المؤلفون: El-Hinnawy, Nabil, Borodulin, Pavel, King, Matthew R., Padilla, Carlos, Ezis, Andris, Paramesh, Jeyanandh, Bain, James A., Young, Robert M.

المصدر: 2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP)

الإتاحة: https://doi.org/10.1109/imws-amp.2017.8247382Test
http://xplorestaging.ieee.org/ielx7/8233002/8247322/08247382.pdf?arnumber=8247382Test

المؤلفون: El-Hinnawy, Nabil, Borodulin, Pavel, King, Matthew R., Furrow, Colin, Padilla, Carlos R., Ezis, Andris, Nichols, Doyle T., Paramesh, Jeyanandh, Bain, James A., Young, Robert M.

المساهمون: Defense Advanced Research Projects Agency Microsystems Technology Office under the Radio Frequency Field-Programmable Gate Array Program

المصدر: IEEE Electron Device Letters ; volume 39, issue 4, page 610-613 ; ISSN 0741-3106 1558-0563

الإتاحة: https://doi.org/10.1109/led.2018.2806383Test
http://xplorestaging.ieee.org/ielx7/55/8322355/08292902.pdf?arnumber=8292902Test

المؤلفون: El-Hinnawy, Nabil, Borodulin, Pavel, King, Matthew R., Padilla, Carlos R., Ezis, Andris, Nichols, Doyle T., Paramesh, Jeyanandh, Bain, James A., Young, Robert M.

المساهمون: Defense Advanced Research Projects Agency (DARPA) Microsystems Technology Office (MTO) through the Radio Frequency Field Programmable Gate Array (RF-FPGA) program

المصدر: IEEE Transactions on Electron Devices ; volume 64, issue 9, page 3934-3942 ; ISSN 0018-9383 1557-9646

الإتاحة: https://doi.org/10.1109/ted.2017.2730231Test
http://xplorestaging.ieee.org/ielx7/16/8011577/08002651.pdf?arnumber=8002651Test

المؤلفون: Howell, Robert S., Lewis, Randall, Henry, H. George, Hearne, Harold, Brown, Deas, Dawson, Dale, Ezis, Andris

المصدر: Microelectronics Reliability ; volume 54, issue 12, page 2682-2687 ; ISSN 0026-2714

مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Safety, Risk, Reliability and Quality, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1016/j.microrel.2014.09.018Test
https://api.elsevier.com/content/article/PII:S0026271414003989?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0026271414003989?httpAccept=text/plainTest

المؤلفون: Howell, Robert S., Buchoff, Steven, Van Campen, Stephen, McNutt, Ty R., Ezis, Andris, Nechay, Bettina, Kirby, Christopher F., Sherwin, Marc E., Clarke, R. Chris, Singh, Ranbir

المصدر: IEEE Transactions on Electron Devices ; volume 55, issue 8, page 1807-1815 ; ISSN 0018-9383

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1109/ted.2008.928204Test
http://xplorestaging.ieee.org/ielx5/16/4578833/04578852.pdf?arnumber=4578852Test

المؤلفون: Howell, Robert S., Buchoff, Steven, Van Campen, Stephen, McNutt, Ty R., Hearne, Harold, Ezis, Andris, Sherwin, Marc E., Clarke, R. Chris, Singh, Ranbir

المصدر: IEEE Transactions on Electron Devices ; volume 55, issue 8, page 1816-1823 ; ISSN 0018-9383

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الإتاحة: https://doi.org/10.1109/ted.2008.926684Test
http://xplorestaging.ieee.org/ielx5/16/4578833/04578851.pdf?arnumber=4578851Test

المؤلفون: Shih, C. James, Ezis, Andris

المساهمون: Ealey, Mark A.

المصدر: SPIE Proceedings ; Silicon Carbide Materials for Optics and Precision Structures ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.225300Test

المؤلفون: Ikossi-Anastasiou, Kiki, Ezis, Andris, Evans, Keith, Stutz, Charles E.

المساهمون: Bowers, John E., Mishra, Umesh K.

المصدر: High-Speed Electronics and Optoelectronics ; SPIE Proceedings ; ISSN 0277-786X

الإتاحة: https://doi.org/10.1117/12.137715Test

المؤلفون: Campen, Stephen Van, Ezis, Andris, Zingaro, John, Storaska, Garrett, Clarke, R. Chris, Temple, Vic, Thompson, Mark, Hansen, Todd

المصدر: MRS Proceedings ; volume 742 ; ISSN 0272-9172 1946-4274

الإتاحة: https://doi.org/10.1557/proc-742-k7.7Test
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1946427400151978Test