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1مؤتمر
المؤلفون: Emersic, Z., Ohki, T., Akasaka, M., Arakawa, T., Maeda, S., Okano, M., Sato, Y., George, A., Marcel, S., Ganapathi, I. I., Ali, S. S., Javed, S., Werghi, N., Isik, S. G., Saritas, E., Ekenel, H. K., Hudovernik, V., Kolf, J. N., Boutros, F., Damer, N.
العلاقة: https://aperta.ulakbim.gov.tr/record/268436Test; oai:aperta.ulakbim.gov.tr:268436
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2مؤتمر
المؤلفون: Emeršić, Ž., Ohki, T., Akasaka, M., Arakawa, T., Maeda, S., Okano, M., Sato, Y., George, A., Marcel, S., Ganapathi, I. I., Ali, S. S., Javed, S., Werghi, N., Işık, S. G., Sarıtaş, E., Ekenel, H. K., Sharma, G., Kolf, Jan Niklas, Boutros, Fadi, Damer, Naser, Kamboj, A., Nigam, A., Hudovernik, V., Jain, D. K., Cámara-Chávez, G., Peer, P., Štruc, V.
مصطلحات موضوعية: Branche: Information Technology, Research Line: Computer vision (CV), Research Line: Human computer interaction (HCI), Research Line: Machine learning (ML), LTA: Interactive decision-making support and assistance systems, LTA: Machine intelligence, algorithms, and data structures (incl. semantics), LTA: Generation, capture, processing, and output of images and 3D models, Biometrics, Machine learning, Deep learning, Ear recognition, Fairness, ATHENE
العلاقة: International Joint Conference on Biometrics 2023; #PLACEHOLDER_PARENT_METADATA_VALUE#; IEEE International Joint Conference on Biometrics, IJCB 2023; Next Generation Biometric Systems; https://publica.fraunhofer.de/handle/publica/464243Test
الإتاحة: https://doi.org/10.1109/IJCB57857.2023.10449062Test
https://publica.fraunhofer.de/handle/publica/464243Test -
3مؤتمر
المؤلفون: Emeršić, Ž., Ohki, T., Akasaka, M., Arakawa, T., Maeda, S., Okano, M., Sato, Y., George, A., Marcel, S., Ganapathi, I. I., Ali, S. S., Javed, S., Werghi, N., Işık, S. G., Sarıtaş, E., Ekenel, H. K., Hudovernik, V., Kolf, J. N., Boutros, F., Damer, N., Sharma, G., Kamboj, A., Nigam, A., Jain, D. K., Cámara-Chávez, G., Peer, P., Štruc, V.
المساهمون: Biomet
المصدر: 2023 IEEE International Joint Conference on Biometrics (IJCB)
الإتاحة: https://doi.org/10.1109/ijcb57857.2023.10449062Test
http://xplorestaging.ieee.org/ielx7/10447019/10448524/10449062.pdf?arnumber=10449062Test