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المؤلفون: X. A. Aslanoglou, G. Kaliampakos, E. Kossionides, Ch. Dimitriades, E. K. Evangelou, Nikos Konofaos
المصدر: HNPS Proceedings. 9:315
مصطلحات موضوعية: Materials science, Analytical chemistry, Heavy ion, Characterization (materials science)
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::aae1fbff7c9fd1f429ec5038a695cc7fTest
https://doi.org/10.12681/hnps.2793Test -
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المؤلفون: E. K. Evangelou, Nikos Konofaos, G. Kriembardis, Ch. Dimitriades, E. Kossionides, X. A. Aslanoglou, G. Kaliampakos
المصدر: HNPS Proceedings. 10:20
مصطلحات موضوعية: Materials science, Oxygen contamination, Analytical chemistry
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::f4955ef1f0e83e85a8a0d7d50b94f940Test
https://doi.org/10.12681/hnps.2170Test -
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المؤلفون: S. Rahman, E. K. Evangelou
المصدر: IEEE Transactions on Electron Devices. 58:3549-3558
مصطلحات موضوعية: Materials science, Condensed matter physics, Field dependence, chemistry.chemical_element, Germanium, Trapping, Dielectric, Instability, Electronic, Optical and Magnetic Materials, Stress (mechanics), chemistry, Relaxation (physics), Electrical and Electronic Engineering, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::54a0762f8db92a6565d2e88a24a91c1aTest
https://doi.org/10.1109/ted.2011.2162095Test -
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المؤلفون: E. K. Evangelou, S. Galata, A. Dimoulas, Iosif Androulidakis, G. Mavrou, M. S. Rahman
المصدر: Solid-State Electronics. 54:979-984
مصطلحات موضوعية: charge trapping, ge substrates, time-decay, Dielectric, Trapping, dielectric relaxation, Capacitance, Electric charge, trap generation, stacks, Stress (mechanics), silc, cvs, relaxation, Materials Chemistry, oxide-films, Electrical and Electronic Engineering, breakdown, Condensed matter physics, business.industry, Chemistry, Relaxation (NMR), Electrical engineering, hfo2, rare-earth oxides, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, defects generation, la(2)o(3), induced leakage current, electron injection, interface, SILC, business, Voltage
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4886cd329d6a3a5a457239d7bf407d7bTest
https://doi.org/10.1016/j.sse.2010.04.023Test -
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المؤلفون: E. K. Evangelou, A. Dimoulas, M. S. Rahman
المصدر: IEEE Transactions on Electron Devices. 56:399-407
مصطلحات موضوعية: Cerium oxide, Electron mobility, Materials science, Silicon, business.industry, Electrical engineering, Oxide, chemistry.chemical_element, Dielectric, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Optoelectronics, SILC, Electrical and Electronic Engineering, business, High-κ dielectric, Extrinsic semiconductor
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::32bdaa4f0f8a02a1e0be3cd58c3cb9e3Test
https://doi.org/10.1109/ted.2008.2011935Test -
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المؤلفون: Y. Panayiotatos, Polychronis Tsipas, E. K. Evangelou, S. F. Galata, G. Mavrou, Jin Won Seo, A. Sotiropoulos, A. Dimoulas, Ch. Dieker
المصدر: Microelectronic Engineering. 84:2324-2327
مصطلحات موضوعية: rare earth oxides, Materials science, Passivation, business.industry, Gate dielectric, chemistry.chemical_element, Germanium, Substrate (electronics), Dielectric, Condensed Matter Physics, MIS capacitor, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, germanium, chemistry, Gate oxide, Optoelectronics, passivation, Electrical and Electronic Engineering, business, High-resolution transmission electron microscopy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::acffc57625b8586822221d4bc22b1a3dTest
https://doi.org/10.1016/j.mee.2007.04.036Test -
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المؤلفون: E. K. Evangelou, G. Mavrou, Nikos Konofaos, Athanasios Dimoulas
المصدر: Solid-State Electronics. 51:164-169
مصطلحات موضوعية: rare earth oxides, atomic-layer deposition, nibe, bulk states, beam deposition, interface states, Oxide, chemistry.chemical_element, Germanium, Dielectric, law.invention, chemistry.chemical_compound, law, Materials Chemistry, Electrical measurements, si, Electrical and Electronic Engineering, High-κ dielectric, ge(100), business.industry, gate dielectrics, Electrical engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, germanium, Capacitor, Semiconductor, chemistry, electrical properties, si(100), Optoelectronics, business, Molecular beam epitaxy
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3acb15e20fec5297e15f4c5618599675Test
https://doi.org/10.1016/j.sse.2006.10.011Test -
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المؤلفون: K. Argyropoulos, Georgios Vellianitis, A. Dimoulas, G. Mavrou, E. K. Evangelou, Michel Houssa
المصدر: Microelectronic Engineering. 80:34-37
مصطلحات موضوعية: Condensed matter physics, business.industry, Chemistry, Response time, Conductance, Inversion (meteorology), Low frequency, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Capacitor, Microsecond, Semiconductor, law, Thermal, Electrical and Electronic Engineering, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::bc3faf16aa9c345e7343faa0279395ddTest
https://doi.org/10.1016/j.mee.2005.04.013Test -
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المؤلفون: Nikos Konofaos, E. K. Evangelou, Zhongchun Wang, Ulf Helmersson
المصدر: IEEE Transactions on Electron Devices. 51:1202-1205
مصطلحات موضوعية: Materials science, business.industry, Dielectric, Sputter deposition, Electronic, Optical and Magnetic Materials, law.invention, Indium tin oxide, Switching time, Capacitor, law, Electronic engineering, Microelectronics, Optoelectronics, Electrical measurements, Electrical and Electronic Engineering, Thin film, business
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=doi_________::e80af0002d3acb97a6cd51e46fe5761bTest
https://doi.org/10.1109/ted.2004.829900Test