المؤلفون: Evangeli, C, Swett, J, Spiece, J, McCann, E, Fried, J, Harzheim, A, Lupini, AR, Briggs, GAD, Gehring, P, Jesse, S, Kolosov, OV, Mol, JA, Dyck, O

مصطلحات موضوعية: Joule heating, Peltier effect, Seebeck coefficient, graphene, high current density, scanning thermal microscopy, scanning transmission electron microscopy

وصف الملف: 11153 - 11164

العلاقة: ACS Nano; https://qmro.qmul.ac.uk/xmlui/handle/123456789/97884Test

الإتاحة: https://doi.org/10.1021/acsnano.3c12930Test
https://qmro.qmul.ac.uk/xmlui/handle/123456789/97884Test

المؤلفون: Spiece, Jean, Sangtarash, S., Mucientes, M., Molina-Mendoza, A.J., Lulla, K., Mueller, T., Kolosov, O., Sadeghi, H., Evangeli, C.

المساهمون: UCL - SST/IMCN/NAPS - Nanoscopic Physics

المصدر: Nanoscale, Vol. 14, no.7, p. 2593-2598 (2022)

مصطلحات موضوعية: Thermal conductivity, Layered material, Low thermal conductivity, Nanoscale applications, Thermoelectric application, Thermoelectric properties, Two-dimensional materials, electric conductance, phonon, thickness, Seebeck coefficient

العلاقة: boreal:282551; http://hdl.handle.net/2078.1/282551Test; urn:ISSN:20403364; urn:EISSN:20403364

الإتاحة: https://doi.org/10.1039/d1nr07889eTest
http://hdl.handle.net/2078.1/282551Test

المؤلفون: Evangeli, C, Tewari, S, Kruip, JM, Bian, X, Swett, JL, Cully, J, Thomas, J, Briggs, GAD, Mol, JA

العلاقة: https://ora.ox.ac.uk/objects/uuid:30bc9dd8-4f22-4c3d-9c60-29edf5e9ee88Test; https://doi.org/10.1073/pnas.2119015119Test

الإتاحة: https://doi.org/10.1073/pnas.2119015119Test
https://ora.ox.ac.uk/objects/uuid:30bc9dd8-4f22-4c3d-9c60-29edf5e9ee88Test

المؤلفون: Ismael A.K., Rincón-García L., Evangeli C., Dallas P., Alotaibi T., Al-Jobory A.A., Rubio-Bollinger G., Porfyrakis K., Agraït, Nicolás, Lambert C.J.

وصف الملف: application/pdf

العلاقة: info:eu:eu-repo/grantAgreement/EC/H2020/767187/EU/Quantum Interference Enhanced Thermoelectricity/QuIET; P. D. acknowledges support from the Hellenic Foundation for Research and Innovation (Grant number: 1468). A. K. I. acknowledges the Leverhulme Trust for Early Career Fellowship ECF-2020-638. A. K. I and A. A are also grateful for financial assistance from Tikrit and Anbar Universities (Iraq), and the Iraqi Ministry of Higher Education (SL-20). T. A. is grateful for financial assistance from Al-Jouf University (Saudi Arabia), and the Saudi Ministry of Education. A. K. I and C. J. L. acknowledge financial support from the UK EPSRC, through Grant no. EP/M014452/1, EP/P027156/1 and EP/N03337X/1. This work was additionally supported by the European Commission is provided by the FET Open project 767187–QuIET. N. A. and G. R.-B. acknowledge the Spanish MINECO (grants MAT2014-57915-R, MAT2017-88693-R, and MDM-2014-0377, and the María de Maeztu Programme for Units of Excellence in R&D MDM-2014-0377 and CEX2018-000805-M) and Comunidad de Madrid (grants NANOFRONTMAG-CM, S2013/MIT-2850, and NANOMAGCOST-CM, P2018/NMT-4321). L. R.-G. acknowledges financial support from the Spanish MECD (Grant no. FPU14/03368). N. A. and L. R.-G. are also grateful for financial support from the Education and Research Council of the Comunidad de Madrid and the European Social Fund (Ref. PEJD-2019-POST/IND-16353).; http://hdl.handle.net/20.500.12614/2859Test

الإتاحة: https://doi.org/20.500.12614/2859Test
https://doi.org/10.1039/d1nh00527hTest
https://hdl.handle.net/20.500.12614/2859Test

المؤلفون: Spiece, Jean, Evangeli, C., Robson, A.J., El Sachat, A., Haenel, L., Alonso, M.I., Garriga, M., Robinson, B.J., Oehme, M., Schulze, J., Alzina, F., Sotomayor Torres, C., Kolosov, O.V.

