المؤلفون: Yuri Sinyukov, Volodymyr Shapoval, Musfer Adzhymambetov

المصدر: Universe, Vol 9, Iss 10, p 433 (2023)

مصطلحات موضوعية: kaon, pion, femtoscopy radius, emission function, emission time, particlisation, Elementary particle physics, QC793-793.5

وصف الملف: electronic resource

العلاقة: https://www.mdpi.com/2218-1997/9/10/433Test; https://doaj.org/toc/2218-1997Test

الوصول الحر: https://doaj.org/article/afbcd71690a44d0db46ac5eda4d6d65cTest

المؤلفون: Yijie Wang, Fenhai Guan, Qianghua Wu, Xinyue Diao, Yan Huang, Liming Lyu, Yuhao Qin, Zhi Qin, Dawei Si, Zhen Bai, Fangfang Duan, Limin Duan, Zhihao Gao, Qiang Hu, Rongjiang Hu, Genming Jin, Shuya Jin, Junbing Ma, Peng Ma, Jiansong Wang, Peng Wang, Yufeng Wang, Xianglun Wei, Herun Yang, Yanyun Yang, Gongming Yu, Yuechao Yu, Yapeng Zhang, Qingwu Zhou, Yaofeng Zhang, Chunwang Ma, Xinrong Hu, Hongwei Wang, Yunyi Cui, Junlong Tian, Zhigang Xiao

المصدر: Physics Letters B, Vol 825, Iss , Pp 136856- (2022)

مصطلحات موضوعية: Particle emission time scale, Small angle correlation function, Symmetry energy, Heavy ion reactions, Physics, QC1-999

وصف الملف: electronic resource

العلاقة: http://www.sciencedirect.com/science/article/pii/S0370269321007966Test; https://doaj.org/toc/0370-2693Test

الوصول الحر: https://doaj.org/article/17498ac42c014b69af6ce2a2d64eab1cTest

المؤلفون: Zhang, Meng, Jiang, Zhendong, Lu, Lei, Wong, Man, Kwok, Hoi Sing

مصطلحات موضوعية: Degradation, Emission time, Junctions, Logic gates, Nonequilibrium junction degradation model, Polycrystalline silicon, Recapture time, Reliability, Stress, Thin film transistors, Thin-film transistors, Voltage

العلاقة: https://repository.hkust.edu.hk/ir/Record/1783.1-135082Test; IEEE Electron Device Letters, v. 45, (2), February 2024, article number 10366251, p. 204-207; https://doi.org/10.1109/LED.2023.3345282Test; http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=0741-3106&rft.volume=&rft.issue=&rft.date=2023&rft.spage=1&rft.aulast=Zhang&rft.aufirst=Meng&rft.atitle=Analysis+of+Degradation+Mechanism+in+Poly-Si+TFTs+under+Dynamic+Gate+Voltage+Stress+with+Short+Pulse+Width+Duration&rft.title=IEEE+Electron+Device+LettersTest; http://www.scopus.com/record/display.url?eid=2-s2.0-85182363827&origin=inwardTest

الإتاحة: https://doi.org/10.1109/LED.2023.3345282Test
https://repository.hkust.edu.hk/ir/Record/1783.1-135082Test
http://lbdiscover.ust.hk/uresolver?url_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rfr_id=info:sid/HKUST:SPI&rft.genre=article&rft.issn=0741-3106&rft.volume=&rft.issue=&rft.date=2023&rft.spage=1&rft.aulast=Zhang&rft.aufirst=Meng&rft.atitle=Analysis+of+Degradation+Mechanism+in+Poly-Si+TFTs+under+Dynamic+Gate+Voltage+Stress+with+Short+Pulse+Width+Duration&rft.title=IEEE+Electron+Device+LettersTest
http://www.scopus.com/record/display.url?eid=2-s2.0-85182363827&origin=inwardTest

المؤلفون: Dmitriy Beznosko, Elijah Holloway, Alexander Iakovlev

المصدر: Instruments; Volume 6; Issue 4; Pages: 56

مصطلحات موضوعية: scintillator, light emission spectra, light emission time, composition optimization

وصف الملف: application/pdf

العلاقة: https://dx.doi.org/10.3390/instruments6040056Test

الإتاحة: https://doi.org/10.3390/instruments6040056Test

المؤلفون: Huiyan Kong, Luyi Huang, Min Li, Ling Zhang, Heping Zeng

المصدر: Nanomaterials; Volume 12; Issue 2; Pages: 290

مصطلحات موضوعية: THz emission time-domain spectroscopy, cadmium telluride, metals, THz enhancement, surface plasmons

وصف الملف: application/pdf

العلاقة: Nanophotonics Materials and Devices; https://dx.doi.org/10.3390/nano12020290Test

الإتاحة: https://doi.org/10.3390/nano12020290Test

المؤلفون: Mehzabeen Mehedi, Kean Hong Tok, Jian Fu Zhang, Zhigang Ji, Zengliang Ye, Weidong Zhang, John S. Marsland

المصدر: IEEE Access, Vol 8, Pp 182273-182282 (2020)

مصطلحات موضوعية: Random telegraph noise (RTN), jitters, traps, capture time, emission time, fluctuations, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

العلاقة: https://ieeexplore.ieee.org/document/9212412Test/; https://doaj.org/toc/2169-3536Test

الوصول الحر: https://doaj.org/article/df7db409461345a9bd6c47ddf91a368fTest

المؤلفون: Makoto MATSUI, Ryoma HARA, 原 涼馬, 松井 信

المصدر: プラズマ応用科学 / Applied Plasma Science. 2020, 28(1):9

المؤلفون: A. Krakovinsky, Louis Gerrer, R. Modica, Gerard Ghibaudo, Jérôme Biscarrat, J. Cluzel, William Vandendaele, Marie-Anne Jaud, Gaudenzio Meneghesso, F. Gaillard, Steve W. Martin, Xavier Garros, A. G. Viey, R. Gwoziecki, Marc Plissonnier, Ferdinando Iucolano, Matteo Meneghini

المصدر: IEEE Transactions on Electron Devices. 68:2017-2024

مصطلحات موضوعية: 010302 applied physics, Range (particle radiation), Bias temperature instability (BTI), capture emission time (CET) map, GaN-on-Si E-mode MOS-c high-electron-mobility transistor (HEMT), power device reliability, business.industry, Gallium nitride, High-electron-mobility transistor, Activation energy, 01 natural sciences, Temperature measurement, Electronic, Optical and Magnetic Materials, Stress (mechanics), chemistry.chemical_compound, chemistry, Gate oxide, Logic gate, 0103 physical sciences, Optoelectronics, Electrical and Electronic Engineering, business

الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b63c9aa645b49484cd7c1c7c1bdf3dbaTest
https://doi.org/10.1109/ted.2021.3050127Test

مصطلحات موضوعية: gridmap, inventory, emission time series, VOC speciation, volatile organic compounds (VOC)

الوصول الحر: http://data.europa.eu/88u/dataset/jrc-edgar-edgar_v432_voc_spec_gridmapsTest

Other URLs: http://data.europa.eu/88u/dataset/jrc-edgar-edgar_v432_voc_spec_gridmapsTest

مصطلحات موضوعية: gridmap, inventory, emission time series, VOC speciation, volatile organic compounds (VOC)

الوصول الحر: http://data.europa.eu/88u/dataset/jrc-edgar-edgar_v432_voc_spec_timeseriesTest

Other URLs: http://data.europa.eu/88u/dataset/jrc-edgar-edgar_v432_voc_spec_timeseriesTest