نتائج البحث - "En Xia Zhang"

1

Low-Frequency and Random Telegraph Noise in 14-nm Bulk Si Charge-Trap Transistors

المؤلفون: Mariia Gorchichko, En Xia Zhang, Mahmud Reaz, Kan Li, Peng Fei Wang, Jingchen Cao, Rachel M. Brewer, Ronald D. Schrimpf, Robert A. Reed, Brian D. Sierawski, Michael L. Alles, Jonathan Cox, Steven L. Moran, Subramanian S. Iyer, Daniel M. Fleetwood

المصدر: IEEE Transactions on Electron Devices. 70:3215-3222

مصطلحات موضوعية: Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e68fbaf6e6cf221bcf848f3fae253f7bTest
https://doi.org/10.1109/ted.2023.3265939Test

2

تقرير

Angle Dependence of Focused X-Ray-Induced Single Event Transients in an Epitaxial Silicon Diode

المؤلفون: Kaitlyn L Ryder, Landen D Ryder, Andrew L. Sternberg, En Xia Zhang, Stephen D. LaLumondiere, Daniele M. Monahan, Jeremy P. Bonsall, Yuanfu Zhao, Liang Wang, Chuanmin Wang, Robert A. Weller, Ronald D. Schrimpf, Robert A Reed

المصدر: IEEE Transactions on Nuclear Science (TNS)Paper for posting on public website.

مصطلحات موضوعية: Electronics And Electrical Engineering

العلاقة: Angle Dependence of Focused X-Ray-Induced Single Event Transients in an Epitaxial Silicon Diode

الوصول الحر: https://ntrs.nasa.gov/citations/20210018665Test

View record in NASA Technical Reports

3

Impact of Heavy-Ion Range on Single-Event Effects in Silicon Carbide Power Junction Barrier Schottky Diodes

المؤلفون: Arijit Sengupta, Dennis R. Ball, Arthur F. Witulski, En Xia Zhang, Ronald D. Schrimpf, Kenneth F. Galloway, Robert A. Reed, Michael L. Alles, Michael W. McCurdy, Andrew L. Sternberg, Robert A. Johnson, Mick E. Howell, Jason M. Osheroff, John M. Hutson

المصدر: IEEE Transactions on Nuclear Science. 70:394-400

مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Electrical and Electronic Engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::698ba8051a5c0ee4ab9797b0b109e3f5Test
https://doi.org/10.1109/tns.2023.3242223Test

4

Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

المؤلفون: Kan Li, Xuyi Luo, M. W. Rony, Mariia Gorchichko, Gaspard Hiblot, Stefaan Van Huylenbroeck, Anne Jourdain, Michael L. Alles, Robert A. Reed, En Xia Zhang, Daniel M. Fleetwood, Ronald D. Schrimpf

المصدر: IEEE Transactions on Nuclear Science. 70:442-448

مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Electrical and Electronic Engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::3c130cda71937f4fab3a6719b4b9c6aaTest
https://doi.org/10.1109/tns.2023.3239844Test

5

Total-Ionizing-Dose Effects and Low-Frequency Noise in N-Type Carbon Nanotube Field-Effect Transistors With HfO₂ Gate Dielectrics

المؤلفون: Patrick K. Darmawi-Iskandar, Andrew M. Aaron, En Xia Zhang, Bharat L. Bhuva, Jeffery S. Kauppila, Jim L. Davidson, Michael L. Alles, Daniel M. Fleetwood, Lloyd W. Massengill

المصدر: IEEE Transactions on Nuclear Science. 70:449-455

مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Electrical and Electronic Engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::4d0f491816e086c9e6bc20a31181afd8Test
https://doi.org/10.1109/tns.2023.3242644Test

6

Effects of Geometry and Cycling on the Radiation Response of Charge-Trapping NAND Memory Devices With SiON Tunneling Oxide

المؤلفون: Jingchen Cao, Isabella Wynocker, En Xia Zhang, Robert A. Reed, Michael L. Alles, Ronald D. Schrimpf, Daniel M. Fleetwood, Antonio Arreghini, Maarten Rosmeulen, João P. Bastos, Geert Van den Bosch, Dimitri Linten

المصدر: IEEE Transactions on Nuclear Science. 70:634-640

مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Electrical and Electronic Engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::2d4ff632da8156f534d4dd2f59df232aTest
https://doi.org/10.1109/tns.2022.3227941Test

7

Total-Ionizing-Dose Effects on 3-D Sequentially Integrated FDSOI Ring Oscillators

المؤلفون: Shintaro Toguchi, En Xia Zhang, Daniel M. Fleetwood, Ronald D. Schrimpf, Stephane Moreau, Perrine Batude, Laurent Brunet, Francois Andrieu, Michael L. Alles

المصدر: IEEE Transactions on Nuclear Science. 70:627-633

مصطلحات موضوعية: Nuclear and High Energy Physics, Nuclear Energy and Engineering, Electrical and Electronic Engineering

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::7e31429758cbf5316d448cd8d43103f1Test
https://doi.org/10.1109/tns.2023.3235648Test

8

Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

المؤلفون: Xuyi Luo, En Xia Zhang, Peng Fei Wang, Kan Li, Dimitri Linten, Jerome Mitard, Robert A. Reed, Daniel M. Fleetwood, Ronald D. Schrimpf

المصدر: IEEE Transactions on Device and Materials Reliability. 23:153-161

مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, Electronic, Optical and Magnetic Materials

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::90ea8648f7c5e735a460de872ad2832eTest
https://doi.org/10.1109/tdmr.2023.3240976Test

9

تقرير

Angle Dependence of Focused X-Ray-Induced Single Event Transients

المؤلفون: Kaitlyn L Ryder, Landen D Ryder, Andrew L. Sternberg, John A. Kozub, En Xia Zhang, Stephen D. LaLumondiere, Daniele M. Monahan, Jeremy P. Bonsall, Robert A Weller, Ronald D. Schrimpf, Robert A. Reed

المصدر: Presentation for posting on public website.

مصطلحات موضوعية: Electronics And Electrical Engineering

الوصول الحر: https://ntrs.nasa.gov/citations/20210020642Test

View record in NASA Technical Reports

10

تقرير

Comparison of Single-Event Transients in an Epitaxial Silicon Diode Resulting from Heavy Ion-, Focused X-Ray-, and Pulsed Laser-Induced Charge Generation

المؤلفون: Kaitlyn L Ryder, Landen D Ryder, Andrew L. Sternberg, John A. Kozub, En Xia Zhang, Stephen D. LaLumondiere, Daniele M. Monahan, Jeremy P. Bonsall, Ani Khachatrian, Stephen P. Buchner, Dale McMorrow, Joel M. Hales, Yuanfu Zhao, Liang Wang, Chuanmin Wang, Robert A. Weller, Ronald D. Schrimpf, Sharon M. Weiss, Robert A Reed

المصدر: IEEE Transactions on Nuclear ScienceTransactions on Nuclear Science (TNS).

مصطلحات موضوعية: Space Radiation, Quality Assurance And Reliability

الوصول الحر: https://ntrs.nasa.gov/citations/20210010229Test

View record in NASA Technical Reports

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