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1تقرير
المؤلفون: Nikolaev, V. V., Portnoi, M. E., Eliashevich, I.
المصدر: Phys. Stat. Sol. (a) 183, 177 (2001)
مصطلحات موضوعية: Condensed Matter - Materials Science
الوصول الحر: http://arxiv.org/abs/cond-mat/0111386Test
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2مؤتمر
المؤلفون: LEVADA, SIMONE, MENEGHESSO, GAUDENZIO, ZANONI, ENRICO, PAVESI M, MANFREDI M, CAVALLINI A, CASTALDINI A, SALVIATI G, ARMANI N, ROSSI F, DU S, ELIASHEVICH I.
المساهمون: Levada, Simone, Meneghesso, Gaudenzio, Zanoni, Enrico, Pavesi, M, Manfredi, M, Cavallini, A, Castaldini, A, Salviati, G, Armani, N, Rossi, F, Du, S, Eliashevich, I.
مصطلحات موضوعية: light emitting diode, InGaN, reliability, degradation
وصف الملف: STAMPA
العلاقة: 5th International Symposium on Blue Laser and Light Emitting Diodes, ISBLLED; firstpage:173; lastpage:174; numberofpages:2; http://hdl.handle.net/11577/2441761Test
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3مؤتمر
المؤلفون: Meneghesso G, Levada S, Zanoni E, Cavallini A, Castaldini A, Du S, Eliashevich I., PODDA, SIMONA, MURA, GIOVANNA, VANZI, MASSIMO
المساهمون: Meneghesso, G, Levada, S, Zanoni, E, Podda, Simona, Mura, Giovanna, Vanzi, Massimo, Cavallini, A, Castaldini, A, Du, S, Eliashevich, I.
العلاقة: ispartofbook:IWN 2002, Int. Workshop on Nitride Semiconductors; IWN 2002, Int. Workshop on Nitride Semiconductors; firstpage:389; lastpage:392; numberofpages:4; http://hdl.handle.net/11584/82451Test
الإتاحة: https://doi.org/10.1002/1521-396XTest(200212)194:2<389::AID-PSSA389>3.0.CO;2-O
http://hdl.handle.net/11584/82451Test -
4مؤتمر
المؤلفون: Saunier, P., Lee, C., Jimenez, J., Balistreri, A., Dumka, D., Tserng, H. Q., Kao, M. Y., Chowdhury, U., Chao, P. C., Chu, K., Souzis, A., Eliashevich, I., Guo, S., del Alamo, J., Joh, J., Shur, M.
المساهمون: Morkoç, Hadis, Litton, Cole W., Chyi, Jen-Inn, Nanishi, Yasushi, Yoon, Euijoon
المصدر: SPIE Proceedings ; Gallium Nitride Materials and Devices III ; ISSN 0277-786X
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5مؤتمر
المؤلفون: Saunier, P., Lee, C., Balistreri, A., Dumka, D., Jimenez, J., Tserng, H. Q., Kao, M.Y., Chao, P.C., Chu, K., Souzis, A., Eliashevich, I., Guo, S., del Alamo, J., Joh, J., Shur, M.
المصدر: 2007 65th Annual Device Research Conference ; ISSN 1548-3770
الإتاحة: https://doi.org/10.1109/drc.2007.4373639Test
http://xplorestaging.ieee.org/ielx5/4373616/4373617/04373639.pdf?arnumber=4373639Test -
6مؤتمر
المؤلفون: Jessen, G., Gillespie, J., Via, G., Crespo, A., Langley, D., Wasserbauer, J., Faili, F., Francis, D., Babic, D., Ejeckam, F., Guo, S., Eliashevich, I.
المصدر: 2006 IEEE Compound Semiconductor Integrated Circuit Symposium
الإتاحة: https://doi.org/10.1109/csics.2006.319952Test
http://xplorestaging.ieee.org/ielx5/4109951/4109952/04110039.pdf?arnumber=4110039Test -
7مؤتمر
المؤلفون: Meneghesso, G., Levada, S., Zanoni, E., Salviati, G., Armani, N., Rossi, F., Pavesi, M., Manfredi, M., Cavallini, A., Castaldini, A., Du, S., Eliashevich, I.
المصدر: 2004 IEEE International Reliability Physics Symposium. Proceedings
الإتاحة: https://doi.org/10.1109/relphy.2004.1315374Test
http://xplorestaging.ieee.org/ielx5/9182/29131/01315374.pdf?arnumber=1315374Test -
8دورية أكاديمية
المؤلفون: Meneghesso G, Levada S, Zanoni E, Mura G, Podda S, Vanzi M, Du S, Eliashevich I., SCAMARCIO, Gaetano
المساهمون: Meneghesso, G, Levada, S, Zanoni, E, Scamarcio, Gaetano, Mura, G, Podda, S, Vanzi, M, Du, S, Eliashevich, I.
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000185791500064; volume:43; issue:9-11; firstpage:1737; lastpage:1742; numberofpages:5; journal:MICROELECTRONICS RELIABILITY; http://hdl.handle.net/11586/126266Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0042193182
الإتاحة: https://doi.org/10.1016/S0026-2714Test(03)00289-0
http://hdl.handle.net/11586/126266Test -
9مؤتمر
المؤلفون: Meneghesso, G., Levada, S., Pierobon, R., Rampazzo, F., Zanoni, E., Cavallini, A., Castaldini, A., Scamarcio, G., Du, S., Eliashevich, I.
المصدر: Digest. International Electron Devices Meeting
الإتاحة: https://doi.org/10.1109/iedm.2002.1175789Test
http://xplorestaging.ieee.org/ielx5/8330/25999/01175789.pdf?arnumber=1175789Test -
10دورية أكاديمية
المؤلفون: Meneghesso, G., Levada, S., Zanoni, E., Podda, S., Cavallini, A., Castaldini, A., Du, S., Eliashevich, I., MURA, GIOVANNA, VANZI, MASSIMO
المساهمون: Meneghesso, G., Levada, S., Zanoni, E., Podda, S., Mura, Giovanna, Vanzi, Massimo, Cavallini, A., Castaldini, A., Du, S., Eliashevich, I.
العلاقة: info:eu-repo/semantics/altIdentifier/wos/WOS:000180101800005; volume:194; issue:2 SPEC.; firstpage:389; lastpage:392; numberofpages:4; journal:PHYSICA STATUS SOLIDI. A, APPLIED RESEARCH; http://hdl.handle.net/11584/116032Test; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-0036960284
