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1دورية أكاديمية
المؤلفون: Krapf, Anna, Merle, Benoit, Gebhart, David D., Reiter, Marco, Lassnig, Alice, Göken, Mathias, Cordill, Megan J., Gammer, Christoph
المساهمون: Deutsche Forschungsgemeinschaft, Austrian Science Fund
المصدر: Advanced Engineering Materials ; ISSN 1438-1656 1527-2648
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2دورية أكاديمية
مصطلحات موضوعية: electrical properties and parameters, electronic devices, metallization process, cracks, electrical resistivity, electrical conductor, scanning electron microscopy, fatigue testing, thin films, electron backscatter diffraction, ddc:620, ddc:660, swd:Elektrische Eigenschaft, swd:Elektronisches Gerät, swd:Metallisieren, swd:Riss, swd:Elektrischer Leiter, swd:Rasterelektronenmikroskopie, swd:Materialermüdung, swd:Dünne Schicht, swd:Elektronenrückstreubeugung
العلاقة: I 4384-N, ME-4368/8; http://doi.org/doi:10.17170/kobra-202308018551Test
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3دورية أكاديمية
المؤلفون: Gebhart, David D., Krapf, Anna, Schretter, Lukas, Lassnig, Alice, Merle, Benoit, Cordill, Megan J., Gammer, Christoph
المساهمون: Austrian Science Fund, Deutsche Forschungsgemeinschaft
المصدر: Advanced Engineering Materials ; ISSN 1438-1656 1527-2648
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4دورية أكاديمية
مصطلحات موضوعية: nanocrystalline metal, thin films, fatigue, electrical resistivity, through-thickness cracks, ddc:620, ddc:660, swd:Nanostrukturiertes Material, swd:Dünne Schicht, swd:Materialermüdung, swd:Widerstand
, swd:Riss العلاقة: I 4384-N, ME-4368/8; http://doi.org/doi:10.17170/kobra-202308018550Test
الإتاحة: https://doi.org/10.17170/kobra-202308018550Test
https://doi.org/10.1016/j.scriptamat.2022.114550Test -
5دورية أكاديمية
المساهمون: Deutsche Forschungsgemeinschaft, Austrian Science Fund
المصدر: Materials Science and Engineering: A ; volume 887, page 145759 ; ISSN 0921-5093
مصطلحات موضوعية: Mechanical Engineering, Mechanics of Materials, Condensed Matter Physics, General Materials Science
الإتاحة: https://doi.org/10.1016/j.msea.2023.145759Test
https://api.elsevier.com/content/article/PII:S0921509323011838?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0921509323011838?httpAccept=text/plainTest