المساهمون: UCL - SST/IMCN/NAPS - Nanoscopic Physics

المصدر: Nanoscale, Vol. 13, no.24, p. 10829-10836 (2021)

مصطلحات موضوعية: Extreme ultraviolet lithography, Ion beams, Microelectronics, Nanostructures, Optoelectronic devices, Scanning probe microscopy, Semiconductor devices, Si-Ge alloys, Silica, Silicon, Thickness measurement, Tin alloys, Tin metallography, Cross-sectional scanning, Interfacial thermal resistance, Multilayer nanostructures, Nanoscale thermal transport, Opto-electronic materials, Scanning thermal microscopy, Semiconductor nanostructures, Thermoreflectance measurement, Thermal conductivity

العلاقة: boreal:282552; http://hdl.handle.net/2078.1/282552Test; urn:ISSN:20403364; urn:EISSN:20403364

الإتاحة: https://doi.org/10.1039/d0nr08768hTest
http://hdl.handle.net/2078.1/282552Test

المؤلفون: Evangeli, C, Briggs, GAD, McCann, E, Swett, JL, Tewari, S, Bian, X, Thomas, J, Kolosov, OV, Mol, JA

العلاقة: https://ora.ox.ac.uk/objects/uuid:dfe81554-4391-44c3-97c9-cd64bd640251Test; https://doi.org/10.1016/j.carbon.2020.12.012Test

الإتاحة: https://doi.org/10.1016/j.carbon.2020.12.012Test
https://ora.ox.ac.uk/objects/uuid:dfe81554-4391-44c3-97c9-cd64bd640251Test

المؤلفون: Farmakidis, N, Swett, J, Youngblood, N, Li, X, Evangeli, C, Aggarwal, S, Mol, J, Bhaskaran, H

العلاقة: https://ora.ox.ac.uk/objects/uuid:c37b8385-aa20-47df-9fa9-814136bb400aTest; https://doi.org/10.1038/s41378-021-00300-yTest

الإتاحة: https://doi.org/10.1038/s41378-021-00300-yTest
https://ora.ox.ac.uk/objects/uuid:c37b8385-aa20-47df-9fa9-814136bb400aTest

المؤلفون: Thomas, JO, Sowa, J, Limburg, B, Bian, X, Evangeli, C, Swett, J, Tewari, S, Baugh, J, Schatz, G, Briggs, G, Anderson, H, Mol, JAN, Thomas, J

العلاقة: https://ora.ox.ac.uk/objects/uuid:8b0b4a10-46b6-4c5a-bebb-071685b0572cTest; https://doi.org/10.1039/D1SC03050GTest

الإتاحة: https://doi.org/10.1039/D1SC03050GTest
https://ora.ox.ac.uk/objects/uuid:8b0b4a10-46b6-4c5a-bebb-071685b0572cTest

المؤلفون: El Sachat, A., Spiece, Jean, Evangeli, C., Robson, A.J., Kreuzer, M., Rodríguez-Laguna, M.R., Chavez, E., Sledzinska, M., Sotomayor Torres, C.M., Kolosov, O.V., Alzina, F.

المساهمون: UCL - SST/IMCN/NAPS - Nanoscopic Physics

المصدر: ACS Applied Polymer Materials, Vol. 2, no.2, p. 487-496 (2020)

مصطلحات موضوعية: scanning probe microscopy, self-assembly, thermal and mechanical mapping, thermal conductivity, Block copolymers, Mapping, Mechanical properties, Nanotechnology, Polyethylene oxides, Self assembly, Thermoanalysis, Characteristic size, Effective thermal resistance, Mechanical flexibility, Scanning thermal microscopy, Thermal and mechanical properties, Ultrasonic force microscopy, Ultrathin metal layers

العلاقة: boreal:282553; http://hdl.handle.net/2078.1/282553Test; urn:ISSN:26376105; urn:EISSN:26376105

الإتاحة: https://doi.org/10.1021/acsapm.9b00924Test
http://hdl.handle.net/2078.1/282553Test

المؤلفون: Harzheim, A., Evangeli, C., Kolosov, O., Gehring, Pascal

المساهمون: UCL - SST/IMCN/NAPS - Nanoscopic Physics

المصدر: 2D Materials, Vol. 7, no.4, p. 11 p. (2020)

العلاقة: boreal:237007; http://hdl.handle.net/2078.1/237007Test; urn:EISSN:2053-1583

الإتاحة: https://doi.org/10.1088/2053-1583/aba333/metaTest
http://hdl.handle.net/2078.1/237007Test