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1دورية أكاديمية
المؤلفون: Xiao, Z. R., Zhu, H. L., Wang, Q., Chen, Z., Liu, Z. Y., Zhang, Y. K., Yan, Z. J., Shi, Y. F., Zhou, N., Li, J. J., Gao, J. F., Ai, X. Z., Lu, S. S., Huang, W. X., Xiong, W. J., Kong, Z. Z., Xiang, J. J., Zhang, Y., Zhao, J., Liu, J. B., Lu, Y. H., Bai, G. B., He, X. B., Du, A. Y., Yang, H., Yang, T., Wu, Z. H., Li, J. F., Luo, J., Wang, W. W., Ye, T. C.
المساهمون: Vertical Gate-All-Around for Dynamic Random Access Memory (DRAM) and Process Development under Beijing Superstring Academy Memory Technology
المصدر: IEEE Transactions on Electron Devices ; volume 70, issue 3, page 1380-1385 ; ISSN 0018-9383 1557-9646
الإتاحة: https://doi.org/10.1109/ted.2023.3239048Test
http://xplorestaging.ieee.org/ielx7/16/10053598/10035482.pdf?arnumber=10035482Test -
2مؤتمر
المؤلفون: Mao, S. J., Liu, J. B., Wang, Y., Liu, W. B., Hu, Y. P., Cui, H. W., Zhang, R., Liu, H. C., Wang, Z. X., Zhou, N., Zhang, Y. K., Yang, H., Wu, Z. H., Li, Y. L., Gao, J. F., Du, A. Y., Li, J. F., Luo, J., Wang, W. W., Yin, H. X.
المساهمون: Youth Innovation Promotion Association, National Natural Science Foundation of China
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS)
الإتاحة: https://doi.org/10.1109/irps48227.2022.9764471Test
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764471.pdf?arnumber=9764471Test -
3دورية أكاديمية
المؤلفون: Zhao, G. J., Hörmann, G., Fohrer, N., Gao, J. F.
المصدر: eISSN: 1680-7359
وصف الملف: application/pdf
الإتاحة: https://doi.org/10.5194/adgeo-21-131-2009Test
https://adgeo.copernicus.org/articles/21/131/2009Test/ -
4
المؤلفون: Yin, X., Yang, H., Xie, L., Ai, X. Z., Zhang, Y. B., Jia, K. P., Wu, Z. H., Ma, X. L., Zhang, Q. Z., Mao, S. J., Xiang, J. J., Zhang, Y., Gao, J. F., He, X. B., Bai, G. B., Lu, Y. H., Zhou, N., Kong, Z. Z., Zhao, J., Ma, S. S., Xuan, Z. H., Zhu, H., Li, Y. Y., Li, L., Zhang, Q. H., Han, J. H., Chen, R. L., Qu, Y., Yang, T., Luo, J., Li, J. F., Yin, H. X., Wang, G. L., Radamson, Henry H., Zhao, C., Wang, W. W., Ye, T. C., Li, J. J., Du, A. Y., Li, C., Zhao, L. H., Huang, W. X.
المصدر: IEEE Electron Device Letters. 41(1):8-11
مصطلحات موضوعية: atomic layer etching (ALE), gate-all-around (GAA), Si cap, SiGe channel, Vertical nanowire, Etching, Gates (transistor), Nanowires, Atomic layer etching, Device characteristics, Effective gate length, Field effect transistor (FETs), Gate-all-around, HIGH-K metal gates, SiGe channels, Vertical nanowires, Si-Ge alloys
وصف الملف: print
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5دورية أكاديمية
المؤلفون: Ding, T. P., Gao, J. F., Tian, S. H., Fan, C. F., Zhao, Y., Wan, D. F., Zhou, J. X.
المصدر: Scientific Reports ; volume 7, issue 1 ; ISSN 2045-2322
مصطلحات موضوعية: Multidisciplinary
الإتاحة: https://doi.org/10.1038/srep44000Test
https://www.nature.com/articles/srep44000.pdfTest
https://www.nature.com/articles/srep44000Test -
6دورية أكاديمية
المؤلفون: Xiao, Z. R., Wang, Q., Zhu, H. L., Chen, Z., Zhang, Y. K., Li, J. J., Zhou, N., Gao, J. F., Ai, X. Z., Lu, S. S., Huang, W. X., Xiong, W. J., Kong, Z. Z., Xiang, J. J., Zhang, Y., Zhao, J., Liu, J. B., Lu, Y. H., Bai, G. B., He, X. B., Du, A. Y., Wu, Z. H., Yang, T., Li, J. F., Luo, J., Wang, W. W., Ye, T. C.
