المؤلفون: Ghenam, Sinda, El Hami, Abdelkhalak, Gafsi, Wajih, Akrout, Ali, Haddar, Mohamed

المصدر: Microelectronics Reliability ; volume 146, page 115019 ; ISSN 0026-2714

مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/j.microrel.2023.115019Test
https://api.elsevier.com/content/article/PII:S0026271423001191?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0026271423001191?httpAccept=text/plainTest

المؤلفون: Ghenam, Sinda, Hami, Abdelkhalak El, Gafsi, Wajih, Akrout, Ali, Haddar, Mohamed

المصدر: Welding in the World; May2024, Vol. 68 Issue 5, p1333-1351, 19p

المؤلفون: Kaouthar Zerouati, Ayyad Ghenam, Aziza El Ouali, Maria Rkain, Noufissa Benajiba

المصدر: OALib. 10:1-4

مصطلحات موضوعية: General Medicine

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::fa60a2f44ba0cdb6b8e7951146b9f161Test
https://doi.org/10.4236/oalib.1110018Test

المؤلفون: Sinda, Ghenam, El Hami, Abdelkhalak, Wajih, Gafsi, Ali, Akrout, Mohamed, Haddar

المصدر: Incertitudes et fiabilité des systèmes multiphysiques ; volume 5, issue 2 ; ISSN 2514-569X

الإتاحة: https://doi.org/10.21494/iste.op.2022.0787Test

المؤلفون: Ghenam, Sinda, Elhami, Abdelkhalak, Akrout, Ali, Gafsi, Wajih, Haddar, Mohamed

المصدر: Applied Condition Monitoring ; Advances in Acoustics and Vibration IV ; page 32-42 ; ISSN 2363-698X 2363-6998 ; ISBN 9783031341892 9783031341908

الإتاحة: https://doi.org/10.1007/978-3-031-34190-8_5Test

المؤلفون: Zerouati, Kaouthar, Ghenam, Ayyad, Ouali, Aziza El, Rkain, Maria, Benajiba, Noufissa

المصدر: OALib ; volume 10, issue 05, page 1-4 ; ISSN 2333-9721 2333-9705

مصطلحات موضوعية: General Medicine

الإتاحة: https://doi.org/10.4236/oalib.1110018Test

المؤلفون: Ghenam, Sinda, El Hami, Abdelkhalak, Dammak, Khalil, Gafsi, Wajih, Akrout, Ali, Haddar, Mohamed

المصدر: Mechanics of Advanced Materials and Structures ; page 1-17 ; ISSN 1537-6494 1537-6532

الإتاحة: https://doi.org/10.1080/15376494.2023.2237694Test

المؤلفون: Ghenam, Sinda

المساهمون: Normandie, École nationale d'ingénieurs de Sfax (Tunisie), El Hami, Abdelkhalak, Akrout, Ali

مصطلحات موضوعية: Composant BGA, Joints de soudures, Optimisation fiabiliste, Optimisation déterministe, BGA component, Solder joints, Multi-physics study, Reliability and lifespan, Fatigue analysis, Deterministic optimization, Reliability-based optimization

العلاقة: http://www.theses.fr/2023NORMIR19/documentTest

الإتاحة: http://www.theses.fr/2023NORMIR19/documentTest

المؤلفون: Ghenam, Sinda

المساهمون: Laboratoire de Mécanique de Normandie (LMN), Institut national des sciences appliquées Rouen Normandie (INSA Rouen Normandie), Institut National des Sciences Appliquées (INSA)-Normandie Université (NU)-Institut National des Sciences Appliquées (INSA)-Normandie Université (NU), Normandie Université, École nationale d'ingénieurs de Sfax (Tunisie), Abdelkhalak El Hami, Ali Akrout

المصدر: https://theses.hal.science/tel-04516042Test ; Génie mécanique [physics.class-ph]. Normandie Université; École nationale d'ingénieurs de Sfax (Tunisie), 2023. Français. ⟨NNT : 2023NORMIR19⟩.

مصطلحات موضوعية: BGA component, Solder joints, Multi-physics study, Reliability and lifespan, Fatigue analysis, Deterministic optimization, Reliability-based optimization, Composant BGA, Joints de soudures, Optimisation fiabiliste, Optimisation déterministe, [PHYS.MECA.GEME]Physics [physics]/Mechanics [physics]/Mechanical engineering [physics.class-ph], [SPI.MECA.MEMA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph], [SPI.MECA.MEFL]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Fluids mechanics [physics.class-ph], [SPI.ACOU]Engineering Sciences [physics]/Acoustics [physics.class-ph]

العلاقة: NNT: 2023NORMIR19; tel-04516042; https://theses.hal.science/tel-04516042Test; https://theses.hal.science/tel-04516042/documentTest; https://theses.hal.science/tel-04516042/fileTest/GHENAM-Sinda.pdf

الإتاحة: https://theses.hal.science/tel-04516042Test
https://theses.hal.science/tel-04516042/documentTest
https://theses.hal.science/tel-04516042/fileTest/GHENAM-Sinda.pdf

المؤلفون: Sinda Ghenam, Abdelkhalak El Hami, Wajih Gafsi, Ali Akrout, Mohamed Haddar

المصدر: Microelectronics Reliability. 146:115019

مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::407529cd4ca37782fb39f5c4c1b3bfaaTest
https://doi.org/10.1016/j.microrel.2023.115019Test