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1تقرير
المؤلفون: Marcenat, C., Kacmarcik, J., Piquerel, R., Achatz, P., Prudon, G., Dubois, C., Gautier, B., Dupuy, J. C., Bustarret, E., Ortega, L., Klein, T., Boulmer, J., Kociniewski, T., Debarre, D.
مصطلحات موضوعية: Condensed Matter - Superconductivity
الوصول الحر: http://arxiv.org/abs/0910.5378Test
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2مؤتمر
المؤلفون: Chhun, S., Margain, A., Guillan, J., Gras, R., Dupuy, J.-C., Torres, J., Gosset, L.G., Besling, W., Vanypre, T., Brun, Ph., Ollier, E., Mellier, M., Imbert, G., Jullian, S.
المصدر: 2006 International Interconnect Technology Conference
الإتاحة: https://doi.org/10.1109/iitc.2006.1648638Test
http://xplorestaging.ieee.org/ielx5/10964/34566/01648638.pdf?arnumber=1648638Test -
3مؤتمر
المؤلفون: Meriem, B., Farah, H., Faycal, B., Dupuy, J.-C.
المصدر: 2006 2nd International Conference on Information & Communication Technologies
الإتاحة: https://doi.org/10.1109/ictta.2006.1684361Test
http://xplorestaging.ieee.org/ielx5/11100/35470/01684361.pdf?arnumber=1684361Test -
4دورية أكاديمية
المؤلفون: Prudon, G., Dubois, C., Gautier, B., Dupuy, J. C., Graf, J. P., Le Gall, Y., Muller, D.
المصدر: Surface and Interface Analysis ; volume 45, issue 1, page 376-380 ; ISSN 0142-2421 1096-9918
الإتاحة: https://doi.org/10.1002/sia.5137Test
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5دورية أكاديمية
المؤلفون: Marcenat, C., Kačmarčík, J., Piquerel, R., Achatz, P., Prudon, G., Dubois, C., Gautier, B., Dupuy, J. C., Bustarret, E., Ortega, L., Klein, T., Boulmer, J., Kociniewski, T., Débarre, D.
المصدر: Physical Review B ; volume 81, issue 2 ; ISSN 1098-0121 1550-235X
مصطلحات موضوعية: Condensed Matter Physics, Electronic, Optical and Magnetic Materials
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6دورية أكاديمية
المؤلفون: Mi, J., Letourneau, P., Ganiere, J. D., Gailhanou, M., Dutoit, M., Dubois, C., Dupuy, J. C., Bremond, G.
العلاقة: http://infoscience.epfl.ch/record/110869Test; ISI:A1994NN69300014
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7
المؤلفون: Dupuy, J. C., Dubois, C., Prudon, G., Gautier, B., Kögler, R., Akhmadaliev, S., Perrat-Mabilon, A., Peaucelle, C.
المصدر: SIMS XVII Toronto, Canada, 13.-17.09.2009, Toronto, Canada
Surface and Interface Analysis 43(2010)1-2, 137-140مصطلحات موضوعية: Oxygen, Secondary ion mass spectrometry, Silicon, Isotopic comparative method, SIMS, ICM, Boron
الوصول الحر: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::bb6674fe5fb45311e150ef21d71adcf5Test
https://www.hzdr.de/publications/Publ-13605-1Test -
8كتاب
المؤلفون: Garchery, L., Sagnes, I., Warren, P., Dupuy, J.-C., Badoz, P.A.
المصدر: Selected Topics in Group IV and II–VI Semiconductors ; page 367-372
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9دورية أكاديمية
المؤلفون: Vanypre, T., Cordeau, M., Mourier, T., Besling, W.F.A., Dupuy, J-C., Torres, J.
المصدر: Microelectronic Engineering ; volume 83, issue 11-12, page 2373-2376 ; ISSN 0167-9317
مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1016Test/j.mee.2006.10.039
https://api.elsevier.com/content/article/PII:S0167931706005405?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0167931706005405?httpAccept=text/plainTest -
10دورية أكاديمية
المؤلفون: Chhun, S., Gosset, L.G., Michelon, J., Girault, V., Vitiello, J., Hopstaken, M., Courtas, S., Debauche, C., Bancken, P.H.L., Gaillard, N., Bryce, G., Juhel, M., Pinzelli, L., Guillan, J., Gras, R., Van Schravendijk, B., Dupuy, J.-C., Torres, J.
المصدر: Microelectronic Engineering ; volume 83, issue 11-12, page 2094-2100 ; ISSN 0167-9317
مصطلحات موضوعية: Electrical and Electronic Engineering, Surfaces, Coatings and Films, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
الإتاحة: https://doi.org/10.1016Test/j.mee.2006.09.013
https://api.elsevier.com/content/article/PII:S0167931706004813?httpAccept=text/xmlTest
https://api.elsevier.com/content/article/PII:S0167931706004813?httpAccept=text/plainTest