المساهمون: Vertical Gate-All-Around (GAA) for Dynamic Random Access Memory (DRAM) and Process Development under Beijing Superstring Academy Memory Technology
المصدر: IEEE Electron Device Letters ; volume 43, issue 8, page 1183-1186 ; ISSN 0741-3106 1558-0563
الإتاحة: https://doi.org/10.1109/led.2022.3187006Test
http://xplorestaging.ieee.org/ielx7/55/9841091/09810318.pdf?arnumber=9810318Test -
7دورية أكاديمية
المؤلفون: Wang, Chi, Wei, L. B., Cui, G. W., Gao, J. F.
المصدر: International Journal of Coal Preparation & Utilization; 2022, Vol. 42 Issue 8, p2473-2492, 20p
مصطلحات موضوعية: PARTICLE motion, CYCLONES, CONES, DESULFURIZATION, LIGHT curves, DISSOLVED air flotation (Water purification)
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8دورية أكاديمية
المؤلفون: Zhang, Yongkui, Ai, Xuezheng, Yin, Xiaogen, Zhu, Huilong, Yang, H., Wang, G. L., Li, J. J., Du, A. Y., Li, C., Huang, W. X., Xie, L., Li, Y. Y., Liu, Y. B., Zhang, Y. B., Jia, K. P., Wu, Z. H., Ma, X. L., Zhang, Q. Z., Mao, S. J., Xu, G. B., Xiang, J. J., Gao, J. F., He, X. B., Lu, Y. H., Bai, G. B., Zhao, J., Li, Y. L., Yang, T., Li, J. F., Yin, H. X., Radamson, H., Luo, J., Zhao, C., Wang, W. W., Ye, T. C.
المساهمون: Academy of Integrated Circuit of the Chinese Academy of Sciences, National Key Research and Development Program of China, Youth Innovation Promotion Association of CAS
المصدر: IEEE Transactions on Electron Devices ; volume 68, issue 6, page 2604-2610 ; ISSN 0018-9383 1557-9646
الإتاحة: https://doi.org/10.1109/ted.2021.3072879Test
http://xplorestaging.ieee.org/ielx7/16/9439211/09417199.pdf?arnumber=9417199Test -
9دورية أكاديمية
المؤلفون: Wang, Chi, Wei, L. B., Cui, G. W., Gao, J. F.
المساهمون: public, commercial, or not-for-profit sectors
المصدر: International Journal of Coal Preparation and Utilization ; volume 42, issue 8, page 2473-2492 ; ISSN 1939-2699 1939-2702
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10دورية أكاديمية
المؤلفون: Zhao, G. J., Hörmann, G., Fohrer, N., Gao, J. F.
مصطلحات موضوعية: article, Verlagsveröffentlichung
وصف الملف: electronic
العلاقة: Advances in Geosciences -- http://www.bibliothek.uni-regensburg.de/ezeit/?2625759Test -- http://www.adv-geosci.net/volumes.htmlTest -- 1680-7359; https://doi.org/10.5194/adgeo-21-131-2009Test; https://noa.gwlb.de/receive/cop_mods_00029983Test; https://noa.gwlb.de/servlets/MCRFileNodeServlet/cop_derivate_00029937/adgeo-21-131-2009.pdfTest; https://adgeo.copernicus.org/articles/21/131/2009/adgeo-21-131-2009.pdfTest
الإتاحة: https://doi.org/10.5194/adgeo-21-131-2009Test
https://noa.gwlb.de/receive/cop_mods_00029983Test
https://noa.gwlb.de/servlets/MCRFileNodeServlet/cop_derivate_00029937/adgeo-21-131-2009.pdfTest
https://adgeo.copernicus.org/articles/21/131/2009/adgeo-21-131-2009.pdfTest