Mar2008, Vol. 20 Issue 5, p1008-1012, 5p

المؤلفون: Gujar, T. P., Shinde, V. R., Park, Jong-Won, Lee, Hyun Kyung, Jung, Kwang-Deog, Joo, Oh-Shim

المصدر: Journal of the Electrochemical Society; January 2009, Vol. 156 Issue: 1

المؤلفون: Gujar, T. P., Shinde, V. R., Lokhande, C. D., Mane, R. S., Han, Sung-Hwan

المصدر: Electrochemical and Solid State Letters; January 2007, Vol. 10 Issue: 1